Patents by Inventor Ming-Chun Chou
Ming-Chun Chou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240105121Abstract: An electronic device includes a substrate, a first silicon transistor, a second silicon transistor and a first oxide semiconductor transistor. The first silicon transistor, the second silicon transistor and the first oxide semiconductor transistor are disposed on the substrate. The first silicon transistor has a first terminal electrically connected to a first voltage level, a second terminal and a control terminal. The second silicon transistor has a first terminal electrically connected to the second terminal of the first silicon transistor, a second terminal electrically connected to a second voltage level, and a control terminal electrically connected to the control terminal of the first silicon transistor. The first oxide semiconductor transistor has a first terminal electrically connected to the first terminal of the second silicon transistor. Wherein, a voltage value of the first voltage level is greater than a voltage value of the second voltage level.Type: ApplicationFiled: December 6, 2023Publication date: March 28, 2024Inventors: Lien-Hsiang CHEN, Kung-Chen KUO, Ming-Chun TSENG, Cheng-Hsu CHOU, Kuan-Feng LEE
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Publication number: 20240085676Abstract: A light-folding element includes an object-side surface, an image-side surface, a reflection surface and a connection surface. The reflection surface is configured to reflect imaging light passing through the object-side surface to the image-side surface. The connection surface is connected to the object-side, image-side and reflection surfaces. The light-folding element has a recessed structure located at the connection surface. The recessed structure is recessed from the connection surface an includes a top end portion, a bottom end portion and a tapered portion located between the top end and bottom end portions. The top end portion is located at an edge of the connection surface. The tapered portion has two tapered edges located on the connection surface. The tapered edges are connected to the top end and bottom end portions. A width of the tapered portion decreases in a direction from the top end portion towards the bottom end portion.Type: ApplicationFiled: November 22, 2023Publication date: March 14, 2024Applicant: LARGAN PRECISION CO., LTD.Inventors: Min-Chun LIAO, Lin An CHANG, Ming-Ta CHOU, Jyun-Jia CHENG, Cheng-Feng LIN, Ming-Shun CHANG
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Patent number: 9313830Abstract: An induction heating cooker and a control circuit therefor are provided. The cooker includes a switch element and an inductive coil, which is coupled between a power voltage and a first terminal of the switch element. A second terminal of the switch element is coupled to a common voltage. The control circuit includes first and second comparators and a pulse generator. The first comparator receives voltages of two terminals of the inductive coil and thus outputs a trigger signal. The second comparator receives a reference voltage and a voltage of the first terminal of the switch element, and enables a fading signal when the voltage of the first terminal is higher than the reference voltage. When the trigger signal is enabled, the pulse generator outputs a pulse to control the switch element. When the fading signal is enabled, the pulse generator reduces a pulse width of the pulse.Type: GrantFiled: September 14, 2012Date of Patent: April 12, 2016Assignee: ELAN MICROELECTRONICS CORP.Inventors: Pei-Min Gong, Ming-Chun Chou, Hsiu Ju Yang
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Patent number: 8493700Abstract: A high-voltage NMOS transistor for ESD protection is coupled between a high-voltage I/O pad and a low-voltage terminal, and has a parasitic component between its source and drain. A trigger has an input coupled to the high-voltage I/O pad and an output coupled to the parasitic component. When the voltage on the high-voltage I/O pad raises above a threshold value, the trigger applies a voltage to trigger the parasitic component, so as to release an ESD current from the high-voltage I/O pad to the low-voltage terminal through the high-voltage NMOS transistor.Type: GrantFiled: November 1, 2011Date of Patent: July 23, 2013Assignee: Elan Microelectronics CorporationInventors: Wu-Tsung Hsihe, Ming-Chun Chou, Ming-Dou Ker
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Patent number: 8476563Abstract: An induction heating cooker includes a switch element and an inductive coil, which is coupled between a power voltage and a first terminal of the switch element. A second terminal of the switch element is coupled to a common voltage. A control circuit for controlling the inducting heating cooker includes first and second comparators and a pulse generator. The first comparator receives voltages of two terminals of the inductive coil and thus outputs a trigger signal. The second comparator receives a reference voltage and a voltage of the first terminal of the switch element, and enables a fading signal when the voltage of the first terminal is higher than the reference voltage. When the trigger signal is enabled, the pulse generator outputs a pulse to control the switch element. When the fading signal is enabled, the pulse generator reduces a pulse width of the pulse.Type: GrantFiled: September 30, 2008Date of Patent: July 2, 2013Assignee: Elan Microelectronics Corp.Inventors: Pei-Min Gong, Ming-Chun Chou, Hsiu Ju Yang
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Publication number: 20130008892Abstract: An induction heating cooker and a control circuit therefor are provided. The cooker includes a switch element and an inductive coil, which is coupled between a power voltage and a first terminal of the switch element. A second terminal of the switch element is coupled to a common voltage. The control circuit includes first and second comparators and a pulse generator. The first comparator receives voltages of two terminals of the inductive coil and thus outputs a trigger signal. The second comparator receives a reference voltage and a voltage of the first terminal of the switch element, and enables a fading signal when the voltage of the first terminal is higher than the reference voltage. When the trigger signal is enabled, the pulse generator outputs a pulse to control the switch element. When the fading signal is enabled, the pulse generator reduces a pulse width of the pulse.Type: ApplicationFiled: September 14, 2012Publication date: January 10, 2013Applicant: ELAN MICROELECTRONICS CORP.Inventors: Pei-Min GONG, Ming-Chun CHOU, Hsiu Ju YANG
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Patent number: 8164870Abstract: A high-voltage NMOS transistor for ESD protection is coupled between a high-voltage I/O pad and a low-voltage terminal, and has a parasitic component between its source and drain. A trigger has an input coupled to the high-voltage I/O pad and an output coupled to the parasitic component. When the voltage on the high-voltage I/O pad raises above a threshold value, the trigger applies a voltage to trigger the parasitic component, so as to release an ESD current from the high-voltage I/O pad to the low-voltage terminal through the high-voltage NMOS transistor.Type: GrantFiled: January 22, 2009Date of Patent: April 24, 2012Assignee: Elan Microelectronics CorporationInventors: Wu-Tsung Hsihe, Ming-Chun Chou, Ming-Dou Ker
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Publication number: 20120044605Abstract: A high-voltage NMOS transistor for ESD protection is coupled between a high-voltage I/O pad and a low-voltage terminal, and has a parasitic component between its source and drain. A trigger has an input coupled to the high-voltage I/O pad and an output coupled to the parasitic component. When the voltage on the high-voltage I/O pad raises above a threshold value, the trigger applies a voltage to trigger the parasitic component, so as to release an ESD current from the high-voltage I/O pad to the low-voltage terminal through the high-voltage NMOS transistor.Type: ApplicationFiled: November 1, 2011Publication date: February 23, 2012Applicant: ELAN MICROELECTRONICS CORPORATIONInventors: WU-TSUNG HSIHE, MING-CHUN CHOU, MING-DOU KER
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Publication number: 20090243714Abstract: A power noise immunity circuit includes a unidirectional device and a switch both connected between a power input terminal and a power output terminal, and a noise detector to control the switch. The power input terminal is for being connected to an external voltage source, and the power output terminal is for being connected to the circuit of an IC. The switch is normally closed and is opened by the noise detector if the noise detector detects power noise at the power input terminal. The power noise immunity circuit thus prevents the IC from power breakdown and provides a stable voltage thereto.Type: ApplicationFiled: March 24, 2009Publication date: October 1, 2009Inventors: Ming-Chun Chou, Chun-Chung Huang
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Publication number: 20090213508Abstract: A high-voltage NMOS transistor for ESD protection is coupled between a high-voltage I/O pad and a low-voltage terminal, and has a parasitic component between its source and drain. A trigger has an input coupled to the high-voltage I/O pad and an output coupled to the parasitic component. When the voltage on the high-voltage I/O pad raises above a threshold value, the trigger applies a voltage to trigger the parasitic component, so as to release an ESD current from the high-voltage I/O pad to the low-voltage terminal through the high-voltage NMOS transistor.Type: ApplicationFiled: January 22, 2009Publication date: August 27, 2009Inventors: Wu-Tsung Hsihe, Ming-Chun Chou, Ming-Dou Ker
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Publication number: 20090173732Abstract: The invention relates to an induction heating cooker and a control circuit therefor. The cooker includes a switch element and an inductive coil, which is coupled between a power voltage and a first terminal of the switch element. A second terminal of the switch element is coupled to a common voltage. The control circuit includes first and second comparators and a pulse generator. The first comparator receives voltages of two terminals of the inductive coil and thus outputs a trigger signal. The second comparator receives a reference voltage and a voltage of the first terminal of the switch element, and enables a fading signal when the voltage of the first terminal is higher than the reference voltage. When the trigger signal is enabled, the pulse generator outputs a pulse to control the switch element. When the fading signal is enabled, the pulse generator reduces a pulse width of the pulse.Type: ApplicationFiled: September 30, 2008Publication date: July 9, 2009Inventors: Pei-Min GONG, Ming-Chun Chou, Hsiu Ju Yang
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Publication number: 20050229950Abstract: A method, device, and system for positioning a brush of a wafer cleaning system. In the method, device, and system one or more light sources are positioned to generate one or more light beams across a plane. One or more light detectors are positioned to detect when the light beams are interrupted by the brush as it advances toward the plane.Type: ApplicationFiled: April 14, 2004Publication date: October 20, 2005Inventors: Ming-Chun Chou, Brian Petersen
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Patent number: 6778285Abstract: A method for measuring a thickness of a photolithography element, such as a pellicle, includes projecting a light beam from a first side of the pellicle and at a plane above a first surface of the pellicle, projecting the light beam from the first side of the pellicle and at a plane corresponding to a plane of the pellicle, and projecting the light beam from the first side of the pellicle and at a plane below a second surface of the pellicle. The light beam can be projected from a laser light source. The light beams are projected at different media above and below the pellicle. The light beams pass through the first side of the different media and exit at a second side opposite to the first side at different intensities. The light beam may not pass through the pellicle if the light beam is incident to an opaque pellicle frame, and thus has minimal intensity at the second side.Type: GrantFiled: January 21, 2000Date of Patent: August 17, 2004Assignee: Wafertech, Inc.Inventors: Phong Nguyen, Ming-Chun Chou, Marvin Mills
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Patent number: 6433575Abstract: A cathode-anode apparatus is constructed whereby the wafer under test, connected to a conducting wire, forms the cathode terminal and a copper plate, also connected to a conducting wire, forms the anode terminal. The wafer under test and the copper plate are immersed in a CuSO4—H2O solution. A positive dc voltage is applied to the copper plate; the dc current ionizes the CuSO4 solution and forms Cu2+ ions. These Cu2+ ions will diffuse to the wafer surface. Most of the Cu2+ ions will accumulate in and around defective contacts or vias in the semiconductor surface making these defective contacts or vias readily identifiable.Type: GrantFiled: March 13, 2001Date of Patent: August 13, 2002Assignee: Taiwan Semiconductor Manufacturing CompanyInventors: Ming-Chun Chou, Huai-Jen Shu
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Patent number: 6420703Abstract: A method for forming a critical dimension scanning electron microscope calibration standard and standard formed are disclosed. In the method, a plurality of metal lines, i.e. formed of a suitable metal such as W, Pt, Au, Ta or Ti, for use as critical dimension SEM calibration is formed by a focused ion beam technique to produce straight, narrow lines with an edge roughness of less than 30 nm in a 0.5 &mgr;m length. The plurality of metal lines has a line width uniformity of less than 20 nm in a length of 20 &mgr;m.Type: GrantFiled: June 1, 2000Date of Patent: July 16, 2002Assignee: Taiwan Semiconductor Manufacturing Co., LtdInventors: Chia-Fang Wu, Ming-Chun Chou
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Publication number: 20010016420Abstract: A cathode-anode apparatus is constructed whereby the wafer under test, connected to a conducting wire, forms the cathode terminal and a copper plate, also connected to a conducting wire, forms the anode terminal. The wafer under test and the copper plate are immersed in a CuSO4—H2O solution. A positive dc voltage is applied to the copper plate, the dc current ionizes the CUSO4 solution and forms Cu2+ ions. These Cu2+ ions will diffuse to the wafer surface. Defects in the glassification surface will absorb most of the Cu2+ ions, concentrations of Cu2 ions will therefore from around these defects.Type: ApplicationFiled: May 2, 2001Publication date: August 23, 2001Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANYInventor: Ming-Chun Chou
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Publication number: 20010016365Abstract: A cathode-anode apparatus is constructed whereby the wafer under test, connected to a conducting wire, forms the cathode terminal and a copper plate, also connected to a conducting wire, forms the anode terminal. The wafer under test and the copper plate are immersed in a CuSO4—H2O solution. A positive dc voltage is applied to the copper plate; the dc current ionizes the CuSO4 solution and forms Cu2+ ions. These Cu2+ ions will diffuse to the wafer surface. Most of the Cu2+ ions will accumulate in and around defective contacts or vias in the semiconductor surface making these defective contacts or vias readily identifiable.Type: ApplicationFiled: March 13, 2001Publication date: August 23, 2001Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANYInventors: Ming-Chun Chou, Huai-Jen Shu
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Patent number: 6261852Abstract: A cathode-anode apparatus is constructed whereby the wafer under test, connected to a conducting wire, forms the cathode terminal and a copper plate, also connected to a conducting wire, forms the anode terminal. The wafer under test and the copper plate are immersed in a CuSO4—H2O solution. A positive dc voltage is applied to the copper plate; the dc current ionizes the CuSO4 solution and forms Cu2+ ions. These Cu2+ ions will diffuse to the wafer surface. Most of the Cu2+ ions will accumulate in and around defective contacts or vias in the semiconductor surface making these defective contacts or vias readily identifiable.Type: GrantFiled: April 19, 1999Date of Patent: July 17, 2001Assignee: Taiwan Semiconductor Manufacturing CompanyInventors: Ming-Chun Chou, Huai-Jen Shu
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Patent number: 6248601Abstract: A cathode-anode apparatus is constructed whereby the wafer under test, connected to a conducting wire, forms the cathode terminal and a copper plate, also connected to a conducting wire, forms the anode terminal. The wafer under test and the copper plate are immersed in a CuSO4—H2O solution. A positive dc voltage is applied to the copper plate, the dc current ionizes the CuSO4 solution and forms Cu2+ ions. These Cu2+ ions will diffuse to the wafer surface. Defects in the glassification surface will absorb most of the Cu2+ ions, concentrations of Cu2+ ions will therefore from around these defects.Type: GrantFiled: April 19, 1999Date of Patent: June 19, 2001Assignee: Taiwan Semiconductor Manufacturing CompanyInventor: Ming-Chun Chou