Patents by Inventor Min-Hua Hsieh

Min-Hua Hsieh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9612824
    Abstract: A firmware variable update method for BIOS of a computer system is provided. The firmware variable update method includes writing an update capsule file and a firmware update command into a memory according to a first system management interrupt signal and performing a shutdown process, triggering a second system management interrupt signal and accordingly writing a variable update command into the memory, switching the computer system into a sleep state before the shutdown process is completed and activating a timer, performing a first reboot process when the timer expires, utilizing the update capsule file to update an original capsule file of the BIOS according to the firmware update command during the first reboot process, and performing a second reboot process and utilizing an update variable file to update an original variable file of the BIOS according to the variable update command during the second reboot process.
    Type: Grant
    Filed: June 8, 2015
    Date of Patent: April 4, 2017
    Assignee: Wistron Corporation
    Inventors: Min-Hua Hsieh, Chun-Chang Li
  • Patent number: 9465707
    Abstract: The invention introduces a POST (power-On-Self-Test) debugging method, executed by a processing unit, which contains at least the following steps. A phase number indicative of a current POST phase is set. A driver is selected from a scheduled queue. A GUID (Globally Unique Identifier) of the driver is obtained. The phase number and the GUID are stored or output, so as to recognize the phase of the driver being interrupted upon a break point of the driver. After that, the driver is executed.
    Type: Grant
    Filed: December 31, 2014
    Date of Patent: October 11, 2016
    Assignee: WISTRON CORP.
    Inventors: Min Hua Hsieh, Yu Hong Chen
  • Publication number: 20160179500
    Abstract: A firmware variable update method for BIOS of a computer system is provided. The firmware variable update method includes writing an update capsule file and a firmware update command into a memory according to a first system management interrupt signal and performing a shutdown process, triggering a second system management interrupt signal and accordingly writing a variable update command into the memory, switching the computer system into a sleep state before the shutdown process is completed and activating a timer, performing a first reboot process when the timer expires, utilizing the update capsule file to update an original capsule file of the BIOS according to the firmware update command during the first reboot process, and performing a second reboot process and utilizing an update variable file to update an original variable file of the BIOS according to the variable update command during the second reboot process.
    Type: Application
    Filed: June 8, 2015
    Publication date: June 23, 2016
    Inventors: Min-Hua Hsieh, Chun-Chang Li
  • Publication number: 20160103747
    Abstract: The invention introduces a POST (power-On-Self-Test) debugging method, executed by a processing unit, which contains at least the following steps. A phase number indicative of a current POST phase is set. A driver is selected from a scheduled queue. A GUID (Globally Unique Identifier) of the driver is obtained. The phase number and the GUID are stored or output, so as to recognize the phase of the driver being interrupted upon a break point of the driver. After that, the driver is executed.
    Type: Application
    Filed: December 31, 2014
    Publication date: April 14, 2016
    Inventors: Min Hua HSIEH, Yu Hong CHEN
  • Patent number: 9036437
    Abstract: A method and an apparatus for testing a memory are provided, and the method is adapted for an electronic apparatus to test the memory. In the method, a left edge and a right edge of a first waveform of a clock signal for testing the memory are scanned to obtain a maximum width between two cross points of the left edge and the right edge. A central reference voltage of a data signal outputted by the memory is obtained, and a data width between two cross points of the central reference voltage and a left edge and a right edge of a second waveform of the data signal is obtained. Whether a difference between the data width and the maximum width is greater than a threshold is determined; if the difference is greater than the threshold, the memory is determined to be damaged.
    Type: Grant
    Filed: January 9, 2014
    Date of Patent: May 19, 2015
    Assignee: Wistron Corporation
    Inventor: Min-Hua Hsieh
  • Publication number: 20150092506
    Abstract: A method and an apparatus for testing a memory are provided, and the method is adapted for an electronic apparatus to test the memory. In the method, a left edge and a right edge of a first waveform of a clock signal for testing the memory are scanned to obtain a maximum width between two cross points of the left edge and the right edge. A central reference voltage of a data signal outputted by the memory is obtained, and a data width between two cross points of the central reference voltage and a left edge and a right edge of a second waveform of the data signal is obtained. Whether a difference between the data width and the maximum width is greater than a threshold is determined; if the difference is greater than the threshold, the memory is determined to be damaged.
    Type: Application
    Filed: January 9, 2014
    Publication date: April 2, 2015
    Applicant: Wistron Corporation
    Inventor: Min-Hua Hsieh