Patents by Inventor Michihiro Yamazaki
Michihiro Yamazaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10115394Abstract: An object is to provide a technique which can provide a highly valid recognition result while preventing unnecessary processing. A voice recognition device includes first to third voice recognition units, and a control unit. When it is decided based on recognition results obtained by the first and second voice recognition units to cause the third voice recognition unit to recognize an input voice, the control unit causes the third voice recognition unit to recognize the input voice by using a dictionary including a candidate character string obtained by at least one of the first and second voice recognition units.Type: GrantFiled: July 8, 2014Date of Patent: October 30, 2018Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Naoya Sugitani, Yohei Okato, Michihiro Yamazaki
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Publication number: 20170140752Abstract: An object is to provide a technique which can provide a highly valid recognition result while preventing unnecessary processing. A voice recognition device includes first to third voice recognition units, and a control unit. When it is decided based on recognition results obtained by the first and second voice recognition units to cause the third voice recognition unit to recognize an input voice, the control unit causes the third voice recognition unit to recognize the input voice by using a dictionary including a candidate character string obtained by at least one of the first and second voice recognition units.Type: ApplicationFiled: July 8, 2014Publication date: May 18, 2017Applicant: MITSUBISHI ELECTRIC CORPORATIONInventors: Naoya SUGITANI, Yohei OKATO, Michihiro YAMAZAKI
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Patent number: 8977547Abstract: A voice recognition system includes: a voice input unit 11 for inputting a voice uttered a plurality of times; a registering voice data storage unit 12 for storing voice data uttered the plurality of times and input into the voice input unit 11; an utterance stability verification unit 13 for determining a similarity between the voice data uttered the plurality of times that are read from the registering voice data storage unit 12, and determining that registration of the voice data is acceptable when the similarity is greater than a threshold Tl; and a standard pattern creation unit 14 for creating a standard pattern by using the voice data where the utterance stability verification unit 13 determines that registration is acceptable.Type: GrantFiled: October 8, 2009Date of Patent: March 10, 2015Assignee: Mitsubishi Electric CorporationInventors: Michihiro Yamazaki, Jun Ishii, Hiroki Sakashita, Kazuyuki Nogi
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Patent number: 8868431Abstract: A recognition dictionary creation device identifies the language of a reading of an inputted text which is a target to be registered and adds a reading with phonemes in the language identified thereby to the target text to be registered, and also converts the reading of the target text to be registered from the phonemes in the language identified thereby to phonemes in a language to be recognized which is handled in voice recognition to create a recognition dictionary in which the converted reading of the target text to be registered is registered.Type: GrantFiled: February 5, 2010Date of Patent: October 21, 2014Assignee: Mitsubishi Electric CorporationInventors: Michihiro Yamazaki, Jun Ishii, Yasushi Ishikawa
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Publication number: 20140100847Abstract: Disclosed is a voice recognition device including: first through Mth voice recognition parts each for detecting a voice interval from sound data stored in a sound data storage unit 2 to extract a feature quantity of the sound data within the voice interval, and each for carrying out a recognition process on the basis of the feature quantity extracted thereby while referring to a recognition dictionary; a voice recognition switching unit 4 for switching among the first through Mth voice recognition parts; a recognition control unit 5 for controlling the switching among the voice recognition parts by the voice recognition switching unit 4 to acquire recognition results acquired by a voice recognition part selected; and a recognition result selecting unit 6 for selecting a recognition result to be presented to a user from the recognition results acquired by the recognition control unit 5.Type: ApplicationFiled: July 5, 2011Publication date: April 10, 2014Applicant: MITSUBISHI ELECTRIC CORPORATIONInventors: Jun Ishii, Michihiro Yamazaki
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Publication number: 20140067400Abstract: In a word string information DB, when phonetic information automatically generated from written notation information matches regular phonetic information, only the written notation information is registered, or, when the phonetic information automatically generated does not match the regular phonetic information, the written notation information and the regular phonetic information are registered.Type: ApplicationFiled: June 14, 2011Publication date: March 6, 2014Applicant: MITSUBISHI ELECTRIC CORPORATIONInventor: Michihiro Yamazaki
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Publication number: 20120239399Abstract: Disclosed is a voice recognition device which creates a recognition dictionary (statically-created dictionary) in advance for a vocabulary having words to be recognized whose number is equal to or larger than a threshold, and creates a recognition dictionary (dynamically-created dictionary) for a vocabulary having words to be recognized whose number is smaller than the threshold in an interactive situation.Type: ApplicationFiled: March 30, 2010Publication date: September 20, 2012Inventors: Michihiro Yamazaki, Yuzo Maruta
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Publication number: 20120226491Abstract: A recognition dictionary creation device identifies the language of a reading of an inputted text which is a target to be registered and adds a reading with phonemes in the language identified thereby to the target text to be registered, and also converts the reading of the target text to be registered from the phonemes in the language identified thereby to phonemes in a language to be recognized which is handled in voice recognition to create a recognition dictionary in which the converted reading of the target text to be registered is registered.Type: ApplicationFiled: February 5, 2010Publication date: September 6, 2012Inventors: Michihiro Yamazaki, Jun Ishii, Yasushi Ishikawa
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Publication number: 20110276331Abstract: A voice recognition system includes: a voice input unit 11 for inputting a voice uttered a plurality of times; a registering voice data storage unit 12 for storing voice data uttered the plurality of times and input into the voice input unit 11; an utterance stability verification unit 13 for determining a similarity between the voice data uttered the plurality of times that are read from the registering voice data storage unit 12, and determining that registration of the voice data is acceptable when the similarity is greater than a threshold Tl; and a standard pattern creation unit 14 for creating a standard pattern by using the voice data where the utterance stability verification unit 13 determines that registration is acceptable.Type: ApplicationFiled: October 8, 2009Publication date: November 10, 2011Inventors: Michihiro Yamazaki, Jun Ishii, Hiroki Sakashita, Kazuyuki Nogi
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Patent number: 8009286Abstract: A light source section outputs optical flux having two types of wavelength, which are a short wavelength and a long wavelength, while the intensity is made variable. The output from the first light intensity detecting section in irradiating the optical flux having a short wavelength is compared with the output from the first light intensity detecting section in irradiating the optical flux having a long wavelength. A disappearance level near a point where the detected signal from the internal subject disappears is calculated. The first intensity of optical flux having a long wavelength is set to level higher than the disappearance level. Based on the output from the first light intensity detecting section obtained by the optical flux having a long wavelength of the first intensity, a subject inside the body to be detected is measured.Type: GrantFiled: December 4, 2007Date of Patent: August 30, 2011Assignee: Kabushiki Kaisha TopconInventors: Hisashi Isozaki, Takehiro Takase, Takashi Kakinuma, Hiroyuki Maekawa, Fumio Koda, Michihiro Yamazaki
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Patent number: 7861125Abstract: A image data processing apparatus comprises: a user interface; an input device; a processor that converts original data; a first monitoring unit that monitors operation of the user interface or the input device; a second monitoring unit that monitors processing of the processor; a first storage unit that sequentially stores in chronological order at least one of operating records and processing records; an error detecting unit that detects an error; a second storage unit that, when an error is detected, stores determination information that includes a plurality of records that are stored in the first storage unit within a predetermined time period up until the error occurs; an error prediction unit that predicts occurrence of an error by determining whether there is agreement between the plurality of records and the determination information; and a process modifier that, when occurrence of an error is predicted, modifies the processing of the processor.Type: GrantFiled: October 15, 2007Date of Patent: December 28, 2010Assignee: Fuji Xerox Co., Ltd.Inventors: Michihiro Yamazaki, Shinichi Murayama
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Publication number: 20100007872Abstract: A light source section outputs optical flux having two types of wavelength, which are a short wavelength and a long wavelength, while the intensity is made variable. The optical flux is made incident to a detected surface of a body to be detected at a predetermined incident angle simultaneously or alternatively. Based on a type of optical flux outputted from the light source section and an output from a first light intensity detecting section, at least the intensity of the optical flux having a long wavelength outputted from the light source section is adjusted. The output from the first light intensity detecting section in irradiating the optical flux having a short wavelength is compared with the output from the first light intensity detecting section in irradiating the optical flux having a long wavelength.Type: ApplicationFiled: December 4, 2007Publication date: January 14, 2010Applicant: KABUSHIKI KAISHA TOPCONInventors: Hisashi Isozaki, Takehiro Takase, Takashi Kakinuma, Hiroyuki Maekawa, Fumio Koda, Michihiro Yamazaki
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Publication number: 20080184076Abstract: A image data processing apparatus comprises: a user interface; an input device; a processor that converts original data; a first monitoring unit that monitors operation of the user interface or the input device; a second monitoring unit that monitors processing of the processor; a first storage unit that sequentially stores in chronological order at least one of operating records and processing records; an error detecting unit that detects an error; a second storage unit that, when an error is detected, stores determination information that includes a plurality of records that are stored in the first storage unit within a predetermined time period up until the error occurs; an error prediction unit that predicts occurrence of an error by determining whether there is agreement between the plurality of records and the determination information; and a process modifier that, when occurrence of an error is predicted, modifies the processing of the processor.Type: ApplicationFiled: October 15, 2007Publication date: July 31, 2008Applicant: FUJI XEROX CO., LTD.Inventors: Michihiro Yamazaki, Shinichi Murayama
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Patent number: 7394532Abstract: A method and an apparatus of inspecting the surface of a wafer, where two or more kinds of laser are switched or mixed to make the laser incident on the film-coated wafer by a same incident angle, in which inspection data regarding an inspection apparatus and film parameters regarding a film are stored in storage means of the inspection apparatus in an associated state with each other so as to obtain predetermined inspection conditions. When performing each measurement, an operator sets the film parameters of the wafer to be measured by setting means of the inspection apparatus. Thus, desired inspection conditions are automatically set in the inspection apparatus. The film parameters that the operator sets at each measurement are a film thickness and a film refraction index.Type: GrantFiled: October 8, 2003Date of Patent: July 1, 2008Assignee: Kabushiki Kaisha TopconInventors: Hisashi Isozaki, Michihiro Yamazaki, Hiroshi Yoshikawa, Takehiro Takase, Yutaka Shida, Yoichiro Iwa
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Patent number: 7064820Abstract: A surface inspection method in a surface inspection system which comprises a photodetection unit and a photodetection polarizing angle changing means, comprising the step of receiving a scattered reflection light from a substrate surface where standard particles are coated by changing a photodetection polarizing angle by the photodetection polarizing angle changing means, and the step of performing surface inspection by setting the photodetection polarizing angle to a condition where an S/N ratio of photodetection output is at the highest.Type: GrantFiled: March 21, 2003Date of Patent: June 20, 2006Assignee: Kabushiki Kaisha TOPCONInventors: Hisashi Isozaki, Michihiro Yamazaki, Hiroshi Yoshikawa, Naoto Miki, Hiroyuki Maekawa, Naohiro Takahashi
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Patent number: 6771364Abstract: A surface inspection apparatus comprises: a light source section that emits a first luminous flux and a second luminous flux; an irradiation optical system that irradiates the first luminous flux and the second luminous flux on the surface of the film-coated inspection subject; a displacement section that relatively displaces the film-coated inspection subject and an irradiation luminous flux from the irradiation optical system; a light-receiving optical system that receives scattered light generated from the inspection subject on the film-coated inspection subject after irradiation of the first luminous flux from the irradiation optical system and scattered light generated from the inspection subject on the film-coated inspection subject after irradiation of the second luminous flux from the irradiation optical system; a first light-receiving section that transforms the scattered light of the first luminous flux received by the light-receiving optical system into a first light reception signal; a second lighType: GrantFiled: August 22, 2002Date of Patent: August 3, 2004Assignee: Kabushiki Kaisha TopconInventors: Hisashi Isozaki, Michihiro Yamazaki, Hiroshi Yoshikawa, Yoichiro Iwa
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Publication number: 20040130727Abstract: A method and an apparatus of inspecting the surface of a wafer, where two or more kinds of laser are switched or mixed to make the laser incident on the film-coated wafer by a same incident angle, in which inspection data regarding an inspection apparatus and film parameters regarding a film are stored in storage means of the inspection apparatus in an associated state with each other so as to obtain predetermined inspection conditions. When performing each measurement, an operator sets the film parameters of the wafer to be measured by setting means of the inspection apparatus. Thus, desired inspection conditions are automatically set in the inspection apparatus. The film parameters that the operator sets at each measurement are a film thickness and a film refraction index.Type: ApplicationFiled: October 8, 2003Publication date: July 8, 2004Applicant: Kabushiki Kaisha TOPCONInventors: Hisashi Isozaki, Michihiro Yamazaki, Hiroshi Yoshikawa, Takehiro Takase, Yutaka Shida, Yoichiro Iwa
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Publication number: 20040036865Abstract: A surface inspection apparatus comprises: a light source section that emits a first luminous flux and a second luminous flux; an irradiation optical system that irradiates the first luminous flux and the second luminous flux on the surface of the film-coated inspection subject; a displacement section that relatively displaces the film-coated inspection subject and an irradiation luminous flux from the irradiation optical system; a light-receiving optical system that receives scattered light generated from the inspection subject on the film-coated inspection subject after irradiation of the first luminous flux from the irradiation optical system and scattered light generated from the inspection subject on the film-coated inspection subject after irradiation of the second luminous flux from the irradiation optical system; a first light-receiving section that transforms the scattered light of the first luminous flux received by the light-receiving optical system into a first light reception signal; a second lighType: ApplicationFiled: August 22, 2002Publication date: February 26, 2004Applicant: Kabushiki Kaisha TOPCONInventors: Hisashi Isozaki, Michihiro Yamazaki, Hiroshi Yoshikawa, Yoichiro Iwa
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Publication number: 20030184744Abstract: A surface inspection method in a surface inspection system which comprises a photodetection unit and a photodetection polarizing angle changing means, comprising the step of receiving a scattered reflection light from a substrate surface where standard particles are coated by changing a photodetection polarizing angle by the photodetection polarizing angle changing means, and the step of performing surface inspection by setting the photodetection polarizing angle to a condition where an S/N ratio of photodetection output is at the highest.Type: ApplicationFiled: March 21, 2003Publication date: October 2, 2003Inventors: Hisashi Isozaki, Michihiro Yamazaki, Hiroshi Yoshikawa, Naoto Miki, Hiroyuki Maekawa, Naohiro Takahashi