Abstract: A memory system includes a non-volatile memory and a controller that includes a first memory and is configured to write log data to the first memory, including a history of commands for controlling the memory system. An information processing system includes the memory system and an information processing device configured to store an expected value and to transmit a signal that instructs the memory system to stop when a value of the log data transmitted from the memory system does not match the expected value. The expected value and the transmitted value are determined based on the log data of the memory system.

Abstract: A memory system includes a non-volatile memory and a controller that includes a first memory and is configured to write log data to the first memory, including a history of commands for controlling the memory system. An information processing system includes the memory system and an information processing device configured to store an expected value and to transmit a signal that instructs the memory system to stop when a value of the log data transmitted from the memory system does not match the expected value. The expected value and the transmitted value are determined based on the log data of the memory system.

Abstract: A memory system includes a non-volatile memory and a controller that includes a first memory and is configured to write log data to the first memory, including a history of commands for controlling the memory system. An information processing system includes the memory system and an information processing device configured to store an expected value and to transmit a signal that instructs the memory system to stop when a value of the log data transmitted from the memory system does not match the expected value. The expected value and the transmitted value are determined based on the log data of the memory system.

Abstract: A memory system includes a non-volatile memory and a controller that includes a first memory and is configured to write log data to the first memory, including a history of commands for controlling the memory system. An information processing system includes the memory system and an information processing device configured to store an expected value and to transmit a signal that instructs the memory system to stop when a value of the log data transmitted from the memory system does not match the expected value. The expected value and the transmitted value are determined based on the log data of the memory system.

Abstract: A memory system includes a non-volatile memory and a controller that includes a first memory and is configured to write log data to the first memory, including a history of commands for controlling the memory system. An information processing system includes the memory system and an information processing device configured to store an expected value and to transmit a signal that instructs the memory system to stop when a value of the log data transmitted from the memory system does not match the expected value. The expected value and the transmitted value are determined based on the log data of the memory system.

Abstract: A memory system includes a semiconductor memory device, a controller configured to access the semiconductor module, a plurality of pins for connection to the outside of the memory system, the pins configured to receive and output serial data, and a test circuit. When one of the pins receives serial test data, the test circuit converts the serial test data into parallel test data, and outputs the parallel test data to the semiconductor memory device for writing therein, and when the test circuit receives parallel test data written in the semiconductor memory device, the test circuit converts the parallel test data to serial test data, and outputs the serial test data through one of the pins for test of the memory system.

Abstract: A memory system includes a semiconductor memory device, a controller configured to access the semiconductor module, a plurality of pins for connection to the outside of the memory system, the pins configured to receive and output serial data, and a test circuit. When one of the pins receives serial test data, the test circuit converts the serial test data into parallel test data, and outputs the parallel test data to the semiconductor memory device for writing therein, and when the test circuit receives parallel test data written in the semiconductor memory device, the test circuit converts the parallel test data to serial test data, and outputs the serial test data through one of the pins for test of the memory system.

Abstract: The present invention is to provide an emulator and a method of emulation for using testing a system having complex interfaces capable of stable testing can be realize under the system regulation frequency or less frequency without using the high-performance and expensive tester. The emulator comprises a content addressable memory (CAM) configured to store addresses accessed by a system to be tested, a memory unit having storage area corresponding to the entry of the CAM, configured to store data corresponding to the address stored in the CAM, and test information for emulation, a shift register configured to store data and test information from a tester and transfer the data and the test information to the CAM and the memory unit, and a state machine configured to receive a request from a system or a tester and control transferring between a system and a tester.

Abstract: The present invention is to provide an emulator and a method of emulation for using testing a system having complex interfaces capable of stable testing can be realize under the system regulation frequency or less frequency without using the high-performance and expensive tester. The emulator comprises a content addressable memory (CAM) configured to store addresses accessed by a system to be tested, a memory unit having storage area corresponding to the entry of the CAM, configured to store data corresponding to the address stored in the CAM, and test information for emulation, a shift register configured to store data and test information from a tester and transfer the data and the test information to the CAM and the memory unit, and a state machine configured to receive a request from a system or a tester and control transferring between a system and a tester.

Abstract: An instruction code is received by an instruction input section 103 and then decoded by the instruction decode section 105 to generate an operand and control signals. The instruction division control section 109 generates a division control signal based on the control signals and an operand selection section 107 generates an operand having a desired bit width by using the operand from the instruction decode section 105 based on the division control signal. An arithmetic section 111 divides the operand into a desired bit width parts based on the division control signal and performs arithmetic operation. A memory access control section 115 receives calculated address and transfers this calculated address and the division control signal to a memory. The memory access control section 115 receives data from the memory and transfers the data into the arithmetic result store section 113.