Patents by Inventor Michel Weil

Michel Weil has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070215269
    Abstract: The article (10) comprises a central region (12) with a recessed rim (32) comprising a peripheral flat portion (14) onto which the film (40) is heat-sealed. The film used is a cold-drawable plastic film, and the process comprises in particular a step of peripheral holding and axial displacement of the film relative to the part, beyond the central region, by drawing the film in the region of the rim without any substantial external application of heat. The film is thus cold-formed to give it a concave shape with zones (42-48) associated with the central region (12) and the rim (32) of the article. The film is then held in contact with the flat portion, the whole being heated simultaneously to effect the heat-sealing.
    Type: Application
    Filed: February 27, 2007
    Publication date: September 20, 2007
    Applicant: Etablissements STREB & WEIL
    Inventor: Michel Weil
  • Patent number: 5557544
    Abstract: In an analytic spectrometer (50) having a central computer (9), permanently installed and exchangeable components (5), such as a radiation source, a detector, a beam splitter, a filter, external measurement probes and the like, each of which exhibiting a readable data carrier (7) with encoded data of parameters characterizing the respective component (5), the data media (7) can be written to and contains changeable time dependent data concerning the history and/or the actual properties of the corresponding component (5) for example length of operation, performance deterioration parameters or calibration curves of the component (5). These data can be continuously adjusted by the central computer (9) to the current state of the component (5) so that the data medium (7) connected to the component (5) can immediately supply information concerning the current actual properties of the component (5) when installing the component (5) in another spectrometer.
    Type: Grant
    Filed: December 9, 1993
    Date of Patent: September 17, 1996
    Assignee: Bruker Analytische MeBtechnik GmbH
    Inventors: Arno Simon, Norbert Rapp, Jean-Michel Weil