Abstract: Logic elements (LE) that can provide a number of features. For example, the LE can provide efficient and flexible use of look up tables (LUTs) and input sharing. The LE may also provide for flexible use of one or more dedicated adders and include register functionality to provide various modes of operation that enable the various features of the LE.

Abstract: Disclosed is a logic element (LE) that can provide a number of advantageous features. For example, the LE can provide efficient and flexible use of LUTs and input sharing. The LE may also provide for flexible use of one or more dedicated adders and include register functionality.

Abstract: Disclosed is a logic element (LE) that can provide a number of advantageous features. For example, the LE can provide efficient and flexible use of LUTs and input sharing. The LE may also provide for flexible use of one or more dedicated adders and include register functionality.

Abstract: Disclosed is a logic element (LE) that can provide a number of advantageous features. For example, the LE can be configured to implement register packing and/or a fracturable look up table.

Abstract: Disclosed is a logic element (LE) that can provide a number of advantageous features. For example, the LE can be configured to implement register packing and/or a fracturable look up table.

Abstract: Disclosed is a logic element (LE) that can provide a number of advantageous features. For example, the LE can be configured to implement register packing and/or a fracturable look up table.

Abstract: Techniques for optimizing the placement and synthesis of a circuit design on a programmable integrated circuit are provided. The performance of a circuit design is analyzed after it has been compiled with different values for selected input parameters. The input parameter values that produce the best results for an output metric are then chosen to synthesis and place the circuit design on the programmable integrated circuit. In one embodiment, the values of the output metrics are averaged for all test compiles that share the same input parameters, but different seeds. In another embodiment, the compile with the best output metrics, as determined by the user, are selected. These techniques allow a user to automatically trade off compile-time to get a better-optimized circuit.

Abstract: Disclosed is an LE that can provide a number of advantageous features. For example, the LE can provide efficient and flexible use of LUTs and input sharing. The LE may also provide for flexible use of one or more dedicated adders and include register functionality.

Abstract: Techniques for optimizing the placement and synthesis of a circuit design on a programmable integrated circuit are provided. The performance of a circuit design is analyzed after it has been compiled with different values for selected input parameters. The input parameter values that produce the best results for an output metric are then chosen to synthesis and place the circuit design on the programmable integrated circuit. In one embodiment, the values of the output metrics are averaged for all test compiles that share the same input parameters, but different seeds. In another embodiment, the compile with the best output metrics, as determined by the user, are selected. These techniques allow a user to automatically trade off compile-time to get a better-optimized circuit.

Abstract: Disclosed is an LE that can provide a number of advantageous feature. For example, the LE can provide efficient and flexible use of LUTs and input sharing. The LE may also provide for flexible use of one or more dedicated adders and include register functionality.

Abstract: Methods and code for verifying that modifications or improvements to a synthesizer algorithm do not introduce errors. Specifically, a number or VHDL or Verilog models are chosen. Two netlists are then synthesized from each modeled circuit, once using a unmodified or trusted synthesizer, and once using the modified or improved synthesizer. For each circuit, a set of input test vectors are generated. These vectors are somewhat random in nature, but modified or generated intelligently using knowledge about the circuit to be testing. For each circuit, each netlist is simulated, generating a set of output vectors. These output vectors are compared. If the output vectors match each other for each of the circuits tested, there is a high probability that the improved or modified synthesizer is not introducing new errors into the netlist.