Patents by Inventor Michisato Toyoda
Michisato Toyoda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240310327Abstract: Provided is a technique to carry out mass spectrometry of a wide variety of subject compounds to be analyzed, each of which is extracted in a supercritical fluid. A mass spectrometer (1) includes: a supercritical fluid introduction section (3) for introducing and releasing, to vacuum, a supercritical fluid in which a subject compound for mass spectrometry is contained (extracted); an ionization section (4) that ionizes the subject compound which is extracted in the supercritical fluid, the ionization being carried out in the vacuum by a molecular reaction involving proton transfer; and a mass measurement section (5) that measures a mass of the subject compound which has been ionized.Type: ApplicationFiled: February 4, 2022Publication date: September 19, 2024Inventors: Michisato TOYODA, Toshinobu HONDO, Hiroshi NAKAYAMA
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Patent number: 12025544Abstract: A mixed solution in which a compound which forms a nonvolatile membrane at a gas-liquid interface through self-aggregation is dispersed in a volatile liquid, is ejected and atomized in a gas or in a vacuum to produce a droplet particle, and a nonvolatile membrane is then formed at the gas-liquid interface by aligning the compound on a surface of the droplet particle having a reduced diameter due to evaporation of the volatile liquid in the gas or in the vacuum to stabilize the droplet particle. The method produces a novel droplet particle which stably exists in a gas or in a vacuum without collapsing or without evaporation of the volatile liquid inside the droplet particle.Type: GrantFiled: August 9, 2018Date of Patent: July 2, 2024Assignees: Osaka University, Kimoto Electric Co., Ltd.Inventors: Takashi Kimoto, Michisato Toyoda, Hiroshi Nakayama
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Publication number: 20210223147Abstract: A mixed solution in which a compound which forms a nonvolatile membrane at a gas-liquid interface through self-aggregation is dispersed in a volatile liquid, is ejected and atomized in a gas or in a vacuum to produce a droplet particle, and a nonvolatile membrane is then formed at the gas-liquid interface by aligning the compound on a surface of the droplet particle having a reduced diameter due to evaporation of the volatile liquid in the gas or in the vacuum to stabilize the droplet particle. The method produces a novel droplet particle which stably exists in a gas or in a vacuum without collapsing or without evaporation of the volatile liquid inside the droplet particle.Type: ApplicationFiled: August 9, 2018Publication date: July 22, 2021Applicants: Kimoto Electric Co., Ltd., Osaka UniversityInventors: Takashi KIMOTO, Michisato TOYODA, Hiroshi NAKAYAMA
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Patent number: 9373474Abstract: An ion source is provided with a push-out electrode, a pull-out electrode, and a pull-in electrode all for ionizing a sample and accelerating generated ions in a pulsed manner, wherein the push-out electrode and/or the pull-in electrode has a curved surface shape having a depression curved in the direction opposite to the direction of travel of the ions. As a result, a compact ion source capable of temporally and spatially focusing ions and outputting the ions, and a compact time-of-flight mass spectroscope with good detection resolution and detection sensitivity which is provided with the compact ion source can be provided.Type: GrantFiled: March 26, 2010Date of Patent: June 21, 2016Assignees: Osaka University, MSI. Tokyo, Inc.Inventors: Michisato Toyoda, Jun Aoki, Shinichi Miki
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Patent number: 9117643Abstract: An alkali metal introduction apparatus (1) includes: a dedicated fracture chamber (10) and a vacuum chamber (20); vacuum pumps (60a) and (60b) for evacuating the insides of the dedicated fracture chamber (10) and the vacuum chamber (20); an ampul fracturing section for causing, in the dedicated fracture chamber (10), an alkali metal encapsulated in an ampul (16) to be exposed out of the ampul (16) by deforming the ampul (16); a collision cell (40) configured to allow the ampul (16) to be introduced therein, the collision room (40) being provided inside the vacuum chamber (20); and an ampul introducing section (12) for moving the ampul (16) between an exposure position where the alkali metal encapsulated in the ampul (16) is to be exposed out of the ampul (16) thus deformed and an introduction position where the ampul (16) is to be introduced into the collision cell (40).Type: GrantFiled: January 25, 2011Date of Patent: August 25, 2015Assignee: OSAKA UNIVERSITYInventors: Michisato Toyoda, Hirofumi Nagao, Shuichi Shimma, Shigeo Hayakawa
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Patent number: 8410435Abstract: Provided is a small-sized mass analysis system capable of analyzing an analysis target system being under atmospheric pressure. The mass analysis system (7) has a cyclone separator (1) including a hollow shaft motor (19) for rotationally driving a turbo blade (17). Combining a mass analysis device with the cyclone separator makes it possible to remove dust and introduce into the mass analysis device a gas present in a region where the pressure in the cyclone separator is sufficiently reduced.Type: GrantFiled: June 9, 2010Date of Patent: April 2, 2013Assignees: MSI. Tokyo, Inc., Osaka UniversityInventors: Shinichi Miki, Michisato Toyoda
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Patent number: 8358424Abstract: A distance measuring apparatus comprises: an edge specifying part 101 for specifying the edge of a probe 6 in a secondary portrait appearing on the surface of a work 9 and an image of the probe 6; a straight line inserting part 102 for inserting a straight line along the outer edge of the secondary portrait onto an image, and an overlap determining part 103 for determining an overlap of the edge and the straight line, wherein one or more LED lamps 7, and calculating part for calculating the distance wherein the imaging device and the probe 6 are movably held integrally for the surface of the work 9.Type: GrantFiled: April 7, 2011Date of Patent: January 22, 2013Assignees: Osaka University, MSI. Tokyo, Inc.Inventors: Michisato Toyoda, Toshio Tashima
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Publication number: 20120321433Abstract: An alkali metal introduction apparatus (1) includes: a dedicated fracture chamber (10) and a vacuum chamber (20); vacuum pumps (60a) and (60b) for evacuating the insides of the dedicated fracture chamber (10) and the vacuum chamber (20); an ampul fracturing section for causing, in the dedicated fracture chamber (10), an alkali metal encapsulated in an ampul (16) to be exposed out of the ampul (16) by deforming the ampul (16); a collision cell (40) configured to allow the ampul (16) to be introduced therein, the collision room (40) being provided inside the vacuum chamber (20); and an ampul introducing section (12) for moving the ampul (16) between an exposure position where the alkali metal encapsulated in the ampul (16) is to be exposed out of the ampul (16) thus deformed and an introduction position where the ampul (16) is to be introduced into the collision cell (40).Type: ApplicationFiled: January 25, 2011Publication date: December 20, 2012Applicant: Osaka UniversityInventors: Michisato Toyoda, Hirofumi Nagao, Shuichi Shimma, Shigeo Hayakawa
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Publication number: 20120257219Abstract: A distance measuring apparatus comprises: an edge specifying part 101 for specifying the edge of a probe 6 in a secondary portrait appearing on the surface of a work 9 and an image of the probe 6; a straight line inserting part 102 for inserting a straight line along the outer edge of the secondary portrait onto an image, and an overlap determining part 103 for determining an overlap of the edge and the straight line, wherein one or more LED lamps 7, and calculating part for calculating the distance wherein the imaging device and the probe 6 are movably held integrally for the surface of the work 9.Type: ApplicationFiled: April 7, 2011Publication date: October 11, 2012Applicants: MSI. TOKYO, INC., Osaka UniversityInventors: Michisato TOYODA, Toshio Tashima
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Patent number: 8237112Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.Type: GrantFiled: February 16, 2011Date of Patent: August 7, 2012Assignee: Jeol Ltd.Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
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Publication number: 20120025072Abstract: An ion source is provided with a push-out electrode, a pull-out electrode, and a pull-in electrode all for ionizing a sample and accelerating generated ions in a pulsed manner, wherein the push-out electrode and/or the pull-in electrode has a curved surface shape having a depression curved in the direction opposite to the direction of travel of the ions. As a result, a compact ion source capable of temporally and spatially focusing ions and outputting the ions, and a compact time-of-flight mass spectroscope with good detection resolution and detection sensitivity which is provided with the compact ion source can be provided.Type: ApplicationFiled: March 26, 2010Publication date: February 2, 2012Applicants: MSI. Tokyo, Inc., Osaka UniversityInventors: Michisato Toyoda, Jun Aoki, Shinichi Miki
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Publication number: 20110133073Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.Type: ApplicationFiled: February 16, 2011Publication date: June 9, 2011Applicant: JEOL LTD.Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
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Patent number: 7910879Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.Type: GrantFiled: February 23, 2009Date of Patent: March 22, 2011Assignee: JEOL Ltd.Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
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Patent number: 7763847Abstract: An ion optical system to form a loop orbit is provided to sufficiently ensure required performance such as ion transmission efficiency while making it easy to design the system by alleviating a space-focusing condition. The loop orbit of the ion optical system is realized so as to satisfy (t|x)=(t|?)=(t|?)=0 as the time-focusing condition and to satisfy ?2<(x|x)+(?|?)<2, and ?2<(y|y)+(?|?)<2 as the space-focusing condition. (x|x) and other similar terms are constants determined by the elements indicated in the parenthesis in a general expression format of the ion optical system. The conditions are substantially alleviated as opposed to the conventional space-focusing condition where each of (x|x), (?|?), (y|y) and (?|?) needs to be ±1. Thus, the parameters to decide the shape of electrodes by which the ion optical system is configured have higher degree of freedom.Type: GrantFiled: July 20, 2007Date of Patent: July 27, 2010Assignees: Shimadzu Corporation, Osaka UniversityInventors: Masaru Nishiguchi, Shinichi Yamaguchi, Michisato Toyoda
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Publication number: 20090212208Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.Type: ApplicationFiled: February 23, 2009Publication date: August 27, 2009Applicant: JEOL LTD.Inventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
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Patent number: 7504620Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.Type: GrantFiled: May 17, 2005Date of Patent: March 17, 2009Assignee: Jeol LtdInventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
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Patent number: 7501620Abstract: The present invention provides a laser irradiation mass spectrometer capable of analyzing components of living tissue or living cells with high accuracy. It includes a laser unit for irradiating a sample with a beam of laser light and controlling the irradiation spot of the laser beam on the sample; and a mass analyzer for performing a mass analysis of the ions generated at the irradiation spot, where the mass analyzer uses a frequency-driven ion trap and a time-of-flight mass spectrometer to carry out the mass analysis. The ion trap of this system assuredly traps ions having large mass to charge ratios, and enables the system to carry out analyses on samples of large molecules. Preferably, a digital driving method is used to drive the aforementioned frequency-driven ion trap. Also, a multi-turn time-of-flight mass spectrometer may preferably be used as the aforementioned time-of-flight mass spectrometer.Type: GrantFiled: February 27, 2006Date of Patent: March 10, 2009Assignees: Shimadzu Corporation, Inter-University Research, Institute Corporation National Institutes of Natural Sciences, Osaka UniversityInventors: Kiyoshi Ogawa, Yoshikazu Yoshida, Kozo Shimazu, Mitsutoshi Setou, Shuichi Shimma, Michisato Toyoda
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Publication number: 20080197276Abstract: An ion optical system to form a loop orbit is provided to sufficiently ensure required performance such as ion transmission efficiency while making it easy to design the system by alleviating a space-focusing condition. The loop orbit of the ion optical system is realized so as to satisfy (t|x)=(t|?)=(t|?)=0 as the time-focusing condition and to satisfy ?2<(x|x)+(?|?)<2, and ?2<(y|y)+(?|?)<2 as the space-focusing condition. (x|x) and other similar terms are constants determined by the elements indicated in the parenthesis in a general expression format of the ion optical system. The conditions are substantially alleviated as opposed to the conventional space-focusing condition where each of (x|x), (?|?), (y|y) and (?|?) needs to be ±1. Thus, the parameters to decide the shape of electrodes by which the ion optical system is configured have higher degree of freedom.Type: ApplicationFiled: July 20, 2007Publication date: August 21, 2008Applicants: Shimadzu Corporation, Osaka UniversityInventors: Masaru Nishiguchi, Shinichi Yamaguchi, Michisato Toyoda
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Publication number: 20070194223Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.Type: ApplicationFiled: May 17, 2005Publication date: August 23, 2007Applicant: JEOL, LTDInventors: Takaya Sato, Michisato Toyoda, Morio Ishihara
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Patent number: 7227131Abstract: A time of flight type mass spectrometer (TOF-MS) of the present invention includes: a flight space containing a loop orbit on which ions fly once or more than once; a flight controller for making ions of a same mass to charge ratio fly the loop orbit at several values of number of turns; a flight time measurer for measuring a length of flight time of the ions; and a processor for determining the mass to charge ratio of the ions based on a relationship between the value of number of turns and the length of flight time of the ions. The speed of ions flying a loop orbit depends on their mass to charge ratios. For ions of the same mass to charge ratio, the difference between the lengths of flight time of the ions flying the loop orbit N turns and of the ions flying the loop orbit N+1 turns depends on the speed of the ions, so that the difference depends on the mass to charge ratio of the ions.Type: GrantFiled: August 31, 2004Date of Patent: June 5, 2007Assignees: Shimadzu Corporation, Osaka UniversityInventors: Shinichi Yamaguchi, Morio Ishihara, Michisato Toyoda, Daisuke Okumura