Patents by Inventor Michio Sakurai
Michio Sakurai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240424613Abstract: Point group data obtained by measuring the penetration depth of a keyhole 66 during laser welding is divided into a plurality of regions in the depth direction of measured values, and evaluation data showing a change in number of points with time is acquired for each of the plurality of regions. An average variation in number of points is calculated for each of the plurality of regions based on the plurality of pieces of evaluation data. When the average variation is equal to or larger than a predetermined threshold, it is determined that measurement of the penetration depth of the keyhole 66 is unstable under the welding condition.Type: ApplicationFiled: August 26, 2024Publication date: December 26, 2024Inventors: Kenta KUBOTA, Michio SAKURAI, Toshiyuki MISHIMA, Toru SAKAI
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Publication number: 20240375211Abstract: A transmission fiber includes a first core and a second core. The second core is provided on the outer periphery of the first core. In a first step of a laser termination process, a first laser beam is emitted from the second core, and a second laser beam is emitted from the first core. In a second step, the output power of the second laser beam is gradually reduced while a position at which the first laser beam and the second laser beam are emitted to a workpiece is moved in a laser processing direction. In a third step, the output of the second laser beam is stopped while the first laser beam is emitted from the second core.Type: ApplicationFiled: July 23, 2024Publication date: November 14, 2024Inventors: Tatsuyuki NAKAGAWA, Atsuhiro KAWAMOTO, Junji FUJIWARA, Michio SAKURAI
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Publication number: 20240337604Abstract: An appearance inspection apparatus includes a shape measurement unit configured to measure the three-dimensional shape of a weld and a data processor configured to process shape data acquired by the shape measurement unit. The data processor includes a shape data processor configured to correct a resolution of the shape data, a learning data set generator configured to generate a plurality of learning data sets by performing data augmentation on multiple pieces of sample shape data acquired in advance, a determination model generator configured to generate a determination model using the plurality of learning data sets, and a first determination unit configured to determine whether the shape of the weld is good or bad based on the shape data having the corrected resolution and the determination model.Type: ApplicationFiled: June 17, 2024Publication date: October 10, 2024Inventors: Toru SAKAI, Masashi YOSHIDA, Michio SAKURAI, Daichi HIGASHI
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Publication number: 20240337608Abstract: An appearance inspection apparatus includes a shape measurement unit configured to measure the three-dimensional shape of a weld and a data processor configured to process sample shape data and shape data acquired by the shape measurement unit. The data processor includes a first learning data set generator configured to generate a plurality of first learning data sets based on the sample shape data, a second learning data set generator configured to generate a plurality of second learning data sets based on the first learning data sets, a determination model generator configured to generate multiple types of determination models using the second learning data sets, and a first determination unit configured to determine whether the shape of the weld is good or bad based on the shape data and one of the determination models.Type: ApplicationFiled: June 17, 2024Publication date: October 10, 2024Inventors: Toru SAKAI, Michio SAKURAI, Daichi HIGASHI
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Publication number: 20240321725Abstract: A semiconductor structure including a substrate and a capacitor structure is provided. The capacitor structure is disposed above the substrate. The capacitor structure includes a first electrode layer, a second electrode layer, and a first dielectric layer. The second electrode layer is disposed on the first electrode layer. The first dielectric layer is disposed between the first electrode layer and the second electrode layer. The first dielectric layer is a composite dielectric layer including at least one first silicon nitride layer and at least one first high-k dielectric layer.Type: ApplicationFiled: June 14, 2023Publication date: September 26, 2024Applicant: Powerchip Semiconductor Manufacturing CorporationInventors: Michio Sakurai, Shou-Zen Chang, I Hsuan Wei, Wei-Lin Wang
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Patent number: 12076817Abstract: A laser welding device is configured to switch an irradiation position of a measurement beam between a position of a keyhole coaxial with the optical axis of a laser beam and a position of a weld bead behind the center of an optical axis of the laser beam in a welding direction. The laser welding device determines whether there is a gap between an upper metal plate and a lower metal plate based on a measured value of a recess depth measured at the position of the weld bead.Type: GrantFiled: October 9, 2020Date of Patent: September 3, 2024Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventors: Toru Sakai, Atsuhiro Kawamoto, Junji Fujiwara, Michio Sakurai
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Publication number: 20240274652Abstract: A semiconductor structure including the following components is provided. A first capacitor structure includes first, second, and third electrode layers and first and second dielectric layers. The second electrode layer is disposed on the first electrode layer. The top-view pattern of the second electrode layer partially overlaps the top-view pattern of the first electrode layer to have a first overlapping region. The third electrode layer is disposed on the second electrode layer. The top-view pattern of the third electrode layer partially overlaps the top-view pattern of the second electrode layer to have a second overlapping region. The first overlapping region and the second overlapping region have the same top-view area. The first dielectric layer is disposed between the first electrode layer and the second electrode layer. The second dielectric layer is disposed between the second electrode layer and the third electrode layer.Type: ApplicationFiled: March 14, 2023Publication date: August 15, 2024Applicant: Powerchip Semiconductor Manufacturing CorporationInventors: Wei-Lin Wang, MICHIO SAKURAI, Cheng Yu Tsai, Shou-Zen Chang
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Publication number: 20240207970Abstract: A laser welding device includes: an irradiator configured to overlap laser light and measurement light coaxially with each other and apply the laser light and the measurement light to a weld part, a wavelength of the measurement light being different from a wavelength of the laser light; a measuring instrument configured to repeatedly measure a weld penetration depth of the weld part based on the measurement light that is emitted from the irradiator and reflected on the weld part so as to generate measured values; and a determiner configured to determine the weld penetration depth of the weld part based on: (i) one or more of the measured values; or (ii) an average value of the one or more measured values, the one or more measured values being included within a predetermined range with reference to a greatest side measured value of the measured values.Type: ApplicationFiled: March 8, 2024Publication date: June 27, 2024Inventors: Toru SAKAI, Michio Sakurai
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Patent number: 12017299Abstract: Laser welding is performed while moving irradiation positions of a laser beam and a measurement beam in forward, rightward, rearward and leftward directions, and the penetration depth of a weld portion is measured during laser welding in each of the directions. Then, a direction in which a value smaller than a reference value is measured is determined to be an optical axis deviation direction, and a correction value is added to the values measured during the laser welding when the laser welding is performed in the optical axis deviation direction.Type: GrantFiled: October 9, 2020Date of Patent: June 25, 2024Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventors: Michio Sakurai, Toru Sakai, Kenta Kubota, Takashi Urashima, Daichi Higashi
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Patent number: 11999008Abstract: A laser welding device (10) for welding a weld part (35) with laser light (L) includes: a laser emitting head (20) overlapping the laser light (L) and a measurement light (S) coaxially with each other and applying the laser light (L) and the measurement light (S) to the weld part (35), the measurement light (S) having a wavelength different from a wavelength of the laser light (L); a first parallel plane plate and a second parallel plane plate, changing an irradiation position of the measurement light (S) such that the irradiation position orbitally move around a center of rotation that moves on a predetermined welding path in a radius of rotation that is smaller than ½ of a spot diameter of the laser light (L); a measuring instrument (14) repeatedly measuring a weld penetration depth of the weld part (35) based on the measurement light (S) that is emitted from the laser emitting head (20) and is reflected on the weld part (35) while the measurement light (S) is being orbitally moved; and a determiner (17) deType: GrantFiled: August 4, 2020Date of Patent: June 4, 2024Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventors: Toru Sakai, Michio Sakurai, Takashi Urashima, Daichi Higashi
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Patent number: 11964339Abstract: A laser welding device includes: an irradiator configured to overlap laser light and measurement light coaxially with each other and apply the laser light and the measurement light to a weld part, a wavelength of the measurement light being different from a wavelength of the laser light; a measuring instrument configured to repeatedly measure a weld penetration depth of the weld part based on the measurement light that is emitted from the irradiator and reflected on the weld part so as to generate measured values; and a determiner configured to determine the weld penetration depth of the weld part based on (i) one or more measured values; or (ii) an average value of the one or more measured values, the one or more measured values being included within a predetermined range with reference to a greatest side measured value of the plurality of measured values.Type: GrantFiled: August 4, 2020Date of Patent: April 23, 2024Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventors: Toru Sakai, Michio Sakurai
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Patent number: 11872657Abstract: A welding system includes a welding apparatus and an appearance inspection apparatus. The appearance inspection apparatus includes: a shape measurement unit that measures the shape of a weld; an image processor that generates image data based on data of the shape; a determination unit that determines whether the shape of the weld is good or bad based on the image data and a determination model; and a feedback unit that extracts shape defect information if the result of the determination by the determination unit is negative. An output controller of the welding apparatus corrects a welding condition for a workpiece based on the shape defect information extracted by the feedback unit.Type: GrantFiled: June 21, 2021Date of Patent: January 16, 2024Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventors: Michio Sakurai, Narumi Atsuta, Toru Sakai, Masashi Yoshida
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Patent number: 11511370Abstract: A plurality of values measured are relatively compared to determine an optical axis deviation direction in which an optical axis of a measurement beam S deviates from a laser beam L. In performing laser welding in the optical axis deviation direction, an irradiation position of the measurement beam S is changed so that the irradiation position of the measurement beam S is moved to a rear side of the center of the optical axis of the laser beam L in the welding direction.Type: GrantFiled: October 9, 2020Date of Patent: November 29, 2022Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventors: Michio Sakurai, Toshiyuki Mishima, Toru Sakai, Kenta Kubota, Kensuke Urata
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Publication number: 20210308782Abstract: A welding system includes a welding apparatus and an appearance inspection apparatus. The appearance inspection apparatus includes: a shape measurement unit that measures the shape of a weld; an image processor that generates image data based on data of the shape; a determination unit that determines whether the shape of the weld is good or bad based on the image data and a determination model; and a feedback unit that extracts shape defect information if the result of the determination by the determination unit is negative. An output controller of the welding apparatus corrects a welding condition for a workpiece based on the shape defect information extracted by the feedback unit.Type: ApplicationFiled: June 21, 2021Publication date: October 7, 2021Inventors: Michio SAKURAI, Narumi ATSUTA, Toru SAKAI, Masashi YOSHIDA
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Publication number: 20210031298Abstract: A plurality of values measured are relatively compared to determine an optical axis deviation direction in which an optical axis of a measurement beam deviates from a laser beam. Then, a first parallel plate and a second parallel plate are rotated to move an irradiation position of the measurement beam so that an optical axis of the measurement beam is substantially coaxial with an optical axis of the laser beam.Type: ApplicationFiled: October 9, 2020Publication date: February 4, 2021Inventors: Toru SAKAI, Michio SAKURAI, Toshiyuki MISHIMA, Kenta KUBOTA, Kensuke URATA
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Publication number: 20210023655Abstract: Laser welding is performed while moving irradiation positions of a laser beam and a measurement beam in forward, rightward, rearward and leftward directions, and the penetration depth of a weld portion is measured during laser welding in each of the directions. Then, a direction in which a value smaller than a reference value is measured is determined to be an optical axis deviation direction, and a correction value is added to the values measured during the laser welding when the laser welding is performed in the optical axis deviation direction.Type: ApplicationFiled: October 9, 2020Publication date: January 28, 2021Inventors: Michio SAKURAI, Toru SAKAI, Kenta KUBOTA, Takashi URASHIMA, Daichi HIGASHI
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Publication number: 20210023656Abstract: A laser welding device is configured to switch an irradiation position of a measurement beam between a position of a keyhole coaxial with the optical axis of a laser beam and a position of a weld bead behind the center of an optical axis of the laser beam in a welding direction. The laser welding device determines whether there is a gap between an upper metal plate and a lower metal plate based on a measured value of a recess depth measured at the position of the weld bead.Type: ApplicationFiled: October 9, 2020Publication date: January 28, 2021Inventors: Toru SAKAI, Atsuhiro KAWAMOTO, Junji FUJIWARA, Michio SAKURAI
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Publication number: 20210023651Abstract: A plurality of values measured are relatively compared to determine an optical axis deviation direction in which an optical axis of a measurement beam S deviates from a laser beam L. In performing laser welding in the optical axis deviation direction, an irradiation position of the measurement beam S is changed so that the irradiation position of the measurement beam S is moved to a rear side of the center of the optical axis of the laser beam L in the welding direction.Type: ApplicationFiled: October 9, 2020Publication date: January 28, 2021Inventors: Michio SAKURAI, Toshiyuki MISHIMA, Toru SAKAI, Kenta KUBOTA, Kensuke URATA
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Publication number: 20200376591Abstract: A laser welding device (10) for welding a weld part (35) with laser light (L) includes: a laser emitting head (20) overlapping the laser light (L) and a measurement light (S) coaxially with each other and applying the laser light (L) and the measurement light (S) to the weld part (35), the measurement light (S) having a wavelength different from a wavelength of the laser light (L); a first parallel plane plate and a second parallel plane plate, changing an irradiation position of the measurement light (S) such that the irradiation position orbitally move around a center of rotation that moves on a predetermined welding path in a radius of rotation that is smaller than 1/2 of a spot diameter of the laser light (L); a measuring instrument (14) repeatedly measuring a weld penetration depth of the weld part (35) based on the measurement light (S) that is emitted from the laser emitting head (20) and is reflected on the weld part (35) while the measurement light (S) is being orbitally moved; and a determiner (17)Type: ApplicationFiled: August 4, 2020Publication date: December 3, 2020Inventors: TORU SAKAI, MICHIO SAKURAI, TAKASHI URASHIMA, DAICHI HIGASHI
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Publication number: 20200376592Abstract: A laser welding device (10) for welding a weld part (35) with laser light (L) includes: a laser emitting head (20) overlapping the laser light (L) and a measurement light (S) coaxially with each other and applying the laser light (L) and the measurement light (S) to the weld part (35), the measurement light (S) having a wavelength different from a wavelength of the laser light (L); a measuring instrument (14) repeatedly measuring a weld penetration depth of the weld part (35) based on the measurement light (S) that is emitted from the laser emitting head (20) and is reflected on the weld part (35), thereby generating a plurality of measured values; and a determiner (17) determining the weld penetration depth of the weld part (35) based on (i) one or more measured values, where among the plurality of measured values, or on (ii) an average value of the one or more measured values, the one or more measured values being included within a predetermined range with reference to a greatest side measured value of theType: ApplicationFiled: August 4, 2020Publication date: December 3, 2020Inventors: TORU SAKAI, MICHIO SAKURAI