Patents by Inventor Mingchi Liu

Mingchi Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7231336
    Abstract: In accordance with the present invention there is provided a method for performing a glitch check in simulating a circuit. Current maximum and minimum values for optimization parameters of the circuit are determined. Next, a signal pulse characteristic for the circuit simulation is determined based on the maximum and minimum optimization parameters. A current averaged optimization parameter is determined from the current maximum and minimum optimization parameters. A prime criterion parameter is calculated based on the optimization parameters and the signal pulse characteristic value. If the prime criterion parameter converges into a specified range then measurement results from the circuit simulation are parsed and reported as final. If the prime criterion parameter does not converge, then the process continues by recalculating the optimization parameters until the prime criterion parameter converges.
    Type: Grant
    Filed: December 5, 2003
    Date of Patent: June 12, 2007
    Assignee: Legend Design Technology, Inc.
    Inventors: You-Pang Wei, Yuhung Liao, Mingchi Liu, YuJiao Ping
  • Patent number: 7203918
    Abstract: A method for performing a signal integrity and delay check for circuit simulations is disclosed. Nodes of the circuit are selected and an optimization parameter is determined. The optimization parameter may be either the setup or hold time for the circuit simulation. The current optimization parameter is determined to be the average of the current minimum and maximum optimization parameters. A primary criteria is calculated in response to the optimization parameters. The primary criteria may be a bisection error of the circuit simulation. If the primary criteria converges to a prescribed range, then the measurement results from the simulation are parsed. If the primary criteria does not converge, then the circuit is simulated using the current optimization parameter. For a signal integrity check, switch difference errors are identified and used to set a new optimization parameter. For a delay check, delay difference errors are identified and used to set a new optimization parameter.
    Type: Grant
    Filed: November 4, 2004
    Date of Patent: April 10, 2007
    Assignee: Legend Design Technology, Inc.
    Inventors: You-Pang Wei, George (Yuhung) Liao, Mickie (Mingchi) Liu, Yu-Jiao Ping
  • Patent number: 7131088
    Abstract: In accordance with the present invention there is provided a method for determining an optimized parameter for a circuit simulation. A circuit path for the simulation is determined, and maximum and minimum optimization parameters are decided. Next, the circuit path is simulated using the maximum optimization parameter. The circuit path is simulated using the minimum optimization parameter and a primary criteria parameter is also calculated. The simulations are compared to determine whether the same status (both succeed or both fail) is generated for both the minimum optimization parameter and the maximum optimization parameter. If the simulations do not indicate the same status, then the optimization parameter is recalculated and the circuit is simulated until the primary criteria parameter converges to a prescribed value.
    Type: Grant
    Filed: December 5, 2003
    Date of Patent: October 31, 2006
    Assignee: Legend Design Technology, Inc.
    Inventors: You-Pang Wei, Yuhung Liao, Mingchi Liu, YuJiao Ping
  • Publication number: 20050120317
    Abstract: A method for performing a signal integrity and delay check for circuit simulations is disclosed. Nodes of the circuit are selected and an optimization parameter is determined. The optimization parameter may be either the setup or hold time for the circuit simulation. The current optimization parameter is determined to be the average of the current minimum and maximum optimization parameters. A primary criteria is calculated in response to the optimization parameters. The primary criteria may be a bisection error of the circuit simulation. If the primary criteria converges to a prescribed range, then the measurement results from the simulation are parsed. If the primary criteria does not converge, then the circuit is simulated using the current optimization parameter. For a signal integrity check, switch difference errors are identified and used to set a new optimization parameter. For a delay check, delay difference errors are identified and used to set a new optimization parameter.
    Type: Application
    Filed: November 4, 2004
    Publication date: June 2, 2005
    Applicant: Legend Design Technology, Inc.
    Inventors: You-Pang Wei, George (Yuhung) Liao, Mickie (Mingchi) Liu, Yu-Jiao Ping
  • Publication number: 20050050498
    Abstract: In accordance with the present invention there is provided a method for determining an optimized parameter for a circuit simulation. A circuit path for the simulation is determined, and maximum and minimum optimization parameters are decided. Next, the circuit path is simulated using the maximum optimization parameter. The circuit path is simulated using the minimum optimization parameter and a primary criteria parameter is also calculated. The simulations are compared to determine whether the same status (both succeed or both fail) is generated for both the minimum optimization parameter and the maximum optimization parameter. If the simulations do not indicate the same status, then the optimization parameter is recalculated and the circuit is simulated until the primary criteria parameter converges to a prescribed value.
    Type: Application
    Filed: December 5, 2003
    Publication date: March 3, 2005
    Applicant: Legend Design Technology, Inc.
    Inventors: You-Pang Wei, Yuhung Liao, Mingchi Liu, YuJiao Ping
  • Publication number: 20050049844
    Abstract: In accordance with the present invention there is provided a method for performing a glitch check in simulating a circuit. Current maximum and minimum values for optimization parameters of the circuit are determined. Next, a signal pulse characteristic for the circuit simulation is determined based on the maximum and minimum optimization parameters. A current averaged optimization parameter is determined from the current maximum and minimum optimization parameters. A prime criterion parameter is calculated based on the optimization parameters and the signal pulse characteristic value. If the prime criterion parameter converges into a specified range then measurement results from the circuit simulation are parsed and reported as final. If the prime criterion parameter does not converge, then the process continues by recalculating the optimization parameters until the prime criterion parameter converges.
    Type: Application
    Filed: December 5, 2003
    Publication date: March 3, 2005
    Applicant: Legend Design Technology, Inc.
    Inventors: You-Pang Wei, Yuhung Liao, Mingchi Liu, YuJiao Ping
  • Publication number: 20050049845
    Abstract: In accordance with the present invention there is provided a method of simulating a memory circuit design in order to verify the signal strength of bit lines. The method begins by identifying circuit elements of the memory circuit design. Next, a memory circuit path is extracted from the circuit elements. The memory circuit is simulated and the maximum voltage difference between bit lines is measured. The maximum voltage difference is measured to a noise margin in order to verify the signal strength of the bit lines.
    Type: Application
    Filed: December 5, 2003
    Publication date: March 3, 2005
    Applicant: Legend Design Technology, Inc.
    Inventors: You-Pang Wei, Yuhung Liao, Mingchi Liu, YuJiao Ping
  • Publication number: 20050049846
    Abstract: There is provided a method of performing a timing soft error check on a simulated circuit. The method comprises creating a critical-path circuit or using a full-chip circuit to be analyzed of the circuit. Next, the circuit is simulated based on an initial minimum optimization parameter and an initial maximum optimization parameter. A maximum and minimum primary criterion parameter are calculated for each of the minimum and maximum optimization parameters. If the minimum and maximum optimization parameters do not indicate the same status (i.e., both succeed or both fail), then a new current optimization parameter is determined. The circuit is then simulated using the new current optimization parameter. If the simulation is successful, then a timing soft error check is performed. If the simulation is not successful, then it is determined if the primary criterion parameter is converging. If the primary criterion parameter is not converging, then the current optimization parameter is set to a new value.
    Type: Application
    Filed: December 5, 2003
    Publication date: March 3, 2005
    Applicant: Legend Design Technology, Inc.
    Inventors: You-Pang Wei, Yuhung Liao, Mingchi Liu, YuJiao Ping