Patents by Inventor Michel Tauvy

Michel Tauvy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Wavefront analysis method involving multilateral interferometry with frequency difference
    Patent number: 7864340
    Abstract: The method comprises positioning a diffraction grating with a two-dimensional meshing on the path of the beam to be analyzed and processing at least two interferograms of at least two different colors, each interferogram being obtained in a plane from two sub-beams with different diffraction orders. The invention can be used to analyze and correct divided wavefronts.
    Type: Grant
    Filed: August 7, 2008
    Date of Patent: January 4, 2011
    Assignee: ONERA (Office National d/Etudes et de Recherches Aerospatiales
    Inventors: Jerome Primot, Sabrina Velghe, Nicolas Guerineau, Riad Haidar, Michel Tauvy
  • Method for analyzing a wavefront through frequency difference multilateral interferometry
    Publication number: 20090051928
    Abstract: The method comprises positioning a diffraction grating with a two-dimensional meshing on the path of the beam to be analyzed and processing at least two interferograms of at least two different colors, each interferogram being obtained in a plane from two sub-beams with different diffraction orders. The invention can be used to analyze and correct divided wavefronts.
    Type: Application
    Filed: August 7, 2008
    Publication date: February 26, 2009
    Inventors: Jerome Primot, Sabrina Velghe, Nicolas Guerineau, Riad Haidar, Michel Tauvy