Abstract: A tool box assembly has at least one tool box, and each tool box has a container, at least one first assembling structure, at least one second assembling structure, and at least one drawer. The container of each tool box has a base and a surrounding wall erectly disposed at the base. Each second assembling structure is configured to engage with each first assembling structure. The at least one drawer of each tool box is disposed within the container of the tool box and is able to enter or exit from the container via a front opening of the container.

Abstract: A test system includes a plurality of test core devices and a plurality of first buses. The plurality of test core devices are electrically connected to a device under test (DUT). The plurality of first buses are electrically connected to the test core devices, where at least one set of test core devices selected from the plurality of test core devices are merged to be a merged test core device through one or more of the plurality of first buses.

Abstract: A test system includes a plurality of test core devices and a plurality of first buses. The plurality of test core devices are electrically connected to a device under test (DUT). The plurality of first buses are electrically connected to the test core devices, where at least one set of test core devices selected from the plurality of test core devices are merged to be a merged test core device through one or more of the plurality of first buses.

Abstract: A tool box has a box body and a handle. The box body has a mounting portion mounted at the box body. The mounting portion has an upper positioning recess and a lower positioning recess. The handle has a holding portion, a connecting portion, and a marking portion. The holding portion is an elongated board and is engaged with the lower positioning recess, a cross section of the holding portion being U-shaped with an opening facing upward. The connecting portion is formed at an inner end of the holding portion and is an upright board. The marking portion is formed at a top portion of the connecting portion and is an elongated board and is engaged with the upper positioning recess, a cross section of the marking portion being U-shaped with an opening facing downward.

Abstract: A positioning pad has a pad body and a coat layer. The pad body is made of a foaming material, is formed as a board, and has at least one tool recess defined in a top of the pad body. The coat layer is attached to the top of the pad body and has at least one window and a 3D (three dimensional) embossing pattern. The at least one window is defined through the coat layer and corresponds respectively to the at least one tool recess in the pad body in position and shape. The 3D embossing pattern is formed on a top of the coat layer and has multiple embossing units. Each embossing unit has an outer frame and a decorating surface enclosed by the outer frame.

Abstract: A stackable toolbox has a body and an engaging block rotatably mounted on the body. The body has corresponding engaging grooves of two first recesses and engaging ribs of two first protrusions in positions away from the engaging block. When two toolboxes are stacked up with each other, the engaging ribs of the first protrusions of one of the toolboxes are mounted in and engaged with the engaging grooves of the first recesses of the other toolbox, and the engaging block is turned to engage with the engaging bumps of the toolboxes. Multiple stackable toolboxes may be stacked and be lifted together.

Abstract: An electrical connection defect simulation test method is provided. The electrical connection state simulation test method includes the steps as follows. A device under test is provided, wherein the device under test includes a plurality of pin groups each having a plurality of signal pins. A zero-frequency signal is transmitted from a signal-feeding device to each of the signal pins to simulate an open condition. An open test is performed on each of the signal pins. The signal pins of the device under test are connected to a relay matrix. The relay matrix is controlled to make any two of the signal pins in one of the pin groups electrically connected to simulate a short condition. A short test is performed on any two of the electrically connected signal pins. An electrical connection state simulation test system is disclosed herein as well.

Abstract: An electrical connection defect simulation test method is provided. The electrical connection state simulation test method includes the steps as follows. A device under test is provided, wherein the device under test includes a plurality of pin groups each having a plurality of signal pins. A zero-frequency signal is transmitted from a signal-feeding device to each of the signal pins to simulate an open condition. An open test is performed on each of the signal pins. The signal pins of the device under test are connected to a relay matrix. The relay matrix is controlled to make any two of the signal pins in one of the pin groups electrically connected to simulate a short condition. A short test is performed on any two of the electrically connected signal pins. An electrical connection state simulation test system is disclosed herein as well.