Abstract: One or more embodiments disclosed herein relate generally to flotation devices, and more specifically to modular flotation devices with a mechanism to removably attach to other modular devices. In one embodiments, an apparatus includes a first flotation module and a first connector coupled to the first flotation module. The first connector has a first end portion, a second end portion and a sidewall extended from the first end portion to the second end portion. The sidewall defines a plurality of circumferentially defined stepped portions configured to matingly engage a second connector of a second flotation module to couple the first flotation module to the second flotation module. The first connector is selectively operative as one of a female connector or a male connector with respect to the second connector.

Abstract: A thrust washer may include a metallic substrate layer having an axial substrate face. The thrust washer may also include a polymer layer on the axial substrate face. The polymer layer may have an axial polymer face opposed to the axial substrate face. The axial polymer face may be profiled and may have at least one oil distribution groove. At least one of the substrate layer and the polymer layer may be a machined layer having a thickness that may vary in correspondence with the at least one distribution groove.

Abstract: A thrust washer may include a metallic substrate layer having an axial substrate face. The thrust washer may also include a polymer layer on the axial substrate face. The polymer layer may have an axial polymer face opposed to the axial substrate face. The axial polymer face may be profiled and may have at least one oil distribution groove. At least one of the substrate layer and the polymer layer may be a machined layer having a thickness that may vary in correspondence with the at least one distribution groove.

Abstract: Computer-implemented methods and systems for determining a configuration for a light scattering inspection system are provided. One computer-implemented method includes determining a three-dimensional map of signal-to-noise ratio values for data that would be acquired for a specimen and a potential defect on the specimen by the light scattering inspection system across a scattering hemisphere of the inspection system. The method also includes determining one or more portions of the scattering hemisphere in which the signal-to-noise ratio values are higher than in other portions of the scattering hemisphere based on the three-dimensional map. In addition, the method includes determining a configuration for a detection subsystem of the inspection system based on the one or more portions of the scattering hemisphere.

Abstract: A zinc-rich preconstruction primer coating composition includes zinc powder dispersed in a polyurethane vehicle to which is added a curing catalyst to produce a moisture cured extended durability coating that is weldable. The zinc-rich preconstruction primer coating composition is applied by sprayer to preheated metal panel stock moving along a conveyor line, after which, the coated panel moves through an oven section where it is subjected to a water mist to effect curing of the coating.

Abstract: Systems for inspection of patterned and unpatterned wafers are provided. One system includes an illumination system configured to illuminate the specimen. The system also includes a collector configured to collect light scattered from the specimen. In addition, the system includes a segmented detector configured to separately detect different portions of the light such that azimuthal and polar angular information about the different portions of light is preserved. The detector may also be configured to produce signals representative of the different portions of the light. The system may also include a processor configured to detect defects on the specimen from the signals. In another embodiment, the system may include a stage that is configured to rotate and translate the specimen. In one such embodiment, the system may also include an illumination system configured to scan the specimen in a wide scan path during rotation and translation of the specimen.

Abstract: Systems for inspection of patterned and unpatterned wafers are provided. One system includes an illumination system configured to illuminate the specimen. The system also includes a collector configured to collect light scattered from the specimen. In addition, the system includes a segmented detector configured to separately detect different portions of the light such that azimuthal and polar angular information about the different portions of light is preserved. The detector may also be configured to produce signals representative of the different portions of the light. The system may also include a processor configured to detect defects on the specimen from the signals. In another embodiment, the system may include a stage that is configured to rotate and translate the specimen. In one such embodiment, the system may also include an illumination system configured to scan the specimen in a wide scan path during rotation and translation of the specimen.