Patents by Inventor Mike Mueller

Mike Mueller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8400150
    Abstract: A method to control a magnetic resonance system includes at least one protocol step for measurement data acquisition with the magnetic resonance system, and at least one operator interaction step which allows an operator to enter information that affects at least one subsequent step in the control of the magnetic resonance system.
    Type: Grant
    Filed: February 2, 2010
    Date of Patent: March 19, 2013
    Assignee: Siemens Aktiengesellschaft
    Inventors: Christof Krellmann, Stefan Assmann, Andrea Hopf, Mike Mueller, Michaela Schmidt, Peter Speier
  • Patent number: 7885828
    Abstract: A system and method may generate a radiological request by which to conduct a radiological procedure that employs a series of procedural steps to acquire internal images of a patient. Each step may have a corresponding protocol item which affects image quality and the time required to complete the step. A database may be maintained that includes protocol items and patient characteristic data. A rule-based algorithm may accept patient characteristic data as input. Based upon one or more patient characteristics, an overall protocol by which to conduct the radiological procedure may be determined. The tailored protocol may include steps that are selected, omitted, and/or altered based upon a patient characteristic. The patient characteristics may be medical restrictions, such as age, pregnancy, allergies, artificial joints, or other limitations. As a result, the protocol items may be automatically selected based upon patient specific characteristics, and/or an anatomical structure to be examined.
    Type: Grant
    Filed: January 17, 2007
    Date of Patent: February 8, 2011
    Assignee: Siemens Aktiengesellschaft
    Inventors: Karlheinz Glaser-Seidnitzer, Mike Müller, Klaus Mayer
  • Publication number: 20100268505
    Abstract: In a method to control the image acquisition and/or image evaluation at an image acquisition device, a measurement program of a measurement program package has at least one protocol step for measurement data acquisition according to a measurement protocol is used to operate the image acquisition device. At least one action element associated with the measurement program or at least one step is provided that causes an external, auxiliary program to be executed automatically upon occurrence of a trigger event in the measurement program or in the associated step.
    Type: Application
    Filed: April 20, 2010
    Publication date: October 21, 2010
    Inventors: Christof Krellmann, Mike Mueller, Dani Sikiric
  • Publication number: 20100198373
    Abstract: A method to control a magnetic resonance system includes at least one protocol step for measurement data acquisition with the magnetic resonance system, and at least one operator interaction step which allows an operator to enter information that affects at least one subsequent step in the control of the magnetic resonance system.
    Type: Application
    Filed: February 2, 2010
    Publication date: August 5, 2010
    Inventors: Christof Krellmann, Stefan Assmann, Andrea Hopf, Mike Mueller, Michaela Schmidt, Peter Speier
  • Patent number: 7355406
    Abstract: In a method for planning an examination of an examination subject in a magnetic resonance system, wherein images of different regions of the examination subject are acquired that are assembled into an overall image, the position of at least one first image in the examination subject, the measurement parameters for this at least one MR image are established, the position of at least one second image in the examination subject is determined, the measurement parameters for the at least one second image are established, and the measurement parameters that are dependent measurement parameters are determined. With these dependent measurement parameters the measurement parameters in the images are set (adjusted) such that they are identical for all images.
    Type: Grant
    Filed: July 7, 2006
    Date of Patent: April 8, 2008
    Assignee: Siemens Aktiengesellschaft
    Inventors: Klaus Mayer, Cecile Mohr, Mike Müller
  • Patent number: 6952097
    Abstract: In a method and computer program product for operating a tomographic imaging apparatus, a standard measurement protocol is generated by displaying a planning representation of a standard object, defining a spatial position of a standard imaging area in the planning representation, and storing, as the standard measurement protocol for the standard object, a reference to the standard object and parameters of the standard imaging area. Such a standard measurement protocol can then be used in the slice position planning for an actual tomographic measurement, by obtaining data representing features of an examination object, corresponding to the standard object, determining a geometrical relation of the features of the examination object to features of the standard object, and generating an object-specific measurement protocol wherein the imaging area is positioned relative to the examination object by modification of the standard measurement protocol.
    Type: Grant
    Filed: October 22, 2003
    Date of Patent: October 4, 2005
    Assignee: Siemens Aktiengesellschaft
    Inventors: Oliver Schreck, Mike Müller, Martin Harder, Hans-Peter Hollenbach, Franz Schmitt, Ines Nimsky, Anders Dale, Andre Van Der Kouwe
  • Publication number: 20030004409
    Abstract: In a magnetic resonance imaging apparatus having a control console disposed at a location remote from the scanner which interacts with the examination subject, the control console has a display monitor at which a graphics display is presented having at least one control area thereon which, when activated, controls operation of a patient positioning mechanism for selectively positioning a patient thereon relative to an imaging volume in the scanner. The positioning of the examination subject and the overall control of an examination procedure are thereby controlled from a single location, with a precise visual indication of the position of the examination subject relative to the examination volume.
    Type: Application
    Filed: June 29, 2001
    Publication date: January 2, 2003
    Applicant: Siemens Aktiengesellschaft
    Inventors: Mike Mueller, Dorothea Laux
  • Publication number: 20020151785
    Abstract: In a method for preparing a magnetic resonance data acquisition procedure by using magnetic resonance images that have already been obtained and a magnetic resonance tomography apparatus using the method, imaging parameters of already-performed magnetic resonance data acquisitions are stored, magnetic resonance data acquisitions that have already been performed are simultaneously or subsequently graphically represented, and a selection possibility from among the already-obtained and graphically represented magnetic resonance, image is offered and graphically represented. The imaging parameters of a magnetic resonance image selected by a user are automatically transferred into the settings for imaging parameters of a magnetic resonance data acquisition that still has to occur.
    Type: Application
    Filed: April 9, 2002
    Publication date: October 17, 2002
    Applicant: Siemens Aktiengesellschaft
    Inventors: Mike Mueller, Roland Schneider
  • Patent number: 5607267
    Abstract: The present invention relates to the simultaneous duplication of both the bit notch pattern and shoulder position of a master key onto a key blank. The key blank is longitudinally and laterally aligned relative to a key cutter. A master key is longitudinally and laterally aligned relative to a key follower. The key follower is then longitudinally and laterally displaced relative to the master key to trace the contour of the key master. The key cutter is simultaneously displaced relative to the key blank in an identical manner to reproduce the traced contour of the master key on the key blank and to longitudinally reposition the key blank shoulder to coincide with the relative longitudinal location of the master key shoulder by cutting away a portion of the shank to reduce the length of the shank.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: March 4, 1997
    Inventors: George L. Heredia, Robert E. Almblad, Mike A. Mueller
  • Patent number: 5443339
    Abstract: The present invention relates to the simultaneous duplication of both the bit notch pattern and shoulder position of a master key onto a key blank. The key blank is longitudinally and laterally aligned relative to a key cutter. A master key is longitudinally and laterally aligned relative to a key follower. The key follower is then longitudinally and laterally displaced relative to the master key to trace the contour of the key master. The key cutter is simultaneously displaced relative to the key blank in an identical manner to reproduce the traced contour of the master key on the key blank and to longitudinally reposition the key blank shoulder to coincide with the relative longitudinal location of the master key shoulder by cutting away a portion of the shank to reduce the length of the shank.
    Type: Grant
    Filed: March 8, 1994
    Date of Patent: August 22, 1995
    Assignee: Axxess Entry Technologies
    Inventors: George L. Heredia, Robert E. Almblad, Mike A. Mueller
  • Patent number: 5314274
    Abstract: The present invention relates to the simultaneous duplication of both the bit notch pattern and shoulder position of a master key onto a key blank. The key blank is longitudinally and laterally aligned relative to a key cutter. A master key is longitudinally and laterally aligned relative to a key follower. The key follower is then longitudinally and laterally displaced relative to the master key to trace the contour of the key master. The key cutter is simultaneously displaced relative to the key blank in an identical manner to reproduce the traced contour of the master key on the key blank and to longitudinally reposition the key blank shoulder to coincide with the relative longitudinal location of the master key shoulder by cutting away a portion of the shank to reduce the length of the shank.
    Type: Grant
    Filed: September 30, 1991
    Date of Patent: May 24, 1994
    Assignee: Axxess Entry Technologies
    Inventors: George L. Heredia, Robert E. Almblad, Mike A. Mueller
  • Patent number: 5271698
    Abstract: A code selectable key duplicating system is adapted to function with a key cutting machine having a key follower for engaging and tracing the contour of a bit notch pattern formed in the blade of a master key and a key cutter coupled to the key follower to reproduce the traced bit notch pattern of the master key in the blade of a key blank. The code selectable duplicating system includes a bit notch simulator which is divided into a selectable series of n adjacent notch segments to form a surface contour creating a simulated bit notch pattern corresponding to the bit notch pattern designated by a coded sequence. An alignment fixture positions the notch pattern simulator relative to the key follower enabling the key follower to trace the simulated bit notch pattern such that the key cutter reproduces the simulated bit notch pattern in the blade of the key blank.
    Type: Grant
    Filed: September 30, 1991
    Date of Patent: December 21, 1993
    Assignee: Axxess Entry Technologies
    Inventors: George L. Heredia, Peter G. Piatkowski, Robert E. Almblad, Mike A. Mueller