Abstract: A device for Over-the-Air testing includes a carrier unit, an automatic positioning member and a housing unit. The automatic positioning member is adapted to convey an object under test to an electrical connection zone of the carrier. The housing unit includes a housing shell, a pressing plate and a receiver. The housing shell defines a testing space that has an open end where the pressing plate is disposed. The housing unit and the carrier unit are movable relative to each other. When the carrier unit abuts the housing unit, the object under test is exposed to the testing space and is pressed against the electrical connection zone by the pressing plate so that electromagnetic waves from the object under test are received by the receiver.

Abstract: A wafer transferring device adapted to suck and transfer a first wafer is provided. The wafer transferring device includes an arm and a supporting carrier. The supporting carrier is connected to the arm. The supporting carrier has a single vacuum suction port exposed to an upper surface of the supporting carrier. The supporting carrier is adapted to move to a position below the first wafer. The single vacuum suction port is adapted to suck a first central region of the first wafer so as to lift up and transfer the first wafer.

Abstract: Each of a method for fabricating a single microelectronic product within a plurality of fabrication facilities and a system for fabricating the single microelectronic product within the plurality of fabrication facilities employs a benchmarking of a tool utilization factor for a specific comparable tool group employed for fabricating the single microelectronic product. The benchmarking provides for development and implementation of revised tool operating procedures within the specific comparable tool group such as to effect optimized tool utilization factors within the specific comparable tool group.

Abstract: To allocate products for machines on a manufacturing line, provide a standard test time. Minimize total test time with respect to production scheduling. Form a supply demand matrix table for products and machines for product allocation. Find the grid location with minimum testing time. Provide maximum time allocation from a machine at the corresponding position on the matrix table. Determine the grid location with the next minimum testing time. Loop back to provide a maximum allocation of remaining time from the corresponding machine and repeat looping back until no demand is left. Find need for an optimum testing process by testing whether only one machine can test the product and no quantity is allocated to a machine. If YES branch to calculate utilization per machine. If NO, decide whether NCOL+NLIN−1=NVB. If YES perform optimum testing. If NO, branch to calculate machine utilization per machine.

Abstract: A method for automatic scheduling of a production plan. The automatic scheduling system arranges different kinds of production plans and defines a first priority lot, a second priority lot and a normal lot in testing factories. The testing processes of the first priority lot is to decide the testing machine first, then exchanged with a running lot on this testing machine when a test piece is completed. For the second priority lot, after decides the testing machine, the second priority lot is exchanged with a running lot on the testing machine when the running lot is completed. For the normal lot, the procedure is to check if the testing machine is available and need to be setup, then use a setup reduce method to reduce the setup frequency if more than one machine is available and needs to be setup. The key to reduce setup method selects the testing machine which has minimum impact for the subsequent testing lot to get efficient use of the testing machine.

Abstract: A manufacturing control and reporting method/system for manufacture of semiconductor devices comprises a system for loading a mechanical article handling device in a semiconductor manufacturing system, provides an automatic check-in and changing equipment status to an UP status, automatically checking whether the article handling system is empty, and for automatically changing the system status to an IDLE status. The system provides automatic check-in, and subsequent to processing of the workload by the plant provides track-out followed by automatically checking whether the article handling system is empty. Then the system checking whether a TE has arrived, and the system checks whether the TE has reloaded the article handling system.