Abstract: A device, system and method integrating forward and panoramic fields is disclosed, comprising: a primary reflector, comprising a convex surface in relation to the forward field, reflective on at least part of the convex surface; a secondary reflector, forward of the primary reflector relative to the forward field, reflective on at least part a surface thereof facing rearward toward the primary reflector; a primary reflector hole in the primary reflector, substantially centered about an optical axis of the apparatus; and a secondary reflector hole in the secondary reflector, substantially centered about the optical axis.

Abstract: A device, system and method integrating forward and panoramic fields is disclosed, comprising: a primary reflector, comprising a convex surface in relation to the forward field, reflective on at least part of the convex surface; a secondary reflector, forward of the primary reflector relative to the forward field, reflective on at least part a surface thereof facing rearward toward the primary reflector; a primary reflector hole in the primary reflector, substantially centered about an optical axis of the apparatus; and a secondary reflector hole in the secondary reflector, substantially centered about the optical axis.

Abstract: A device, system and method integrating forward and panoramic fields is disclosed, comprising: a primary reflector, comprising a convex surface in relation to the forward field, reflective on at least part of the convex surface; a secondary reflector, forward of the primary reflector relative to the forward field, reflective on at least part a surface thereof facing rearward toward the primary reflector; a primary reflector hole in the primary reflector, substantially centered about an optical axis of the apparatus; and a secondary reflector hole in the secondary reflector, substantially centered about the optical axis.

Abstract: A device, system and method integrating forward and panoramic fields is disclosed, comprising: a primary reflector, comprising a convex surface in relation to the forward field, reflective on at least part of the convex surface; a secondary reflector, forward of the primary reflector relative to the forward field, reflective on at least part a surface thereof facing rearward toward the primary reflector; a primary reflector hole in the primary reflector, substantially centered about an optical axis of the apparatus; and a secondary reflector hole in the secondary reflector, substantially centered about the optical axis.

Abstract: The objective of the present invention is to provide a single endoscope that provides a field of view substantially greater than a hemisphere comprising a forward field of view and a panoramic field of view that are integrated on a single image plane. The invention is described with respect to a rigid endoscope, but the technology can be implemented on a flexible endoscope as well. The advantage of such an endoscope is that it would provide substantially more information to the physician than any single existing endoscope, and it can be used in place of multiple endoscopes with varying directions of view that are swapped throughout a procedure to provide different views. The invention can also be used in non-medical applications for inspection in closed or generally inaccessible spaces such as for example the interior of jet engines.

Abstract: An improved microsystems testing and characterization system which allows the system user to identify specific structures, and thereby to initiate an automated testing sequence to be applied to that structure or a series of structures. The integrated control system that governs the present invention automates the power supply to the device under test, the precision motion control of all components, the sensor operation, data processing and data presentation. Therefore operation is autonomous once the microstructure is in place and the testing sequence is specified. The integrated testing system can be used to perform tests on an entire wafer or on a single die.

Abstract: An improved microsystems testing and characterization system which allows the system user to identify specific structures, and thereby to initiate an automated testing sequence to be applied to that structure or a series of structures. The integrated control system that governs the present invention automates the power supply to the device, the precision motion control of all components, the sensor operation, data processing and data presentation. Therefore operation is autonomous once the microstructure is in place and the testing sequence is specified. The integrated testing system can be used to perform tests on an entire wafer or on a single die.