Patents by Inventor Michiko SUEYOSHI

Michiko SUEYOSHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11342116
    Abstract: A polypropylene film which has a crystallite size of not more than 12.2 nm, the crystallite size being determined using Scherrer's equation from a full width at half maximum of the reflection peak from (040) plane of ? crystal measured by a wide-angle X-ray diffraction method, and a volume resistivity of not lower than 6×1014 ?·cm, the volume resistivity being calculated in accordance with equation I from a current value that is measured 1 minute after applying a voltage at a potential gradient of 200 V/?m in an environment at 100° C. Equation I: volume resistivity=[(effective electrode area)×(applied voltage)]/[(polypropylene film thickness)×(current value)].
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: May 24, 2022
    Assignee: Oji Holdings Corporation
    Inventors: Michiko Sueyoshi, Akihiro Kakehi, Takeshi Tominaga, Yoshimune Okuyama
  • Patent number: 11142618
    Abstract: A biaxially stretched polypropylene film including a polypropylene resin and satisfying the following: (a) the crystallite size Sa, which is determined using the Scherrer equation from the full width at half maximum of the ?-crystal (040) plane reflection peak as measured by wide-angle x-ray diffraction after treatment for 200 hours at 105° C., is not more than 12.9 nm; and (b) the planar orientation coefficient ?Pa, which is calculated from the birefringence values ?Nyz and ?Nxz with respect to the thickness direction as determined by optical birefringence measurement after treatment for 200 hours at 105° C., is at least 0.013 (?Pa=(?Nyz+?Nxz)/2).
    Type: Grant
    Filed: September 22, 2017
    Date of Patent: October 12, 2021
    Assignee: Oji Holdings Corporation
    Inventors: Takeshi Tominaga, Michiko Sueyoshi, Yoshimune Okuyama, Masahiro Nakata, Tadakazu Ishiwata
  • Publication number: 20200176188
    Abstract: A polypropylene film which has a crystallite size of not more than 12.2 nm, the crystallite size being determined using Scherrer's equation from a full width at half maximum of the reflection peak from (040) plane of ? crystal measured by a wide-angle X-ray diffraction method, and a volume resistivity of not lower than 6×1014 ?·cm, the volume resistivity being calculated in accordance with equation I from a current value that is measured 1 minute after applying a voltage at a potential gradient of 200 V/?m in an environment at 100° C. Equation I: volume resistivity=[(effective electrode area)×(applied voltage)]/[(polypropylene film thickness)×(current value)].
    Type: Application
    Filed: August 1, 2018
    Publication date: June 4, 2020
    Inventors: Michiko SUEYOSHI, Akihiro KAKEHI, Takeshi TOMINAGA, Yoshimune OKUYAMA
  • Publication number: 20190315047
    Abstract: A biaxially oriented polypropylene film containing a polypropylene resin, the film having a thickness of 1.0 to 3.0 ?m, and a molecular orientation coefficient ?Nx of 0.013 to 0.016, as calculated according to ?Nx=(?Nxy+?Nxz)/2 on the basis of a birefringence value ?Nxy in the slow axis direction with respect to the fast axis direction and a birefringence value ?Nxz in the slow axis direction with respect to the thickness direction, as measured via optical birefringence measurement.
    Type: Application
    Filed: December 28, 2017
    Publication date: October 17, 2019
    Inventors: Takeshi TOMINAGA, Michiko SUEYOSHI, Yoshimune OKUYAMA, Yoshikazu FUJISHIRO, Masahiro NAKATA, Tadakazu ISHIWATA
  • Publication number: 20190284354
    Abstract: A biaxially stretched polypropylene film including a polypropylene resin and satisfying the following: (a) the crystallite size Sa, which is determined using the Scherrer equation from the full width at half maximum of the ?-crystal (040) plane reflection peak as measured by wide-angle x-ray diffraction after treatment for 200 hours at 105° C., is not more than 12.9 nm; and (b) the planar orientation coefficient ?Pa, which is calculated from the birefringence values ?Nyz and ?Nxz with respect to the thickness direction as determined by optical birefringence measurement after treatment for 200 hours at 105° C., is at least 0.013 (?Pa=(?Nyz+?Nxz)/2).
    Type: Application
    Filed: September 20, 2017
    Publication date: September 19, 2019
    Inventors: Takeshi TOMINAGA, Michiko SUEYOSHI, Yoshimune OKUYAMA, Masahiro NAKATA, Tadakazu ISHIWATA