Patents by Inventor Mikhail Yavor
Mikhail Yavor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240030018Abstract: Improved ion mirrors 30 (FIG. 3) are proposed for multi-reflecting TOF MS and electrostatic traps. Minor and controlled variation by means of arranging a localized wedge field structure 35 at the ion retarding region was found to produce major tilt of ion packets time fronts 39. Combining wedge reflecting fields with compensated deflectors is proposed for electrically controlled compensation of local and global misalignments, for improved ion injection and for reversing ion motion in the drift direction. Fine ion optical properties of methods and embodiments are verified in ion optical simulations.Type: ApplicationFiled: July 26, 2023Publication date: January 25, 2024Applicant: Micromass UK LimitedInventors: Anatoly Verenchikov, Mikhail Yavor
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Patent number: 11817303Abstract: Improved pulsed ion sources and pulsed converters are proposed for multi-pass time-of-flight mass spectrometer, either multi-reflecting (MR) or multi-turn (MT) TOF. A wedge electrostatic field (45) is arranged within a region of small ion energy for electronically controlled tilting of ion packets (54) time front. Tilt angle ? of time front (54) is strongly amplified by a post-acceleration in a flat field (48). Electrostatic deflector (30) downstream of the post-acceleration (48) allows denser folding of ion trajectories, whereas the injection mechanism allows for electronically adjustable mutual compensation of the time front tilt angle, i.e. ?=0 for ion packet in location (55), for curvature of ion packets, and for the angular energy dispersion. The arrangement helps bypassing accelerator (40) rims, adjusting ion packets inclination angles ?2 and what is most important, compensating for mechanical misalignments of the optical components.Type: GrantFiled: July 26, 2018Date of Patent: November 14, 2023Assignee: Micromass UK LimitedInventors: Anatoly Verenchikov, Mikhail Yavor
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Patent number: 11756782Abstract: Improved ion mirrors 30 (FIG. 3) are proposed for multi-reflecting TOF MS and electrostatic traps. Minor and controlled variation by means of arranging a localized wedge field structure 35 at the ion retarding region was found to produce major tilt of ion packets time fronts 39. Combining wedge reflecting fields with compensated deflectors is proposed for electrically controlled compensation of local and global misalignments, for improved ion injection and for reversing ion motion in the drift direction. Fine ion optical properties of methods and embodiments are verified in ion optical simulations.Type: GrantFiled: January 27, 2022Date of Patent: September 12, 2023Assignee: Micromass UK LimitedInventors: Anatoly Verenchikov, Mikhail Yavor
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Publication number: 20230170204Abstract: Improved pulsed ion sources and pulsed converters are proposed for multi-pass time-of-flight mass spectrometer, either multi-reflecting (MR) or multi-turn (MT) TOF. A wedge electrostatic field 45 is arranged within a region of small ion energy for electronically controlled tilting of ion packets 54 time front. Tilt angle ? of time front 54 is strongly amplified by a post-acceleration in a flat field 48. Electrostatic deflector 30 downstream of the post-acceleration 48 allows denser folding of ion trajectories, whereas the injection mechanism allows for electronically adjustable mutual compensation of the time front tilt angle, i.e. ?=0 for ion packet in location 55, for curvature of ion packets, and for the angular energy dispersion. The arrangement helps bypassing accelerator 40 rims, adjusting ion packets inclination angles ?2, and what is most important, compensating for mechanical misalignments of the optical components.Type: ApplicationFiled: January 25, 2023Publication date: June 1, 2023Applicant: Micromass UK LimitedInventors: Anatoly Verenchikov, Mikhail Yavor
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Publication number: 20220148872Abstract: Improved ion mirrors 30 (FIG. 3) are proposed for multi-reflecting TOF MS and electrostatic traps. Minor and controlled variation by means of arranging a localized wedge field structure 35 at the ion retarding region was found to produce major tilt of ion packets time fronts 39. Combining wedge reflecting fields with compensated deflectors is proposed for electrically controlled compensation of local and global misalignments, for improved ion injection and for reversing ion motion in the drift direction. Fine ion optical properties of methods and embodiments are verified in ion optical simulations.Type: ApplicationFiled: January 27, 2022Publication date: May 12, 2022Inventors: Anatoly Verenchikov, Mikhail Yavor
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Patent number: 11239067Abstract: Improved ion mirrors (30) (FIG. 3) are proposed for multi-reflecting TOF MS and electrostatic traps. Minor and controlled variation by means of arranging a localized wedge field structure (35) at the ion retarding region was found to produce major tilt of ion packets time fronts (39). Combining wedge reflecting fields with compensated deflectors is proposed for electrically controlled compensation of local and global misalignments, for improved ion injection and for reversing ion motion in the drift direction. Fine ion optical properties of methods and embodiments are verified in ion optical simulations.Type: GrantFiled: July 26, 2018Date of Patent: February 1, 2022Assignee: Micromass UK LimitedInventors: Anatoly Verenchikov, Mikhail Yavor
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Patent number: 11049712Abstract: A multi-reflecting time-of-flight mass spectrometer MR TOF with an orthogonal accelerator (40) is improved with at least one deflector (30) and/or (30R) in combination with at least one wedge field (46) for denser folding of ion rays (73). Systematic mechanical misalignments (72) of ion mirrors (71) may be compensated by electrical tuning of the instrument, as shown by resolution improvements between simulated peaks for non compensated case (74) and compensated one (75), and/or by an electronically controlled global electrostatic wedge/arc field within ion mirror (71).Type: GrantFiled: July 26, 2018Date of Patent: June 29, 2021Assignee: Micromass UK LimitedInventors: Anatoly Verenchikov, Mikhail Yavor
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Patent number: 10950425Abstract: A time-of-flight or electrostatic trap mass analyzer is disclosed comprising: an ion flight region comprising a plurality of ion-optical elements (30-35) for guiding ions through the flight region in a deflection (x-y) plane. The ion-optical elements are arranged so as to define a plurality of identical ion-optical cells, wherein the ion-optical elements in each ion-optical cell are arranged and configured so as to generate electric fields for either focusing ions travelling in parallel at an ion entrance location of the cell to a point at an ion exit location of the cell, or for focusing ions diverging from a point at the ion entrance location to travel parallel at the ion exit location. Each ion-optical cell comprises a plurality of electrostatic sectors having different deflection radii for bending the flight path of the ions in the deflection (x-y) plane.Type: GrantFiled: August 11, 2017Date of Patent: March 16, 2021Assignee: Micromass UK LimitedInventors: Anatoly Verenchikov, Mikhail Yavor
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Publication number: 20200373145Abstract: Improved pulsed ion sources and pulsed converters are proposed for multi-pass time-of-flight mass spectrometer, either multi-reflecting (MR) or multi-turn (MT) TOF. A wedge electrostatic field (45) is arranged within a region of small ion energy for electronically controlled tilting of ion packets (54) time front. Tilt angle ? of time front (54) is strongly amplified by a post-acceleration in a flat field (48). Electrostatic deflector (30) downstream of the post-acceleration (48) allows denser folding of ion trajectories, whereas the injection mechanism allows for electronically adjustable mutual compensation of the time front tilt angle, i.e. ?=0 for ion packet in location (55), for curvature of ion packets, and for the angular energy dispersion. The arrangement helps bypassing accelerator (40) rims, adjusting ion packets inclination angles ?2 and what is most important, compensating for mechanical misalignments of the optical components.Type: ApplicationFiled: July 26, 2018Publication date: November 26, 2020Inventors: Anatoly Verenchikov, Mikhail Yavor
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Publication number: 20200373143Abstract: Improved ion mirrors (30) (FIG. 3) are proposed for multi-reflecting TOF MS and electrostatic traps. Minor and controlled variation by means of arranging a localized wedge field structure (35) at the ion retarding region was found to produce major tilt of ion packets time fronts (39). Combining wedge reflecting fields with compensated deflectors is proposed for electrically controlled compensation of local and global misalignments, for improved ion injection and for reversing ion motion in the drift direction. Fine ion optical properties of methods and embodiments are verified in ion optical simulations.Type: ApplicationFiled: July 26, 2018Publication date: November 26, 2020Inventors: Anatoly Verenchikov, Mikhail Yavor
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Patent number: 10741376Abstract: A method of time-of-flight mass spectrometry is disclosed comprising: providing two ion mirrors (42) that are spaced apart in a first dimension (X-dimension) and that are each elongated in a second dimension (Z-dimension) orthogonal to the first dimension; introducing packets of ions (47) into the space between the mirrors using an ion introduction mechanism (43) such that the ions repeatedly oscillate in the first dimension (X-dimension) between the mirrors (42) as they drift through said space in the second dimension (Z-dimension); oscillating the ions in a third dimension (Y-dimension) orthogonal to both the first and second dimensions as the ions drift through said space in the second dimension (Z-dimension); and receiving the ions in or on an ion receiving mechanism (44) after the ions have oscillated multiple times in the first dimension (X-dimension); wherein at least part of the ion introduction mechanism (43) and/or at least part of the ion receiving mechanism (44) is arranged between the mirrors (42Type: GrantFiled: April 29, 2016Date of Patent: August 11, 2020Assignee: MICROMASS UK LIMITEDInventors: John Brian Hoyes, Keith Richardson, Anatoly Verenchikov, Mikhail Yavor
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Publication number: 20200168448Abstract: A multi-reflecting time-of-flight mass spectrometer MR TOF with an orthogonal accelerator (40) is improved with at least one deflector (30) and/or (30R) in combination with at least one wedge field (46) for denser folding of ion rays (73). Systematic mechanical misalignments (72) of ion mirrors (71) may be compensated by electrical tuning of the instrument, as shown by resolution improvements between simulated peaks for non compensated case (74) and compensated one (75), and/or by an electronically controlled global electrostatic wedge/arc field within ion mirror (71).Type: ApplicationFiled: July 26, 2018Publication date: May 28, 2020Inventors: Anatoly Verenchikov, Mikhail Yavor
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Patent number: 10636646Abstract: An ion mirror is disclosed comprising an ion entrance electrode section (62) at the ion entrance to the ion mirror, an energy focussing electrode section (66) for reflecting ions back along a longitudinal axis towards said ion entrance, and a spatial focussing electrode section (64) arranged between the ion entrance electrode section (62) and the energy focussing electrode section (66) for spatially focussing the ions. One or more DC voltage supply is provided to apply a DC potential to the ion entrance electrode section (62) that is intermediate the DC potential applied to the spatial focussing electrode section (64) and the DC potential applied to the energy focussing electrode section (66).Type: GrantFiled: November 21, 2016Date of Patent: April 28, 2020Assignee: Micromass UK LimitedInventors: John Brian Hoyes, Anatoly Verenchikov, Mikhail Yavor, Keith Richardson
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Patent number: 10629425Abstract: A time-of-flight mass spectrometer is disclosed comprising ion optics that map an array of ions at an ion source array (71) to a corresponding array of positions on a position sensitive ion detector (79). The ion optics include at least one gridless ion mirror (76) for reflecting ions, which may compensate for various aberrations and allows the spectrometer to have relatively high mass and spatial resolutions.Type: GrantFiled: November 16, 2016Date of Patent: April 21, 2020Assignees: MICROMASS UK LIMITED, LECO CORPORATIONInventors: John Brian Hoyes, Anatoly Verenchikov, Mikhail Yavor, Keith Richardson, Jason Wildgoose
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Patent number: 10593533Abstract: A time-of-flight mass spectrometer is disclosed comprising: an ion deflector (305) configured to deflect ions to different positions in a first array of positions at different times; a position sensitive ion detector (187); and ion optics (180) arranged and configured to guide ions from the first array of positions to the position sensitive detector (187) so as to map ions from the first array of positions to a second array of positions on the position sensitive detector (187); wherein the ion optics includes at least one ion mirror for reflecting the ions.Type: GrantFiled: November 16, 2016Date of Patent: March 17, 2020Assignees: Micromass UK Limited, LECO CORPORATIONInventors: John Brian Hoyes, Anatoly Verenchikov, Mikhail Yavor, Keith Richardson, Jason Wildgoose
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Publication number: 20190206669Abstract: A time-of-flight or electrostatic trap mass analyzer is disclosed comprising: an ion flight region comprising a plurality of ion-optical elements (30-35) for guiding ions through the flight region in a deflection (x-y) plane. The ion-optical elements are arranged so as to define a plurality of identical ion-optical cells, wherein the ion-optical elements in each ion-optical cell are arranged and configured so as to generate electric fields for either focusing ions travelling in parallel at an ion entrance location of the cell to a point at an ion exit location of the cell, or for focusing ions diverging from a point at the ion entrance location to travel parallel at the ion exit location. Each ion-optical cell comprises a plurality of electrostatic sectors having different deflection radii for bending the flight path of the ions in the deflection (x-y) plane.Type: ApplicationFiled: August 11, 2017Publication date: July 4, 2019Inventors: Anatoly Verenchikov, Mikhail Yavor
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Publication number: 20180366313Abstract: A time-of-flight mass spectrometer is disclosed comprising: an ion deflector (305) configured to deflect ions to different positions in a first array of positions at different times; a position sensitive ion detector (187); and ion optics (180) arranged and configured to guide ions from the first array of positions to the position sensitive detector (187) so as to map ions from the first array of positions to a second array of positions on the position sensitive detector (187); wherein the ion optics includes at least one ion mirror for reflecting the ions.Type: ApplicationFiled: November 16, 2016Publication date: December 20, 2018Inventors: John Brian Hoyes, Anatoly Verenchikov, Mikhail Yavor, Keith Richardson, Jason Wildgoose
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Publication number: 20180358219Abstract: An ion mirror is disclosed comprising an ion entrance electrode section (62) at the ion entrance to the ion mirror, an energy focussing electrode section (66) for reflecting ions back along a longitudinal axis towards said ion entrance, and a spatial focussing electrode section (64) arranged between the ion entrance electrode section (62) and the energy focussing electrode section (66) for spatially focussing the ions. One or more DC voltage supply is provided to apply a DC potential to the ion entrance electrode section (62) that is intermediate the DC potential applied to the spatial focussing electrode section (64) and the DC potential applied to the energy focussing electrode section (66).Type: ApplicationFiled: November 21, 2016Publication date: December 13, 2018Inventors: John Brian Hoyes, Anatoly Verenchikov, Mikhail Yavor, Keith Richardson
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Publication number: 20180330936Abstract: A time-of-flight mass spectrometer is disclosed comprising ion optics that map an array of ions at an ion source array (71) to a corresponding array of positions on a position sensitive ion detector (79). The ion optics include at least one gridless ion mirror (76) for reflecting ions, which may compensate for various aberrations and allows the spectrometer to have relatively high mass and spatial resolutions.Type: ApplicationFiled: November 16, 2016Publication date: November 15, 2018Inventors: John Brian Hoyes, Anatoly Verenchikov, Mikhail Yavor, Keith Richardson, Jason Wildgoose
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Publication number: 20180144921Abstract: A method of time-of-flight mass spectrometry is disclosed comprising: providing two ion mirrors (42) that are spaced apart in a first dimension (X-dimension) and that are each elongated in a second dimension (Z-dimension) orthogonal to the first dimension; introducing packets of ions (47) into the space between the mirrors using an ion introduction mechanism (43) such that the ions repeatedly oscillate in the first dimension (X-dimension) between the mirrors (42) as they drift through said space in the second dimension (Z-dimension); oscillating the ions in a third dimension (Y-dimension) orthogonal to both the first and second dimensions as the ions drift through said space in the second dimension (Z-dimension); and receiving the ions in or on an ion receiving mechanism (44) after the ions have oscillated multiple times in the first dimension (X-dimension); wherein at least part of the ion introduction mechanism (43) and/or at least part of the ion receiving mechanism (44) is arranged between the mirrors (42Type: ApplicationFiled: April 29, 2016Publication date: May 24, 2018Inventors: John Brian Hoyes, Keith Richardson, Anatoly Verenchikov, Mikhail Yavor