Patents by Inventor Michihiro Takii

Michihiro Takii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210186322
    Abstract: There is provided an ophthalmologic measurement apparatus for measuring a subject eye. The apparatus includes measurement means for objectively measuring eye refractive power of the subject eye, acquisition means for acquiring intraocular lens information relating to an intraocular lens inserted into the subject eye, and correction means for correcting a measurement result of the eye refractive power, based on the intraocular lens information.
    Type: Application
    Filed: December 7, 2020
    Publication date: June 24, 2021
    Applicant: NIDEK CO., LTD.
    Inventors: Michihiro TAKII, Masanori YATANI, Kazunari SHIMIZU, Tetsuya YAMAMOTO
  • Patent number: 11022430
    Abstract: An eyeglass frame shape measurement device measures a shape of an eyeglass frame. The eyeglass frame shape measurement device includes a light projecting optical system that has a light source and emits a measurement light flux from the light source toward a groove of a rim of an eyeglass frame, a light receiving optical system that has a detector and causes the detector to receive a reflected light flux of the measurement light flux emitted toward the groove and reflected by the groove, an acquiring means section that acquires a cross-sectional shape of the groove based on the reflected light flux received by the detector, a change section that change a light receiving position of the reflected light flux, and a control section that control the change section to change the light receiving position of the reflected light flux so that the detector receives the reflected light flux.
    Type: Grant
    Filed: August 28, 2018
    Date of Patent: June 1, 2021
    Assignee: NIDEK CO., LTD.
    Inventors: Kyoji Takeichi, Michihiro Takii, Takaaki Matsui
  • Patent number: 10980412
    Abstract: A subjective optometry apparatus includes a light projecting optical system that has a visual target presenting portion for emitting a target light flux and projects a target light flux emitted from the visual target presenting portion toward a subject eye, a calibration portion that is disposed in an optical path of the light projecting optical system and changes optical characteristics of the target light flux, an acquisition portion that acquires a near distance objective eye refractive power that is an eye refractive power of the subject eye objectively measured in a near distance viewing state, and a control portion that controls an operation for acquiring a near distance subjective eye refractive power that is a subjective eye refractive power of the subject eye measured in a near distance viewing state, based on the near distance objective eye refractive power.
    Type: Grant
    Filed: February 22, 2019
    Date of Patent: April 20, 2021
    Assignee: NIDEK CO., LTD.
    Inventors: Michihiro Takii, Hirohisa Terabe
  • Patent number: 10966604
    Abstract: A subjective optometry apparatus includes a subjective measurement portion which subjectively measures optical characteristics of an subject eye, an objective measurement portion which objectively measures optical characteristics of the subject eye, a control portion which causes the objective measurement portion to objectively measure the optical characteristics during the measurement by the subjective measurement portion, and a display control portion which performs a control to display an eye diagram representing the subject eye and an imaging position of a target light flux incident on the subject eye. The display control portion performs a control to display the imaging position based on the objectively measured optical characteristics.
    Type: Grant
    Filed: September 27, 2018
    Date of Patent: April 6, 2021
    Assignee: NIDEK CO., LTD.
    Inventors: Michihiro Takii, Masaki Tanaka, Masaaki Hanebuchi
  • Publication number: 20210095953
    Abstract: An eyeglass frame shape measurement device includes an optical measurement unit, a probe unit, a holding unit that holds the optical measurement unit and the probe unit, a changing portion that integrally moves the optical measurement unit and the probe unit with respect to an eyeglass frame to change a measurement position with respect to a groove of a rim of the eyeglass frame, and a controller that controls an operation of the eyeglass frame shape measurement device. The controller controls an operation of the changing portion to measure the groove of the rim of the eyeglass frame, acquires a cross-sectional shape of the groove of the rim of the eyeglass frame based on a detection result detected by the optical measurement unit, and acquires a shape of the rim of the eyeglass frame based on a detection result detected by the probe unit.
    Type: Application
    Filed: September 28, 2020
    Publication date: April 1, 2021
    Applicant: NIDEK CO., LTD.
    Inventors: Michihiro TAKII, Kyoji TAKEICHI, Yuya NAKAKO, Takaaki MATSUI
  • Publication number: 20200191560
    Abstract: An eyeglass frame shape measurement device measures a shape of an eyeglass frame. The eyeglass frame shape measurement device includes a light projecting optical system that has a light source and emits a measurement light flux from the light source toward a groove of a rim of an eyeglass frame, a light receiving optical system that has a detector and causes the detector to receive a reflected light flux of the measurement light flux emitted toward the groove and reflected by the groove, an acquiring means section that acquires a cross-sectional shape of the groove based on the reflected light flux received by the detector, a change section that change a light receiving position of the reflected light flux, and a control section that control the change section to change the light receiving position of the reflected light flux so that the detector receives the reflected light flux.
    Type: Application
    Filed: August 28, 2018
    Publication date: June 18, 2020
    Applicant: NIDEK CO., LTD.
    Inventors: Kyoji TAKEICHI, Michihiro TAKII, Takaaki MATSUI
  • Publication number: 20200158496
    Abstract: An eyeglass frame shape measurement device measures a shape of an eyeglass frame. The eyeglass frame shape measurement device includes a light projecting optical system that has a light source and emits measurement light from the light source toward a groove of a rim of an eyeglass frame, a light receiving optical system that has a detector and causes the detector to receive reflected light of the measurement light emitted toward the groove in the rim of the eyeglass frame by the light projecting optical system and reflected by the groove of the rim of the eyeglass frame, an acquisition section that acquires a cross-sectional shape of the groove of the rim of the eyeglass frame on the basis of the reflected light received by the detector, and a luminance control section that controls a luminance level of the reflected light to be received by the detector.
    Type: Application
    Filed: June 6, 2018
    Publication date: May 21, 2020
    Applicant: NIDEK CO., LTD.
    Inventors: Michihiro TAKII, Kunihito MIZUKOSHI, Tomoya ISHII, Kyoji TAKEICHI
  • Publication number: 20200100666
    Abstract: A subjective optometry apparatus includes an optometry unit having an optical member, being located in front of a subject eye, and changing optical characteristics of a target light flus with using the optical member, and a measurement optical system that has a light projecting optical system for applying measurement light emitted from a measurement light source to a fundus of the subject eye through the optometry unit, and a light receiving optical system in which a detector receives reflected light of the measurement light reflected on the fundus of the subject eye through the optometry unit, and that objectively measures the optical characteristics of the subject eye. An optical axis of the measurement optical system is set to be off-axis from an optical axis of the optical member in the optometry unit.
    Type: Application
    Filed: September 27, 2019
    Publication date: April 2, 2020
    Applicant: NIDEK CO., LTD.
    Inventors: Michihiro TAKII, Yukito HIRAYAMA
  • Patent number: 10602924
    Abstract: A subjective optometry apparatus includes a light projecting optical system which projects a target light flux toward an examinee's eye to project a visual target onto the examinee's eye, a calibration optical system which is disposed in an optical path from the light projecting optical system to the examinee's eye and changes optical characteristics of the target light flux, an optical member which guides the target light flux of which the optical characteristics is changed by the calibration optical system to the examinee's eye, a light deflection section being different from the calibration optical system, which includes light deflection members provided in a left and right pair and a driving section which rotationally drives the light deflection members, and deflects the target light flux by rotating the light deflection members, and a control section which controls the light deflection section based on prism information to deflect the target light flux.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: March 31, 2020
    Assignee: NIDEK CO., LTD.
    Inventors: Michihiro Takii, Masaaki Hanebuchi, Hisashi Ochi
  • Patent number: 10537239
    Abstract: A subjective optometry apparatus includes a light projecting optical system that projects a target light flux to an examinee's eye, a fixed optical element that guides an image of the target light flux to the examinee's eye so as to have an optically predetermined examination length, a calibration optical system disposed in an optical path of the light projecting optical system to change optical characteristics of the examinee's eye, a measurement unit that accommodates the light projecting optical system; a positional information acquiring portion that acquires positional information of the measurement unit, a correction amount setting portion that sets a correction amount for correcting a projection magnification of the target light flux projected to the examinee's eye, based on the positional information, and a correction portion that corrects the projection magnification of the target light flux based on the correction amount set by the correction amount setting portion.
    Type: Grant
    Filed: March 6, 2018
    Date of Patent: January 21, 2020
    Assignee: NIDEK CO., LTD.
    Inventors: Michihiro Takii, Masaaki Hanebuchi, Hisashi Ochi, Sasagu Tachibana
  • Patent number: 10470658
    Abstract: An optometry apparatus includes: an optical characteristic measurement device configured to measure an optical characteristic of right and left subject eyes in a both-eye opened state by projecting a visual target onto the subject eyes; an anterior ocular segment acquisition device configured to acquire anterior ocular segment images of the right and left subject eyes by the optical characteristic measurement device during the measurement of the optical characteristic of the subject eye in the both-eye opened state; and a controller configured to execute: an analysis instruction for performing analysis processing on the anterior ocular segment images acquired by the anterior ocular segment acquisition device to acquire both-eye opened state information; a determination instruction for determining whether the both-eye opened state information acquired by the analysis instruction is favorable or not, to acquire determination information; and an output instruction for outputting the determination information acq
    Type: Grant
    Filed: September 20, 2017
    Date of Patent: November 12, 2019
    Assignee: NIDEK CO., LTD.
    Inventors: Michihiro Takii, Noriji Kawai, Taeko Horino, Hisashi Ochi, Kazunori Shibata
  • Patent number: 10456035
    Abstract: An ophthalmic surgical microscope includes an observation optical system configured to guide observation luminous fluxes for a right eye and a left eye from an observation object to an imaging device, an actuator configured to move a position of the observation optical system in at least a direction intersecting with the observation luminous fluxes, a processor, and a memory storing computer-readable instructions. The computer readable instructions, when executed by the processor, cause the ophthalmic surgical microscope to cause a stereoscopic image display to display an observation image to be observed with a right eye of a user and an observation image to be observed with a left eye of the user, detect a position of the observation object with respect to the observation optical system, and correct a deviation in a relative position of the observation optical system with respect to the observation object.
    Type: Grant
    Filed: August 25, 2017
    Date of Patent: October 29, 2019
    Assignee: NIDEK CO., LTD.
    Inventors: Takayoshi Shibata, Michihiro Takii, Shinya Iwata
  • Publication number: 20190269318
    Abstract: A subjective optometry apparatus includes a light projecting optical system that has a visual target presenting portion for emitting a target light flux and projects a target light flux emitted from the visual target presenting portion toward a subject eye, a calibration portion that is disposed in an optical path of the light projecting optical system and changes optical characteristics of the target light flux, an acquisition portion that acquires a near distance objective eye refractive power that is an eye refractive power of the subject eye objectively measured in a near distance viewing state, and a control portion that controls an operation for acquiring a near distance subjective eye refractive power that is a subjective eye refractive power of the subject eye measured in a near distance viewing state, based on the near distance objective eye refractive power.
    Type: Application
    Filed: February 22, 2019
    Publication date: September 5, 2019
    Applicant: NIDEK CO., LTD.
    Inventors: Michihiro TAKII, Hirohisa TERABE
  • Patent number: 10264967
    Abstract: A subjective optometry apparatus includes subjective measurement unit for subjectively measuring an optical characteristic of a subject eye, the subjective measurement unit including a calibration optical system that is disposed in an optical path of a light projecting optical system projecting a visual target luminous flux toward the subject eye and changes an optical characteristic of the visual target luminous flux. The subjective optometry apparatus includes objective measurement unit for objectively measuring the optical characteristic of the subject eye, the objective measurement unit including a measurement optical system that emits measurement light to a fundus of the subject eye and receives reflected light of the measurement light.
    Type: Grant
    Filed: September 1, 2017
    Date of Patent: April 23, 2019
    Assignee: NIDEK CO., LTD.
    Inventors: Michihiro Takii, Masaaki Hanebuchi, Noriji Kawai
  • Publication number: 20190099073
    Abstract: A subjective optometry apparatus includes a subjective measurement portion which subjectively measures optical characteristics of an subject eye, an objective measurement portion which objectively measures optical characteristics of the subject eye, a control portion which causes the objective measurement portion to objectively measure the optical characteristics during the measurement by the subjective measurement portion, and a display control portion which performs a control to display an eye diagram representing the subject eye and an imaging position of a target light flux incident on the subject eye. The display control portion performs a control to display the imaging position based on the objectively measured optical characteristics.
    Type: Application
    Filed: September 27, 2018
    Publication date: April 4, 2019
    Applicant: NIDEK CO., LTD.
    Inventors: Michihiro TAKII, Masaki TANAKA, Masaaki HANEBUCHI
  • Publication number: 20190099072
    Abstract: An ophthalmic device includes an anterior ocular segment photographing unit, a fixation target display unit, and a processor. The anterior ocular segment photographing unit captures an anterior ocular segment image of at least one of a left eye and a right eye of a subject. The fixation target display unit displays a fixation target with respect to the at least one of the left eye and the right eye of the subject. The processor measures an eye position of the at least one of the left eye and the right eye of the subject by processing the anterior ocular segment image captured by the anterior ocular segment photographing unit. The processor generates eye position state information, which indicates a state of the eye position of the subject, based on measurement results of the eye position at least two timings including a post-switch timing and a pre-switch timing.
    Type: Application
    Filed: September 25, 2018
    Publication date: April 4, 2019
    Applicant: NIDEK CO., LTD.
    Inventors: Michihiro TAKII, Sasagu TACHIBANA, Masaki TANAKA, Yujiro TOCHIKUBO
  • Patent number: 10188282
    Abstract: A subjective optometry apparatus includes: a subjective measurer including a light projecting optical system, a corrective optical system including a right-eye corrective optical system and a left-eye corrective optical system, and an optical member for guiding the target light flux corrected by the corrective optical system to an examinee's eye, the subjective measurer subjectively measuring an optical characteristic of the examinee's eye; and an objective measurer including a measurement optical system for emitting measurement light to a fundus of the examinee's eye and for receiving reflected light from the fundus, the objective measurer objectively measuring the optical characteristic of the examinee's eye via the optical member disposed on an optical path of the measurement optical system.
    Type: Grant
    Filed: November 10, 2016
    Date of Patent: January 29, 2019
    Assignee: NIDEK CO., LTD.
    Inventors: Michihiro Takii, Masaaki Hanebuchi, Hisashi Ochi
  • Publication number: 20180296085
    Abstract: A subjective optometry apparatus includes a light projecting optical system which projects a target light flux toward an examinee's eye to project a visual target onto the examinee's eye, a calibration optical system which is disposed in an optical path from the light projecting optical system to the examinee's eye and changes optical characteristics of the target light flux, an optical member which guides the target light flux of which the optical characteristics is changed by the calibration optical system to the examinee's eye, a light deflection section being different from the calibration optical system, which includes light deflection members provided in a left and right pair and a driving section which rotationally drives the light deflection members, and deflects the target light flux by rotating the light deflection members, and a control section which controls the light deflection section based on prism information to deflect the target light flux.
    Type: Application
    Filed: March 30, 2018
    Publication date: October 18, 2018
    Applicant: NIDEK CO., LTD.
    Inventors: Michihiro TAKII, Masaaki HANEBUCHI, Hisashi OCHI
  • Publication number: 20180256022
    Abstract: A subjective optometry apparatus includes a light projecting optical system that projects a target light flux to an examinee's eye, a fixed optical element that guides an image of the target light flux to the examinee's eye so as to have an optically predetermined examination length, a calibration optical system disposed in an optical path of the light projecting optical system to change optical characteristics of the examinee's eye, a measurement unit that accommodates the light projecting optical system; a positional information acquiring portion that acquires positional information of the measurement unit, a correction amount setting portion that sets a correction amount for correcting a projection magnification of the target light flux projected to the examinee's eye, based on the positional information, and a correction portion that corrects the projection magnification of the target light flux based on the correction amount set by the correction amount setting portion.
    Type: Application
    Filed: March 6, 2018
    Publication date: September 13, 2018
    Applicant: NIDEK CO., LTD.
    Inventors: Michihiro TAKII, Masaaki HANEBUCHI, Hisashi OCHI, Sasagu TACHIBANA
  • Publication number: 20180192867
    Abstract: A subjective optometry apparatus includes: a subjective measurer which has a corrective optical system disposed on an optical path of a light projecting optical system configured to project a target light flux toward an examinee's eye and configured to change an optical characteristic of the target light flux and which is configured to subjectively measure an optical characteristic of the examinee's eye; an acquisitor configured to acquire position information on at least one of examinee's right and left eyes; a determiner configured to determine, based on the position information acquired by the acquisitor, whether or not subjective measurement can be implemented in a binocular open state of the examinee's right and left eyes, thereby acquiring determination information; and a determination information output unit configured to output the determination information acquired by the determiner.
    Type: Application
    Filed: January 9, 2018
    Publication date: July 12, 2018
    Inventors: Taeko HORINO, Michihiro TAKII, Noriji KAWAI