Patents by Inventor Mihir SUCHAK

Mihir SUCHAK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sensing and detection of ESD and other transient overstress events
    Patent number: 10164426
    Abstract: An integrated circuit includes an I/O pad and a protection device coupled to the I/O pad and a first supply node. A transient event detector includes a latch; a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to a first supply node, and a second current electrode coupled to a data input of the latch, wherein the latch is configured to store an indication that a transient event occurred. An event level sensor includes a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to the protection device, and a second current electrode coupled to a load circuit; a rectifier device coupled between the second current electrode and a capacitor; a second transistor having a control electrode coupled to the capacitor; and an output circuit configured to place a current on a first sense bus proportional to a current through the load circuit.
    Type: Grant
    Filed: May 27, 2016
    Date of Patent: December 25, 2018
    Assignee: NXP USA, Inc.
    Inventors: Michael A. Stockinger, Gregory C. Edgington, James R. Feddeler, Xiang Li, Richard W. Moseley, Mihir Suchak
  • SENSING AND DETECTION OF ESD AND OTHER TRANSIENT OVERSTRESS EVENTS
    Publication number: 20170346280
    Abstract: An integrated circuit includes an I/O pad and a protection device coupled to the I/O pad and a first supply node. A transient event detector includes a latch; a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to a first supply node, and a second current electrode coupled to a data input of the latch, wherein the latch is configured to store an indication that a transient event occurred. An event level sensor includes a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to the protection device, and a second current electrode coupled to a load circuit; a rectifier device coupled between the second current electrode and a capacitor; a second transistor having a control electrode coupled to the capacitor; and an output circuit configured to place a current on a first sense bus proportional to a current through the load circuit.
    Type: Application
    Filed: May 27, 2016
    Publication date: November 30, 2017
    Inventors: Michael A. STOCKINGER, Gregory C. EDGINGTON, James R. FEDDELER, Xiang LI, Richard W. MOSELEY, Mihir SUCHAK