Abstract: An electronic device includes a bias generator to generate a plurality of bias currents and a testing module to test the bias generator by successively testing each subset of bias currents of a plurality of subsets of bias currents grouped from the plurality of bias currents as a corresponding single test current. The testing module can include a variable resistor, wherein the testing module is to test the bias generator by, for each subset of bias currents, configuring the variable resistor to have a corresponding resistance based on the number of bias currents represented in the subset, conducting a corresponding test current through the variable resistor configured to the corresponding resistance, the test current representing a combination of all bias currents of the corresponding subset, and determining a test status for the subset of bias currents based on a voltage across the variable resistor resulting from the corresponding test current.

Abstract: An integrated circuit and method are provided. The integrated circuit comprises: a digital core configured to output a first voltage signal; and a first input/output cell; wherein the first input/output cell is configured to convert the first voltage signal to a first current signal and provide the first current signal to circuitry external to the integrated circuit.

Abstract: An integrated circuit and method are provided. The integrated circuit comprises: a digital core configured to output a first voltage signal: and a first input/output cell: wherein the first input/output cell is configured to convert the first voltage signal to a first current signal and provide the first current signal to circuitry external to the integrated circuit.