Patents by Inventor Michihiro FURUSAKA

Michihiro FURUSAKA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Nuclear reaction detection device, method and program with high detection position resolution
    Patent number: 11808901
    Abstract: A nuclear reaction detection device 100 includes a semiconductor memory 100 arranged in an environment in which radiation is incident, a position information storage unit 210 that stores spatial position information of a semiconductor element in the semiconductor memory 100, a bit position specifying unit 220 that detects that an SEU (Single Event Upset) has occurred in the semiconductor element included in the semiconductor memory 100, and specifies the semiconductor element in which the SEU has occurred, and a position calculating unit 230 that calculates a spatial position in which the SEU has occurred, based on the specified semiconductor element and the spatial position information.
    Type: Grant
    Filed: July 3, 2020
    Date of Patent: November 7, 2023
    Assignees: Nippon Telegraph and Telephone Corporation, National University Corporation Hokkaido University, National University Corporation Tokai National Higher Education and Research System
    Inventors: Hidenori Iwashita, Gentaro Funatsu, Michihiro Furusaka, Takashi Kamiyama, Hirotaka Sato, Yoshiaki Kiyanagi
  • NUCLEAR REACTION DETECTION APPARATUS, METHOD, AND PROGRAM
    Publication number: 20220260735
    Abstract: A nuclear reaction detection device includes an FPGA (Field Programmable Gate Array) 100 which is arranged in an environment in which particle radiation is incident, and includes a user circuit 101 configured to output a value different from that in a normal state, if an SEU (Single Event Upset) occurs in a semiconductor element included in the FPGA, and an SEF detection unit 210 which detects that an abnormal operation (SEF) has occurred in the user circuit based on the output value from the user circuit 101 of the FPGA 100.
    Type: Application
    Filed: July 3, 2020
    Publication date: August 18, 2022
    Inventors: Hidenori IWASHITA, Gentaro FUNATSU, Michihiro FURUSAKA, Takashi KAMIYAMA, Hirotaka SATO, Yoshiaki KIYANAGI
  • NUCLEAR REACTION DETECTION APPARATUS, METHOD AND PROGRAM
    Publication number: 20220252743
    Abstract: A nuclear reaction detection device 100 includes a semiconductor memory 100 arranged in an environment in which radiation is incident, a position information storage unit 210 that stores spatial position information of a semiconductor element in the semiconductor memory 100, a bit position specifying unit 220 that detects that an SEU (Single Event Upset) has occurred in the semiconductor element included in the semiconductor memory 100, and specifies the semiconductor element in which the SEU has occurred, and a position calculating unit 230 that calculates a spatial position in which the SEU has occurred, based on the specified semiconductor element and the spatial position information.
    Type: Application
    Filed: July 3, 2020
    Publication date: August 11, 2022
    Inventors: Hidenori IWASHITA, Gentaro FUNATSU, Michihiro FURUSAKA, Takashi KAMIYAMA, Hirotaka SATO, Yoshiaki KIYANAGI