Patents by Inventor Mieko Asada

Mieko Asada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11406982
    Abstract: A reagent kit in which a brief measurement result is readily associated with subject information by suppressing erroneous input without using an integrated management system. This reagent kit 100 includes a container 10 used for measuring a sample by the sample measuring apparatus 300, a first identification label 30 including first identification information 31 associated with the measurement result 51 of the sample, and a second identification label 40 including second identification information 41 associated with the first identification information 31.
    Type: Grant
    Filed: November 29, 2018
    Date of Patent: August 9, 2022
    Assignee: SYSMEX CORPORATION
    Inventors: Koji Ikeda, Hiroyuki Fujino, Mieko Asada
  • Publication number: 20190160467
    Abstract: A reagent kit in which a brief measurement result is readily associated with subject information by suppressing erroneous input without using an integrated management system. This reagent kit 100 includes a container 10 used for measuring a sample by the sample measuring apparatus 300, a first identification label 30 including first identification information 31 associated with the measurement result 51 of the sample, and a second identification label 40 including second identification information 41 associated with the first identification information 31.
    Type: Application
    Filed: November 29, 2018
    Publication date: May 30, 2019
    Inventors: Koji IKEDA, Hiroyuki FUJINO, Mieko ASADA
  • Publication number: 20150276705
    Abstract: A specimen analysis system includes a first information processing unit and a second information processing unit. Each unit includes a storage unit storing programs executing the information processing, and attribute information indicating attributes of the programs, and a processing unit that performs the information processing by executing the programs stored in the storage unit. The processing unit of a first apparatus acquires attribute information of programs stored in a second apparatus, extracts programs for processing from the first analytical apparatus, from programs stored in the second apparatus based on attribute information from the second apparatus. When a first specimen analysis even occurs, the first apparatus transmits a process request to the second apparatus, which stores a program selected from the extracted programs.
    Type: Application
    Filed: March 26, 2015
    Publication date: October 1, 2015
    Inventors: Naoya MAEDA, Hiroyuki FUJINO, Mieko ASADA
  • Patent number: 8163564
    Abstract: A computer for receiving first and second sample attribute information regarding attributes of a sample, for determining parameter identification information for identifying a smear control parameter on the basis of the first sample attribute information, for generating first and second instruction to make a smear preparing apparatus prepare a smear of a sample, the first instruction including the parameter identification information, and the second instruction including the second sample attribute information, for transmitting the first and second instruction to the smear preparing apparatus is disclosed.
    Type: Grant
    Filed: September 8, 2005
    Date of Patent: April 24, 2012
    Assignee: Sysmex Corporation
    Inventors: Toshio Watanabe, Mieko Asada
  • Publication number: 20060051240
    Abstract: A computer for receiving first and second sample attribute information regarding attributes of a sample, for determining parameter identification information for identifying a smear control parameter on the basis of the first sample attribute information, for generating first and second instruction to make a smear preparing apparatus prepare a smear of a sample, the first instruction including the parameter identification information, and the second instruction including the second sample attribute information, for transmitting the first and second instruction to the smear preparing apparatus is disclosed.
    Type: Application
    Filed: September 8, 2005
    Publication date: March 9, 2006
    Inventors: Toshio Watanabe, Mieko Asada