Abstract: Various embodiments of the present disclosure are directed towards an integrated chip (IC). The IC includes a first fin projecting vertically from a semiconductor substrate. A second fin projects vertically from the semiconductor substrate, where the second fin is spaced from the first fin, and where the first fin has a first uppermost surface that is disposed over a second uppermost surface of the second fin. A nanostructure stack is disposed over the second fin and vertically spaced from the second fin, where the nanostructure stack comprises a plurality of vertically stacked semiconductor nanostructures. A pair of first source/drain regions is disposed on the first fin, where the first source/drain regions are disposed on opposite sides of an upper portion of the first fin. A pair of second source/drain regions is disposed on the second fin, where the second source/drain regions are disposed on opposite sides of the nanostructure stack.

Abstract: One aspect of this description relates to a testing apparatus including an advance process control monitor (APCM) in a first wafer, a plurality of pads disposed over and coupled to the APCM. The plurality of pads are in a second wafer. The testing apparatus includes a testing unit disposed between the first wafer and the second wafer. The testing unit is coupled to the APCM. The testing unit includes a metal structure within a dielectric. The testing apparatus includes a plurality of through silicon vias (TSVs) extending in a first direction from the first wafer, through the dielectric of the testing unit, to the second wafer.

Abstract: According to the present disclosure, a measuring method of liquid mixture purity includes steps as follows. A storage tank is provided, wherein the storage tank is configured for storing a liquid mixture including formic acid and water. A calculating unit is provided, wherein a plurality of formic acid purity values are saved in the calculating unit. A pressure-decreasing and heating step is performed by reducing a pressure of the storage tank and heating the storage tank. A measuring step is performed by measuring in the inner space of the storage tank to obtain a pressure value, and measuring the liquid mixture simultaneously to obtain a temperature value. A calculating step is performed by inputting the pressure value and the temperature value into the calculating unit, wherein the calculating unit outputs one of the formic acid purity values corresponding thereto.

Abstract: A computer-aided design tool for automatically generating a layout for an electronic device to be formed by a set of objects implemented within an integrated circuit, receives input from a user defining a device template specifying shapes, dimensions and relative positions within the layout of the objects forming the device. Some of the object dimensions and/or relative positions are specified as functions of values of input parameters to be supplied by the user. When the user supplies the input parameters, the CAD tool evaluates the functions to determine the object dimensions and/or positions that are functions of the input parameters and then generates a layout for the electronic device wherein object shapes, dimensions and relative positions are as specified in the device template and consistent with the function evaluations.

Abstract: A computer-aided design tool for automatically generating a layout for an electronic device to be formed by a set of objects implemented within an integrated circuit, receives input from a user defining a device template specifying shapes, dimensions and relative positions within the layout of the objects forming the device. Some of the object dimensions and/or relative positions are specified as functions of values of input parameters to be supplied by the user. When the user supplies the input parameters, the CAD tool evaluates the functions to determine the object dimensions and/or positions that are functions of the input parameters and then generates a layout for the electronic device wherein object shapes, dimensions and relative positions are as specified in the device template and consistent with the function evaluations.