Patents by Inventor Min-Sheng Lin

Min-Sheng Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11978392
    Abstract: A precharge method for a data driver includes steps of: outputting a display data to a plurality of output terminals of the data driver; outputting a second precharge voltage to an output terminal among the plurality of output terminals prior to outputting the display data to the output terminal, to precharge the output terminal to a voltage level closer to an output voltage; and outputting a first precharge voltage to the output terminal prior to outputting the second precharge voltage. The first precharge voltage provides a faster voltage transition on the output terminal than the second precharge voltage.
    Type: Grant
    Filed: May 31, 2023
    Date of Patent: May 7, 2024
    Assignee: NOVATEK Microelectronics Corp.
    Inventors: Min-Yang Chiu, Yu-Sheng Ma, Jin-Yi Lin, Hsuan-Yu Chen, Jhih-Siou Cheng, Chun-Fu Lin
  • Patent number: 7516374
    Abstract: A testing method includes selecting a low-pass filter by simulation, generating testing signals with the low-pass filter receiving output signals of an under-test circuit, and outputting the testing signals to an input of the under-test circuit for predetermined measurements. A testing circuit and testing method achieve the same jitter injection as conventional high-speed testing instruments, but save testing cost.
    Type: Grant
    Filed: June 21, 2006
    Date of Patent: April 7, 2009
    Assignee: VIA Technologies Inc.
    Inventors: Jimmy Hsu, Min-Sheng Lin
  • Publication number: 20070061658
    Abstract: A testing method includes selecting a low-pass filter by simulation, generating testing signals with the low-pass filter receiving output signals of an under-test circuit, and outputting the testing signals to an input of the under-test circuit for predetermined measurements. A testing circuit and testing method achieve the same jitter injection as conventional high-speed testing instruments, but save testing cost.
    Type: Application
    Filed: June 21, 2006
    Publication date: March 15, 2007
    Inventors: Jimmy Hsu, Min-Sheng Lin