Patents by Inventor Michisato Toyoda

Michisato Toyoda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210223147
    Abstract: A mixed solution in which a compound which forms a nonvolatile membrane at a gas-liquid interface through self-aggregation is dispersed in a volatile liquid, is ejected and atomized in a gas or in a vacuum to produce a droplet particle, and a nonvolatile membrane is then formed at the gas-liquid interface by aligning the compound on a surface of the droplet particle having a reduced diameter due to evaporation of the volatile liquid in the gas or in the vacuum to stabilize the droplet particle. The method produces a novel droplet particle which stably exists in a gas or in a vacuum without collapsing or without evaporation of the volatile liquid inside the droplet particle.
    Type: Application
    Filed: August 9, 2018
    Publication date: July 22, 2021
    Applicants: Kimoto Electric Co., Ltd., Osaka University
    Inventors: Takashi KIMOTO, Michisato TOYODA, Hiroshi NAKAYAMA
  • Patent number: 9373474
    Abstract: An ion source is provided with a push-out electrode, a pull-out electrode, and a pull-in electrode all for ionizing a sample and accelerating generated ions in a pulsed manner, wherein the push-out electrode and/or the pull-in electrode has a curved surface shape having a depression curved in the direction opposite to the direction of travel of the ions. As a result, a compact ion source capable of temporally and spatially focusing ions and outputting the ions, and a compact time-of-flight mass spectroscope with good detection resolution and detection sensitivity which is provided with the compact ion source can be provided.
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: June 21, 2016
    Assignees: Osaka University, MSI. Tokyo, Inc.
    Inventors: Michisato Toyoda, Jun Aoki, Shinichi Miki
  • Patent number: 9117643
    Abstract: An alkali metal introduction apparatus (1) includes: a dedicated fracture chamber (10) and a vacuum chamber (20); vacuum pumps (60a) and (60b) for evacuating the insides of the dedicated fracture chamber (10) and the vacuum chamber (20); an ampul fracturing section for causing, in the dedicated fracture chamber (10), an alkali metal encapsulated in an ampul (16) to be exposed out of the ampul (16) by deforming the ampul (16); a collision cell (40) configured to allow the ampul (16) to be introduced therein, the collision room (40) being provided inside the vacuum chamber (20); and an ampul introducing section (12) for moving the ampul (16) between an exposure position where the alkali metal encapsulated in the ampul (16) is to be exposed out of the ampul (16) thus deformed and an introduction position where the ampul (16) is to be introduced into the collision cell (40).
    Type: Grant
    Filed: January 25, 2011
    Date of Patent: August 25, 2015
    Assignee: OSAKA UNIVERSITY
    Inventors: Michisato Toyoda, Hirofumi Nagao, Shuichi Shimma, Shigeo Hayakawa
  • Patent number: 8410435
    Abstract: Provided is a small-sized mass analysis system capable of analyzing an analysis target system being under atmospheric pressure. The mass analysis system (7) has a cyclone separator (1) including a hollow shaft motor (19) for rotationally driving a turbo blade (17). Combining a mass analysis device with the cyclone separator makes it possible to remove dust and introduce into the mass analysis device a gas present in a region where the pressure in the cyclone separator is sufficiently reduced.
    Type: Grant
    Filed: June 9, 2010
    Date of Patent: April 2, 2013
    Assignees: MSI. Tokyo, Inc., Osaka University
    Inventors: Shinichi Miki, Michisato Toyoda
  • Patent number: 8358424
    Abstract: A distance measuring apparatus comprises: an edge specifying part 101 for specifying the edge of a probe 6 in a secondary portrait appearing on the surface of a work 9 and an image of the probe 6; a straight line inserting part 102 for inserting a straight line along the outer edge of the secondary portrait onto an image, and an overlap determining part 103 for determining an overlap of the edge and the straight line, wherein one or more LED lamps 7, and calculating part for calculating the distance wherein the imaging device and the probe 6 are movably held integrally for the surface of the work 9.
    Type: Grant
    Filed: April 7, 2011
    Date of Patent: January 22, 2013
    Assignees: Osaka University, MSI. Tokyo, Inc.
    Inventors: Michisato Toyoda, Toshio Tashima
  • Publication number: 20120321433
    Abstract: An alkali metal introduction apparatus (1) includes: a dedicated fracture chamber (10) and a vacuum chamber (20); vacuum pumps (60a) and (60b) for evacuating the insides of the dedicated fracture chamber (10) and the vacuum chamber (20); an ampul fracturing section for causing, in the dedicated fracture chamber (10), an alkali metal encapsulated in an ampul (16) to be exposed out of the ampul (16) by deforming the ampul (16); a collision cell (40) configured to allow the ampul (16) to be introduced therein, the collision room (40) being provided inside the vacuum chamber (20); and an ampul introducing section (12) for moving the ampul (16) between an exposure position where the alkali metal encapsulated in the ampul (16) is to be exposed out of the ampul (16) thus deformed and an introduction position where the ampul (16) is to be introduced into the collision cell (40).
    Type: Application
    Filed: January 25, 2011
    Publication date: December 20, 2012
    Applicant: Osaka University
    Inventors: Michisato Toyoda, Hirofumi Nagao, Shuichi Shimma, Shigeo Hayakawa
  • Publication number: 20120257219
    Abstract: A distance measuring apparatus comprises: an edge specifying part 101 for specifying the edge of a probe 6 in a secondary portrait appearing on the surface of a work 9 and an image of the probe 6; a straight line inserting part 102 for inserting a straight line along the outer edge of the secondary portrait onto an image, and an overlap determining part 103 for determining an overlap of the edge and the straight line, wherein one or more LED lamps 7, and calculating part for calculating the distance wherein the imaging device and the probe 6 are movably held integrally for the surface of the work 9.
    Type: Application
    Filed: April 7, 2011
    Publication date: October 11, 2012
    Applicants: MSI. TOKYO, INC., Osaka University
    Inventors: Michisato TOYODA, Toshio Tashima
  • Patent number: 8237112
    Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
    Type: Grant
    Filed: February 16, 2011
    Date of Patent: August 7, 2012
    Assignee: Jeol Ltd.
    Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
  • Publication number: 20120025072
    Abstract: An ion source is provided with a push-out electrode, a pull-out electrode, and a pull-in electrode all for ionizing a sample and accelerating generated ions in a pulsed manner, wherein the push-out electrode and/or the pull-in electrode has a curved surface shape having a depression curved in the direction opposite to the direction of travel of the ions. As a result, a compact ion source capable of temporally and spatially focusing ions and outputting the ions, and a compact time-of-flight mass spectroscope with good detection resolution and detection sensitivity which is provided with the compact ion source can be provided.
    Type: Application
    Filed: March 26, 2010
    Publication date: February 2, 2012
    Applicants: MSI. Tokyo, Inc., Osaka University
    Inventors: Michisato Toyoda, Jun Aoki, Shinichi Miki
  • Publication number: 20110133073
    Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
    Type: Application
    Filed: February 16, 2011
    Publication date: June 9, 2011
    Applicant: JEOL LTD.
    Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
  • Patent number: 7910879
    Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
    Type: Grant
    Filed: February 23, 2009
    Date of Patent: March 22, 2011
    Assignee: JEOL Ltd.
    Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
  • Patent number: 7763847
    Abstract: An ion optical system to form a loop orbit is provided to sufficiently ensure required performance such as ion transmission efficiency while making it easy to design the system by alleviating a space-focusing condition. The loop orbit of the ion optical system is realized so as to satisfy (t|x)=(t|?)=(t|?)=0 as the time-focusing condition and to satisfy ?2<(x|x)+(?|?)<2, and ?2<(y|y)+(?|?)<2 as the space-focusing condition. (x|x) and other similar terms are constants determined by the elements indicated in the parenthesis in a general expression format of the ion optical system. The conditions are substantially alleviated as opposed to the conventional space-focusing condition where each of (x|x), (?|?), (y|y) and (?|?) needs to be ±1. Thus, the parameters to decide the shape of electrodes by which the ion optical system is configured have higher degree of freedom.
    Type: Grant
    Filed: July 20, 2007
    Date of Patent: July 27, 2010
    Assignees: Shimadzu Corporation, Osaka University
    Inventors: Masaru Nishiguchi, Shinichi Yamaguchi, Michisato Toyoda
  • Publication number: 20090212208
    Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
    Type: Application
    Filed: February 23, 2009
    Publication date: August 27, 2009
    Applicant: JEOL LTD.
    Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
  • Patent number: 7504620
    Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
    Type: Grant
    Filed: May 17, 2005
    Date of Patent: March 17, 2009
    Assignee: Jeol Ltd
    Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
  • Patent number: 7501620
    Abstract: The present invention provides a laser irradiation mass spectrometer capable of analyzing components of living tissue or living cells with high accuracy. It includes a laser unit for irradiating a sample with a beam of laser light and controlling the irradiation spot of the laser beam on the sample; and a mass analyzer for performing a mass analysis of the ions generated at the irradiation spot, where the mass analyzer uses a frequency-driven ion trap and a time-of-flight mass spectrometer to carry out the mass analysis. The ion trap of this system assuredly traps ions having large mass to charge ratios, and enables the system to carry out analyses on samples of large molecules. Preferably, a digital driving method is used to drive the aforementioned frequency-driven ion trap. Also, a multi-turn time-of-flight mass spectrometer may preferably be used as the aforementioned time-of-flight mass spectrometer.
    Type: Grant
    Filed: February 27, 2006
    Date of Patent: March 10, 2009
    Assignees: Shimadzu Corporation, Inter-University Research, Institute Corporation National Institutes of Natural Sciences, Osaka University
    Inventors: Kiyoshi Ogawa, Yoshikazu Yoshida, Kozo Shimazu, Mitsutoshi Setou, Shuichi Shimma, Michisato Toyoda
  • Publication number: 20080197276
    Abstract: An ion optical system to form a loop orbit is provided to sufficiently ensure required performance such as ion transmission efficiency while making it easy to design the system by alleviating a space-focusing condition. The loop orbit of the ion optical system is realized so as to satisfy (t|x)=(t|?)=(t|?)=0 as the time-focusing condition and to satisfy ?2<(x|x)+(?|?)<2, and ?2<(y|y)+(?|?)<2 as the space-focusing condition. (x|x) and other similar terms are constants determined by the elements indicated in the parenthesis in a general expression format of the ion optical system. The conditions are substantially alleviated as opposed to the conventional space-focusing condition where each of (x|x), (?|?), (y|y) and (?|?) needs to be ±1. Thus, the parameters to decide the shape of electrodes by which the ion optical system is configured have higher degree of freedom.
    Type: Application
    Filed: July 20, 2007
    Publication date: August 21, 2008
    Applicants: Shimadzu Corporation, Osaka University
    Inventors: Masaru Nishiguchi, Shinichi Yamaguchi, Michisato Toyoda
  • Publication number: 20070194223
    Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
    Type: Application
    Filed: May 17, 2005
    Publication date: August 23, 2007
    Applicant: JEOL, LTD
    Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
  • Patent number: 7227131
    Abstract: A time of flight type mass spectrometer (TOF-MS) of the present invention includes: a flight space containing a loop orbit on which ions fly once or more than once; a flight controller for making ions of a same mass to charge ratio fly the loop orbit at several values of number of turns; a flight time measurer for measuring a length of flight time of the ions; and a processor for determining the mass to charge ratio of the ions based on a relationship between the value of number of turns and the length of flight time of the ions. The speed of ions flying a loop orbit depends on their mass to charge ratios. For ions of the same mass to charge ratio, the difference between the lengths of flight time of the ions flying the loop orbit N turns and of the ions flying the loop orbit N+1 turns depends on the speed of the ions, so that the difference depends on the mass to charge ratio of the ions.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: June 5, 2007
    Assignees: Shimadzu Corporation, Osaka University
    Inventors: Shinichi Yamaguchi, Morio Ishihara, Michisato Toyoda, Daisuke Okumura
  • Patent number: 7211792
    Abstract: In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly.
    Type: Grant
    Filed: January 11, 2005
    Date of Patent: May 1, 2007
    Assignee: Shimadzu Corporation
    Inventors: Shinichi Yamaguchi, Morio Ishihara, Michisato Toyoda, Daisuke Okumura
  • Publication number: 20070045527
    Abstract: The present invention provides a laser irradiation mass spectrometer capable of analyzing components of living tissue or living cells with high accuracy. It includes a laser unit for irradiating a sample with a beam of laser light and controlling the irradiation spot of the laser beam on the sample; and a mass analyzer for performing a mass analysis of the ions generated at the irradiation spot, where the mass analyzer uses a frequency-driven ion trap and a time-of-flight mass spectrometer to carry out the mass analysis. The ion trap of this system assuredly traps ions having large mass to charge ratios, and enables the system to carry out analyses on samples of large molecules. Preferably, a digital driving method is used to drive the aforementioned frequency-driven ion trap. Also, a multi-turn time-of-flight mass spectrometer may preferably be used as the aforementioned time-of-flight mass spectrometer.
    Type: Application
    Filed: February 27, 2006
    Publication date: March 1, 2007
    Applicants: SHIMADZU CORPORATION, Inter-University Research Institute Corporation National Institutes of Natural Sciences, Osaka University
    Inventors: Kiyoshi Ogawa, Yoshikazu Yoshida, Kozo Shimazu, Mitsutoshi Setou, Shuichi Shimma, Michisato Toyoda