Abstract: Methods and apparatuses for routing traces in a layout design, such as for example a layout design for an integrated circuit, are disclosed. In various implementations, a group of netlines within a layout design and a freeform sketch are identified. Subsequently, the netlines are routed as traces according to the freeform sketch. More particularly, the geometry of the traces is determined by approximating the geometry of the freeform sketch. Various implementations of the invention provide for the netlines to be routed by an automated trace routing engine. With further implementations of the invention, ball grid array escapes and trace fanouts are additionally routed. For example, ball grid array escapes may be routed prior to netlines being routed according to the freeform sketch. In further implementations of the invention, the freeform sketch is deleted after the traces have been routed.

Abstract: Methods and apparatuses for routing traces in a layout design, such as for example a layout design for an integrated circuit, are disclosed. In various implementations, a group of netlines within a layout design and a freeform sketch are identified. Subsequently, the netlines are routed as traces according to the freeform sketch. More particularly, the geometry of the traces is determined by approximating the geometry of the freeform sketch. Various implementations of the invention provide for the netlines to be routed by an automated trace routing engine. With further implementations of the invention, ball grid array escapes and trace fanouts are additionally routed. For example, ball grid array escapes may be routed prior to netlines being routed according to the freeform sketch. In further implementations of the invention, the freeform sketch is deleted after the traces have been routed.

Abstract: Various implementations of the invention provide a method for dynamically determining a layer bias. In various implementations, the layer bias may be employed to determine placement locations for a trace within an electrical device layout design. The trace providing for the electrical connection of components or pins within the layout design. With various implementations of the invention, a layer within the layout design is partitioned into regions, selected regions having a bias. As events or alterations to the layout design occur, the corresponding bias for the selected regions is updated to reflect any changes in bias occurring due to the event or alteration. With other implementations of the invention, processes, machines, or manufactures are provided that dynamically determine a layer bias. The dynamically determined layer bias may be incorporated into a layer bias heuristic employed by for example, an automated trace routing tool.