Patents by Inventor Mikhail Okunev
Mikhail Okunev has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230368368Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.Type: ApplicationFiled: May 15, 2023Publication date: November 16, 2023Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
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Patent number: 11688056Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.Type: GrantFiled: March 15, 2021Date of Patent: June 27, 2023Assignee: Instrumental, Inc.Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
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Patent number: 11481877Abstract: In one embodiment, a method includes accessing first-resolution images corresponding to frames of a video, computing a motion vector based on a first-resolution image of a first frame in the video and a first-resolution image of a second frame in the video, generating a second-resolution warped image associated with the second frame by using the motion vector to warp a second-resolution reconstructed image associated with the first frame, generating a second-resolution intermediate image associated with the second frame based on the first-resolution image associated with the second frame, computing adjustment parameters by processing the first-resolution image associated with the second frame and the second-resolution warped image associated with the second frame using a machine-learning model, and adjusting pixels of the second-resolution intermediate image associated with the second frame based on the adjustment parameters to reconstruct a second-resolution reconstructed image associated with the second fraType: GrantFiled: June 16, 2020Date of Patent: October 25, 2022Assignee: Meta Platforms Technologies, LLCInventors: Mikhail Okunev, Anton S. Kaplanyan
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Publication number: 20210390661Abstract: In one embodiment, a method includes accessing first-resolution images corresponding to frames of a video, computing a motion vector based on a first-resolution image of a first frame in the video and a first-resolution image of a second frame in the video, generating a second-resolution warped image associated with the second frame by using the motion vector to warp a second-resolution reconstructed image associated with the first frame, generating a second-resolution intermediate image associated with the second frame based on the first-resolution image associated with the second frame, computing adjustment parameters by processing the first-resolution image associated with the second frame and the second-resolution warped image associated with the second frame using a machine-learning model, and adjusting pixels of the second-resolution intermediate image associated with the second frame based on the adjustment parameters to reconstruct a second-resolution reconstructed image associated with the second fraType: ApplicationFiled: June 16, 2020Publication date: December 16, 2021Inventors: Mikhail Okunev, Anton S. Kaplanyan
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Publication number: 20210201462Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.Type: ApplicationFiled: March 15, 2021Publication date: July 1, 2021Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
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Patent number: 11037531Abstract: In one embodiment, a computing system configured to generate a current frame may access a current sample dataset having incomplete pixel information of a current frame in a sequence of frames. The system may access a previous frame in the sequence of frames with complete pixel information. The system may further access a motion representation indicating pixel relationships between the current frame and the previous frame. The previous frame may then be transformed according to the motion representation. The system may generate the current frame having complete pixel information by processing the current sample dataset and the transformed previous frame using a first machine-learning model.Type: GrantFiled: October 24, 2019Date of Patent: June 15, 2021Assignee: Facebook Technologies, LLCInventors: Anton S. Kaplanyan, Jiahao Lin, Mikhail Okunev
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Publication number: 20210125583Abstract: In one embodiment, a computing system configured to generate a current frame may access a current sample dataset having incomplete pixel information of a current frame in a sequence of frames. The system may access a previous frame in the sequence of frames with complete pixel information. The system may further access a motion representation indicating pixel relationships between the current frame and the previous frame. The previous frame may then be transformed according to the motion representation. The system may generate the current frame having complete pixel information by processing the current sample dataset and the transformed previous frame using a first machine-learning model.Type: ApplicationFiled: October 24, 2019Publication date: April 29, 2021Inventors: Anton S. Kaplanyan, Jiahao Lin, Mikhail Okunev
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Patent number: 10984526Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.Type: GrantFiled: June 9, 2020Date of Patent: April 20, 2021Assignee: Instrumental, Inc.Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
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Publication number: 20200334802Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.Type: ApplicationFiled: June 9, 2020Publication date: October 22, 2020Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
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Patent number: 10789701Abstract: One variation of a method for predicting manufacturing defects includes: accessing a set of inspection images of a set of assembly units recorded by an optical inspection station; for each inspection image in the set of inspection images, detecting a set of features in the inspection image and generating a vector representing the set of features in a multi-dimensional feature space; grouping neighboring vectors in the multi-dimensional feature space into a set of vector groups; and, in response to receipt of a first inspection result indicting a defect in a first assembly unit, in the set of assembly units, associated with a first vector in a first vector group, in the set of vector groups, labeling the first vector group with the defect and flagging a second assembly unit associated with a second vector, in the first vector group, as exhibiting characteristics of the defect.Type: GrantFiled: April 13, 2018Date of Patent: September 29, 2020Assignee: Instrumental, Inc.Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
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Patent number: 10713776Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.Type: GrantFiled: April 13, 2018Date of Patent: July 14, 2020Assignee: Instrumental, Inc.Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
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Publication number: 20190114756Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.Type: ApplicationFiled: April 13, 2018Publication date: April 18, 2019Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
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Publication number: 20180300865Abstract: One variation of a method for predicting manufacturing defects includes: accessing a set of inspection images of a set of assembly units recorded by an optical inspection station; for each inspection image in the set of inspection images, detecting a set of features in the inspection image and generating a vector representing the set of features in a multi-dimensional feature space; grouping neighboring vectors in the multi-dimensional feature space into a set of vector groups; and, in response to receipt of a first inspection result indicting a defect in a first assembly unit, in the set of assembly units, associated with a first vector in a first vector group, in the set of vector groups, labeling the first vector group with the defect and flagging a second assembly unit associated with a second vector, in the first vector group, as exhibiting characteristics of the defect.Type: ApplicationFiled: April 13, 2018Publication date: October 18, 2018Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin