Patents by Inventor Mika Hietala

Mika Hietala has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8333111
    Abstract: A method for determining a sample flow volume is disclosed herein. The method includes withdrawing the sample flow at a first and second flow rate from a gas flow, measuring a concentration of at least one gas component and measuring at least one of an airway pressure and flow. The method also includes generating first measurement results based on the concentration, generating second measurement results based on the at least one of the airway pressure and flow and setting a suitable point of comparison. The method further includes determining a first and second time delay between the point of comparison of the first and second measurement results of the first and second flow rate, providing information about the first and second sample flow rate and determining the sample volume based on differences between the first and second time delay. A corresponding arrangement is also provided.
    Type: Grant
    Filed: August 18, 2010
    Date of Patent: December 18, 2012
    Assignee: General Electric Company
    Inventor: Mika Hietala
  • Publication number: 20110067480
    Abstract: A method for determining a sample flow volume is disclosed herein. The method includes withdrawing the sample flow at a first and second flow rate from a gas flow, measuring a concentration of at least one gas component and measuring at least one of an airway pressure and flow. The method also includes generating first measurement results based on the concentration, generating second measurement results based on the at least one of the airway pressure and flow and setting a suitable point of comparison. The method further includes determining a first and second time delay between the point of comparison of the first and second measurement results of the first and second flow rate, providing information about the first and second sample flow rate and determining the sample volume based on differences between the first and second time delay. A corresponding arrangement is also provided.
    Type: Application
    Filed: August 18, 2010
    Publication date: March 24, 2011
    Inventor: Mika HIETALA
  • Patent number: 7435225
    Abstract: Method and arrangement for measuring breath gases of a patient in which the patient is connected to a breath gas unit by using a sampling line to enable flowing a sample of the breathing gases with a pre-determined sample flow rate to the breath gas measuring unit. The sample flow rate is adjusted in case it is not within limits set by the patient's breathing rate.
    Type: Grant
    Filed: November 22, 2006
    Date of Patent: October 14, 2008
    Assignee: General Electric Company
    Inventor: Mika Hietala
  • Publication number: 20080119754
    Abstract: Method and arrangement for measuring breath gases of a patient in which the patient is connected to a breath gas unit by using a sampling line to enable flowing a sample of the breathing gases with a pre-determined sample flow rate to the breath gas measuring unit. The sample flow rate is adjusted in case it is not within limits set by the patient's breathing rate.
    Type: Application
    Filed: November 22, 2006
    Publication date: May 22, 2008
    Inventor: Mika Hietala
  • Patent number: 7069768
    Abstract: The invention concerns a gas analyzer comprising: a measuring volume (2), a radiation source (1) for providing a beam to pass said measuring volume; a heat sink (16) for said radiation source; at least one thermal detector (3) having a hot junction within a support structure and receiving the radiation and a cold junction for reference within the same support structure and protected from said radiation; at least one optical bandpass filter (9) between said hot junction and said radiation source; and a thermal mass (11), which is formed of a material having high thermal conductance. The thermal mass has a cavity with a bottom step (34) and a rim (32), and a first length therebetween. The support structure has a frontal edge (35) and a base plate lip (33), and a second length therebetween. There is a radial gap between the thermal mass and the support structure.
    Type: Grant
    Filed: June 8, 2004
    Date of Patent: July 4, 2006
    Assignee: Instrumentarium Corp.
    Inventors: Kurt Weckström, Heikki Haveri, Mika Hietala
  • Publication number: 20050268690
    Abstract: The invention concerns a gas analyzer comprising: a measuring volume (2), a radiation source (1) for providing a beam to pass said measuring volume; a heat sink (16) for said radiation source; at least one thermal detector (3) having a hot junction within a support structure and receiving the radiation and a cold junction for reference within the same support structure and protected from said radiation; at least one optical bandpass filter (9) between said hot junction and said radiation source; and a thermal mass (11), which is formed of a material having high thermal conductance. The thermal mass has a cavity with a bottom step (34) and a rim (32), and a first length therebetween. The support structure has a frontal edge (35) and a base plate lip (33), and a second length therebetween. There is a radial gap between the thermal mass and the support structure.
    Type: Application
    Filed: June 8, 2004
    Publication date: December 8, 2005
    Inventors: Kurt Weckstrom, Heikki Haveri, Mika Hietala
  • Patent number: 6694800
    Abstract: The invention relates to a gas analyzer comprising a measuring volume (6) for a sample gas mixture (G), a radiation source (1) for providing a beam (20) of electromagnetic radiation to pass said measuring volume, a heat sink (4) for said radiation source, at least one thermopile detector (9), at least one optical bandpass filter (10), electrical contact pins (12) for signal(s) in the housing of said detector, a thermal mass formed of a material having high thermal conductance. Said thermal mass has a cavity (21) and an outer surface (22), surrounding at least said detector housing in the cavity, being in contact with said detector housing, and extending towards the radiation source. There is a thermal barrier between the heat sink (4) and the thermal mass (8, 16). The gas analyzer further comprises electrical wires (15), which are composed of materials and having dimensions producing an overall thermal conductance substantially lower than that of said electrical contact pins.
    Type: Grant
    Filed: March 20, 2003
    Date of Patent: February 24, 2004
    Assignee: Instrumentarium Corp.
    Inventors: Kurt Weckstrom, Mika Hietala
  • Publication number: 20030177814
    Abstract: The invention relates to a gas analyzer comprising a measuring volume (6) for a sample gas mixture (G), a radiation source (1) for providing a beam (20) of electromagnetic radiation to pass said measuring volume, a heat sink (4) for said radiation source, at least one thermopile detector (9), at least one optical bandpass filter (10), electrical contact pins (12) for signal(s) in the housing of said detector, a thermal mass formed of a material having high thermal conductance. Said thermal mass has a cavity (21) and an outer surface (22), surrounding at least said detector housing in the cavity, being in contact with said detector housing, and extending towards the radiation source. There is a thermal barrier between the heat sink (4) and the thermal mass (8, 16). The gas analyzer further comprises electrical wires (15), which are composed of materials and having dimensions producing an overall thermal conductance substantially lower than that of said electrical contact pins.
    Type: Application
    Filed: March 20, 2003
    Publication date: September 25, 2003
    Inventors: Kurt Weckstrom, Mika Hietala
  • Patent number: D865953
    Type: Grant
    Filed: March 16, 2018
    Date of Patent: November 5, 2019
    Assignee: General Electric Company
    Inventors: Mika Hietala, Timo Holopainen
  • Patent number: D867913
    Type: Grant
    Filed: March 16, 2018
    Date of Patent: November 26, 2019
    Assignee: General Electric Company
    Inventors: Mika Hietala, Timo Holopainen
  • Patent number: D950052
    Type: Grant
    Filed: October 11, 2019
    Date of Patent: April 26, 2022
    Assignee: General Electric Company
    Inventors: Mika Hietala, Timo Holopainen