Patents by Inventor Milton Hissasi Kataoka

Milton Hissasi Kataoka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11586476
    Abstract: An integrated circuit includes a primary initiator domain (ID) circuit including having a processor core, a responder domain (RD) control circuit, and a reset controller. Secondary ID circuits, each include a processor core and a reset controller. RD circuitry is coupled to communicate with the primary ID circuit and the secondary ID circuits and includes RD resource circuits. The RD control circuit is configured to allocate each of the RD resource circuits to a first initiator domain consisting of the primary ID circuit or one of the secondary ID circuits, and when one of the secondary ID circuits enters a reset mode of operation, the RD resource circuit allocated to the one of the secondary ID circuits enters a reset while the remaining RD resource circuits are not affected by the reset.
    Type: Grant
    Filed: May 24, 2021
    Date of Patent: February 21, 2023
    Assignee: NXP USA, Inc.
    Inventors: Mohit Arora, Milton Hissasi Kataoka, Marcos da Costa Barros, Tuongvu Van Nguyen, Rob Cosaro
  • Publication number: 20220374279
    Abstract: An integrated circuit includes a primary initiator domain (ID) circuit including having a processor core, a responder domain (RD) control circuit, and a reset controller. Secondary ID circuits, each include a processor core and a reset controller. RD circuitry is coupled to communicate with the primary ID circuit and the secondary ID circuits and includes RD resource circuits. The RD control circuit is configured to allocate each of the RD resource circuits to a first initiator domain consisting of the primary ID circuit or one of the secondary ID circuits, and when one of the secondary ID circuits enters a reset mode of operation, the RD resource circuit allocated to the one of the secondary ID circuits enters a reset while the remaining RD resource circuits are not affected by the reset.
    Type: Application
    Filed: May 24, 2021
    Publication date: November 24, 2022
    Inventors: Mohit Arora, Milton Hissasi Kataoka, Marcos da Costa Barros, Tuongvu Van Nguyen, Rob Cosaro
  • Patent number: 11366488
    Abstract: An integrated circuit includes a first processing domain configured to run a first operating system and a second processing domain configured to run a second operating system that is different than the first operating system. The integrated circuit further includes a time stamp timer circuit in the first processing domain configured to provide a first time stamp value to the first processing domain and an adjusted second time stamp value to the second processing domain. The time stamp timer circuit includes a timer adjust circuit configured to synchronize the adjusted second time stamp value when a power up signal is received by the time stamp timer circuit from the second processing domain.
    Type: Grant
    Filed: May 20, 2021
    Date of Patent: June 21, 2022
    Assignee: NXP USA, Inc.
    Inventors: Mohit Arora, Tuongvu Van Nguyen, Milton Hissasi Kataoka, Rob Cosaro, Shenwei Wang
  • Patent number: 10345379
    Abstract: An integrated circuit includes clock suppression circuitry that can suppress the launch pulse of an at-speed test to prevent scan test data from propagating from an output of a scan latch through a multi-clock cycle combinational logic path to a downstream scan latch during the at-speed test. The integrated circuit can also suppress the capture pulse of an at-speed test to prevents scan test data that is propagated from an upstream scan latch through a multi-cycle combinational logic path from being latched at the downstream latch during the at-speed test.
    Type: Grant
    Filed: November 20, 2017
    Date of Patent: July 9, 2019
    Assignee: NXP USA, Inc.
    Inventors: Alexandre Sansigolo Lujan, Milton Hissasi Kataoka, Rubens Takiguti
  • Publication number: 20190154757
    Abstract: An integrated circuit includes clock suppression circuitry that can suppress the launch pulse of an at-speed test to prevent scan test data from propagating from an output of a scan latch through a multi-clock cycle combinational logic path to a downstream scan latch during the at-speed test. The integrated circuit can also suppress the capture pulse of an at-speed test to prevents scan test data that is propagated from an upstream scan latch through a multi-cycle combinational logic path from being latched at the downstream latch during the at-speed test.
    Type: Application
    Filed: November 20, 2017
    Publication date: May 23, 2019
    Inventors: Alexandre Sansigolo Lujan, Milton Hissasi Kataoka, Rubens Takiguti