Patents by Inventor Michiyasu HIROTA

Michiyasu HIROTA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12073549
    Abstract: A stress analysis device includes: an imaging element that obtains temperature images over a same time range for a same region of an object; a feature point extractor that extracts a feature point in each of the temperature images; a projection transformer that performs projective transformation on each of the temperature images to align the feature point in the temperature images, and aligns the temperature images with respect to a temperature image being a reference; a pixel rearranger that rearranges a pixel array of each of the temperature images subjected to the projective transformation with respect to a pixel array of the temperature image that is the reference; a stress converter that obtains a stress image by multiplying each of the temperature images after pixel rearrangement by a stress conversion coefficient; and an additional averaging part that obtains an additional averaging stress image by adding and averaging the stress images.
    Type: Grant
    Filed: February 24, 2022
    Date of Patent: August 27, 2024
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Yousuke Irie, Hirotsugu Inoue, Michiyasu Hirota
  • Publication number: 20220339783
    Abstract: A force detection apparatus includes first and second force sensors each including a force detection device having a force detection axis, a first inertial sensor disposed in the vicinity of the first force sensor and having an inertia detection axis extending along the force detection axis of the first force sensor, and a second inertial sensor disposed in the vicinity of the second force sensor and having an inertia detection axis extending along the force detection axis of the second force sensor.
    Type: Application
    Filed: April 19, 2022
    Publication date: October 27, 2022
    Inventors: Hiroki KAWAI, Takayuki KIKUCHI, Michiyasu HIROTA
  • Publication number: 20220180502
    Abstract: A stress analysis device includes: an imaging element that obtains temperature images over a same time range for a same region of an object; a feature point extractor that extracts a feature point in each of the temperature images; a projection transformer that performs projective transformation on each of the temperature images to align the feature point in the temperature images, and aligns the temperature images with respect to a temperature image being a reference; a pixel rearranger that rearranges a pixel array of each of the temperature images subjected to the projective transformation with respect to a pixel array of the temperature image that is the reference; a stress converter that obtains a stress image by multiplying each of the temperature images after pixel rearrangement by a stress conversion coefficient; and an additional averaging part that obtains an additional averaging stress image by adding and averaging the stress images.
    Type: Application
    Filed: February 24, 2022
    Publication date: June 9, 2022
    Inventors: Yousuke IRIE, Hirotsugu INOUE, Michiyasu HIROTA