Patents by Inventor Mike Müller

Mike Müller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250391961
    Abstract: A method for producing a closed profile for a sealed housing for an electrical cell, the method configured to be performed by a profiling system including a profiling device, a first joining device, an embossing device, and a separating device, the method including the profiling system continuously performing steps including: roll-forming, by the profiling device, a profile metal band having a first band edge and a second band edge into a profile; material-bonded joining, by the first joining device, of the first band edge and the second band edge of the roll-formed profile to one another, whereby the profile is closed; embossing, by the embossing device, a predetermined rupture location into the profile metal band for forced venting at a bursting pressure; and cutting, by the separating device, the previously closed profile to a length, thereby producing the closed profile.
    Type: Application
    Filed: June 19, 2025
    Publication date: December 25, 2025
    Inventors: Mike Müller, Jérôme Maira, Marc Schweizer
  • Patent number: 8892183
    Abstract: A method for planning a combined examination of an examination object using two imaging modalities is disclosed, with measurements being taken in at least two regions of the examination object. In at least one embodiment, the method includes planning of at least one measuring protocol of the first modality, which includes at least one measurement in a first of the regions and at least one measurement in a second of the regions; planning of at least one measuring protocol of the second modality, which comprises at least one measurement in the first region; and automatic production of a combined measuring sequence by arranging the measurements in such a manner that carrying out the measuring sequence taking into account modality preparations to be carried out between measurements takes as little time as possible.
    Type: Grant
    Filed: January 14, 2009
    Date of Patent: November 18, 2014
    Assignee: Siemens Aktiengesellschaft
    Inventors: Ralph Gericke, Annette Gumbrecht, Dorothea Laux, Diana Martin, Mike Müller, Carsten Prinz
  • Patent number: 7885828
    Abstract: A system and method may generate a radiological request by which to conduct a radiological procedure that employs a series of procedural steps to acquire internal images of a patient. Each step may have a corresponding protocol item which affects image quality and the time required to complete the step. A database may be maintained that includes protocol items and patient characteristic data. A rule-based algorithm may accept patient characteristic data as input. Based upon one or more patient characteristics, an overall protocol by which to conduct the radiological procedure may be determined. The tailored protocol may include steps that are selected, omitted, and/or altered based upon a patient characteristic. The patient characteristics may be medical restrictions, such as age, pregnancy, allergies, artificial joints, or other limitations. As a result, the protocol items may be automatically selected based upon patient specific characteristics, and/or an anatomical structure to be examined.
    Type: Grant
    Filed: January 17, 2007
    Date of Patent: February 8, 2011
    Assignee: Siemens Aktiengesellschaft
    Inventors: Karlheinz Glaser-Seidnitzer, Mike Müller, Klaus Mayer
  • Patent number: 7355406
    Abstract: In a method for planning an examination of an examination subject in a magnetic resonance system, wherein images of different regions of the examination subject are acquired that are assembled into an overall image, the position of at least one first image in the examination subject, the measurement parameters for this at least one MR image are established, the position of at least one second image in the examination subject is determined, the measurement parameters for the at least one second image are established, and the measurement parameters that are dependent measurement parameters are determined. With these dependent measurement parameters the measurement parameters in the images are set (adjusted) such that they are identical for all images.
    Type: Grant
    Filed: July 7, 2006
    Date of Patent: April 8, 2008
    Assignee: Siemens Aktiengesellschaft
    Inventors: Klaus Mayer, Cecile Mohr, Mike Müller
  • Patent number: 6952097
    Abstract: In a method and computer program product for operating a tomographic imaging apparatus, a standard measurement protocol is generated by displaying a planning representation of a standard object, defining a spatial position of a standard imaging area in the planning representation, and storing, as the standard measurement protocol for the standard object, a reference to the standard object and parameters of the standard imaging area. Such a standard measurement protocol can then be used in the slice position planning for an actual tomographic measurement, by obtaining data representing features of an examination object, corresponding to the standard object, determining a geometrical relation of the features of the examination object to features of the standard object, and generating an object-specific measurement protocol wherein the imaging area is positioned relative to the examination object by modification of the standard measurement protocol.
    Type: Grant
    Filed: October 22, 2003
    Date of Patent: October 4, 2005
    Assignee: Siemens Aktiengesellschaft
    Inventors: Oliver Schreck, Mike Müller, Martin Harder, Hans-Peter Hollenbach, Franz Schmitt, Ines Nimsky, Anders Dale, Andre Van Der Kouwe