Abstract: An arrangement for conveying an electronic device in a testing system includes a conveyer arrangement, which transfers electronic devices to and from a plate, which moves with respect to the conveyer arrangement and carries the electronic devices to and from a testing chamber within a testing cabinet, and a buffer structure adjacent to the testing chamber and including a plurality of compartments. The conveyer arrangement conveys each of the electronic devices, which failed in a test performed in the testing chamber, to an empty compartment of the buffer structure.

Abstract: An arrangement for conveying an electronic device includes a conveyor arrangement, a plate configured to move with respect to the conveyor arrangement and to carry an electronic device to a predetermined area, a stopper coupled with the plate, and an elevator configured to shift the conveyor arrangement into first, second and third positions. The first position being for conveying an electronic device on the conveyor arrangement such that the conveying of the electronic device stops at the stopper, the second position being for carrying the electronic device on the plate to the predetermined area and back from the predetermined area, and the third position being for conveying the electronic device on the conveyor arrangement over the stopper.

Abstract: An arrangement for conveying an electronic device includes a conveyor arrangement, a plate configured to move with respect to the conveyor arrangement and to carry an electronic device to a predetermined area, a stopper coupled with the plate, and an elevator configured to shift the conveyor arrangement into first, second and third positions. The first position being for conveying an electronic device on the conveyor arrangement such that the conveying of the electronic device stops at the stopper, the second position being for carrying the electronic device on the plate to the predetermined area and back from the predetermined area, and the third position being for conveying the electronic device on the conveyor arrangement over the stopper.

Abstract: An arrangement for conveying an electronic device in a testing system includes a conveyor arrangement, a plate having at least one opening for the conveyor arrangement, and an elevator configured to elevate the conveyor arrangement through the at least one opening of the plate. The conveyor arrangement is configured to receive and convey the electronic device when the conveyor arrangement extends through the at least one opening. The elevator is further configured to lower the conveyor arrangement through the at least one opening of the plate. The plate is configured to receive the electronic device from the conveyor arrangement in response to lowering the conveyor arrangement through the at least one opening. The plate is further configured to move with respect to the conveyor arrangement, and to carry the electronic device to a testing area of the testing system.

Abstract: An arrangement for conveying an electronic device in a testing system includes a conveyor arrangement, a plate having at least one opening for the conveyor arrangement, and an elevator configured to elevate the conveyor arrangement through the at least one opening of the plate. The conveyor arrangement is configured to receive and convey the electronic device when the conveyor arrangement extends through the at least one opening. The elevator is further configured to lower the conveyor arrangement through the at least one opening of the plate. The plate is configured to receive the electronic device from the conveyor arrangement in response to lowering the conveyor arrangement through the at least one opening. The plate is further configured to move with respect to the conveyor arrangement, and to carry the electronic device to a testing area of the testing system.