Abstract: An aligning and feeding device which accommodates a component including a pair of rectangular end surfaces oppositely facing each other and having a longitudinal direction extending between the end surfaces of the component in a cavity formed in an accommodating member. The component is accommodated in the cavity by aligning a direction of the component such that the longitudinal direction of the component extends parallel to a main surface of the accommodating member.

Abstract: An aligning and feeding device which accommodates a component including a pair of rectangular end surfaces oppositely facing each other and having a longitudinal direction extending between the end surfaces of the component in a cavity formed in an accommodating member. The component is accommodated in the cavity by aligning a direction of the component such that the longitudinal direction of the component extends parallel to a main surface of the accommodating member.

Abstract: A measuring and classifying apparatus (transferring apparatus) for chips includes an immovable base and a turn table (transferring member). The turn table is rotatably disposed on an upper surface of the immovable base, and is provided with receiving concavities for receiving chips with the immovable base and suction passes for chucking the chips. The chips are transferred above the immovable base while being chucked in the receiving concavities. The suction passes are formed at the upper corner portions of the receiving concavities, so that the chips are chucked in such a manner that gaps are provided between the chips and the upper surface of the immovable base.

Abstract: A measuring and classifying apparatus (transferring apparatus) for chips includes an immovable base and a turn table (transferring member). The turn table is rotatably disposed on an upper surface of the immovable base, and is provided with receiving concavities for receiving chips with the immovable base and suction passes for chucking the chips. The chips are transferred above the immovable base while being chucked in the receiving concavities. The suction passes are formed at the upper corner portions of the receiving concavities, so that the chips are chucked in such a manner that gaps are provided between the chips and the upper surface of the immovable base.

Abstract: In order to enable measurement of insulation resistance values of a number of electronic parts such as chip capacitors with high accuracy and without the reducing measurement efficiency of characteristics, such as the capacitance, capacitance values of chip capacitors which are held by respective holding portions of a turntable are first measured in a capacitance measuring position during intermittent feeding of the turntable. When an insulation resistance measuring region is filled with those of the chip capacitors whose capacitance values have been measured the turntable is stopped. In this stopped state, a plurality of chip capacitors being located in the insulation resistance measuring region are simultaneously charged and subjected to the measurement of insulation resistance values.