Patents by Inventor Milind Khandekar

Milind Khandekar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for analyzing critical defects in analog integrated circuits
    Publication number: 20060171221
    Abstract: The present invention provides a method for analyzing critical defects in analog integrated circuits. The method for analyzing critical defects, among other possible steps, may include fault testing a power field effect transistor (120) portion of an analog integrated circuit (115) to obtain electrical failure data. The method may further include performing an in-line optical inspection of the analog integrated circuit (115) to obtain physical defect data, and correlating the electrical failure data and physical defect data to analyze critical defects.
    Type: Application
    Filed: January 31, 2005
    Publication date: August 3, 2006
    Applicant: Texas Instruments, Inc.
    Inventors: Martin Mollat, Milind Khandekar, Tony Phan, Kyle Flessner