Patents by Inventor Mikkel Lantz

Mikkel Lantz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Validating process data in manufacturing process management
    Patent number: 6035293
    Abstract: An approach for managing a manufacturing process is provided. A specification and recipe management system (RSMS) manages the validation of new specifications that reference one or more recipes and one or more contexts stored in a recipe management system (RMS). The validation of new specifications includes verifying that RMS code blocks contained in the new specification can be processed by the RMS. Also, the versions of recipes and contexts referenced in the specification are checked to ensure that they are either the current, valid version number or a valid new version number. The RSMS provides a specification browser for examining cross-reference information for specifications, recipes and contexts. The cross-reference information specifies recipes and contexts referenced in a selected specification, subject to a recipe/context filter. In addition, the cross-reference information identifies specifications that reference a selected recipe or a selected context, subject to a specification filter.
    Type: Grant
    Filed: October 20, 1997
    Date of Patent: March 7, 2000
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Mikkel Lantz, John Shea, Valerie Guinan, Richard Bartlett
  • Method and apparatus for integrated control of a sensor in a manufacturing processing station
    Patent number: 5886896
    Abstract: A method and apparatus for manufacturing products is provided with a computer that controls a processing tool, and a sensor that senses an operating condition of the processing tool. The sensor is coupled to the computer so that the setup and operation of the sensor is controlled by the computer. The control of the sensor and the processing tool by the computer is performed according to a single recipe, thereby providing automatic setup of the sensor in addition to the processing tool. Information from the sensor gathered during the processing step is integrated into the database coupled to the computer to provide correlation between the sensor data and lot and entity records related to the products being manufactured by the processing tool.
    Type: Grant
    Filed: November 19, 1996
    Date of Patent: March 23, 1999
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Mikkel Lantz, John T. Shea
  • Method and apparatus for automated wafer level testing and reliability data analysis
    Patent number: 5822717
    Abstract: Methods and apparatus are disclosed for testing integrated circuits at the wafer level and for integrating test results, calculation of lifetimes and generation of trend charts in a common database following testing. A wafer tester controller is supplemented with additional hardware and software to avoid data transfer errors and facilitate processing and storage of test results. The data base is available over a network to all areas of an organization.
    Type: Grant
    Filed: July 31, 1995
    Date of Patent: October 13, 1998
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Jerry Tsiang, Mikkel Lantz, Yeng-Kaung Peng, Ying Shiau