Patents by Inventor Mike Herberich

Mike Herberich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8913247
    Abstract: A device for interferometric vibration measurement, having a radiation source for generating an original beam, a first beam splitter for dividing it into measuring and reference beams, a detector and a focusing device. The measuring beam at least partly reflected by the object and the reference beam are superimposed on a detection area of the detector, and the focusing device in the beam path of the measuring beam between the image unit and object focuses it onto a measuring point. Here, a measuring beam having a wavelength greater than 1100 nm is generated and the device has an image unit for two-dimensional imaging of the object surrounding the measuring point. The measuring beam focus lies in the focal plane of the image unit and, by use of the focusing device, the focal point of the measuring beam and the focal plane of the imaging unit are displaceable simultaneously.
    Type: Grant
    Filed: October 19, 2010
    Date of Patent: December 16, 2014
    Assignee: Polytec GmbH
    Inventors: Christian Rembe, Alexander Dräbenstedt, Michael Gartner, Mike Herberich, Andreas Leonhardt
  • Publication number: 20110090508
    Abstract: A device for interferometric vibration measurement on an object (8), having a radiation source (1) for generating an original beam, a first beam splitter for dividing the original beam into a measuring beam and a reference beam (4, 5), a detector (10) and a focusing device (9). The device is implemented in such a way that the measuring beam at least partly reflected by the object and the reference beam are superimposed on a detection area of the detector, and the focusing device is arranged in the beam path of the measuring beam for focusing the measuring beam onto a measuring point (7) on the object. It is important that, by using the device, a measuring beam having a wavelength greater than 1100 nm can be generated and that the device additionally has an image unit (12) for two-dimensional imaging of at least a sub-region of the object surrounding the measuring point.
    Type: Application
    Filed: October 19, 2010
    Publication date: April 21, 2011
    Applicant: POLYTEC GMBH
    Inventors: Christian Rembe, Alexander Drabenstedt, Michael Gartner, Mike Herberich, Andreas Leonhardt