Patents by Inventor Mikhail N. Shneider

Mikhail N. Shneider has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for detecting surface and subsurface properties of materials
    Patent number: 7728295
    Abstract: A method and apparatus for remotely monitoring properties of gases and plasmas, and surface and sub-surface properties of materials, is disclosed. A laser beam is focused at a desired region within a gas, plasma, or material (e.g., solid or liquid) to be analyzed, generating an ionized sample region or a localized, enhanced free carrier region. A beam of microwave radiation is directed toward the ionized sample region or the free carrier region, and the microwave radiation is scattered. The scattered microwave radiation is received by a microwave receiver, and is processed by a microwave detection system to determine properties of the gas, plasma, or material, including surface and sub-surface properties.
    Type: Grant
    Filed: January 25, 2008
    Date of Patent: June 1, 2010
    Assignee: The Trustees of Princeton University
    Inventors: Richard B. Miles, Arthur Dogariu, Alexander Goltsov, Mikhail N. Shneider, Zhili Zhang
  • Method and Apparatus for Detecting Surface and Subsurface Properties of Materials
    Publication number: 20080245964
    Abstract: A method and apparatus for remotely monitoring properties of gases and plasmas, and surface and sub-surface properties of materials, is disclosed. A laser beam is focused at a desired region within a gas, plasma, or material (e.g., solid or liquid) to be analyzed, generating an ionized sample region or a localized, enhanced free carrier region. A beam of microwave radiation is directed toward the ionized sample region or the free carrier region, and the microwave radiation is scattered. The scattered microwave radiation is received by a microwave receiver, and is processed by a microwave detection system to determine properties of the gas, plasma, or material, including surface and sub-surface properties.
    Type: Application
    Filed: January 25, 2008
    Publication date: October 9, 2008
    Inventors: Richard B. Miles, Arthur Dogariu, Alexandre Goltsov, Mikhail N. Shneider, Zhili Zhang