Abstract: The invention relates to an apparatus and a system for debugging a solid-state disk (SSD) device. The apparatus includes a Joint Test Action Group (JTAG) add-on board; and a Raspberry Pi. The Raspberry Pi includes a General-Purpose Input/Output (GPIO) interface (I/F), coupled to the JTAG add-on board; and a processing unit, coupled to the GPIO I/F. The processing unit is arranged operably to: simulate to issue a plurality of JTAG command through the GPIO I/F to the SSD device for dumping data generated by the SSD device during operation from the SSD device.

Abstract: The invention relates to an apparatus and a system for debugging a solid-state disk (SSD) device. The apparatus includes a Joint Test Action Group (JTAG) add-on board; and a Raspberry Pi. The Raspberry Pi includes a General-Purpose Input/Output (GPIO) interface (I/F), coupled to the JTAG add-on board; and a processing unit, coupled to the GPIO I/F. The processing unit is arranged operably to: simulate to issue a plurality of JTAG command through the GPIO I/F to the SSD device for dumping data generated by the SSD device during operation from the SSD device.

Abstract: A storage device is provided. The storage device includes a first connector, a second connector, and a memory circuit. The first connector is selectively electrically connected to a first electronic device. The second connector is selectively electrically connected to a second electronic device. The memory circuit is disposed between the first connector and the second connector. When the first connector is electrically connected to a first electronic device and the second connector is electrically connected to a second electronic device, the second connector is switched to a charge mode from a device mode, so that the first electronic device charges the second electronic device through the storage device, the second electronic device does not provide power to the storage device through the storage device, and the first electronic device accesses data in the storage device through the first connector.

Abstract: A storage device is provided. The storage device includes a first connector, a second connector, and a memory circuit. The first connector is selectively electrically connected to a first electronic device. The second connector is selectively electrically connected to a second electronic device. The memory circuit is disposed between the first connector and the second connector. When the first connector is electrically connected to a first electronic device and the second connector is electrically connected to a second electronic device, the second connector is switched to a charge mode from a device mode, so that the first electronic device charges the second electronic device through the storage device, the second electronic device does not provide power to the storage device through the storage device, and the first electronic device accesses data in the storage device through the first connector.

Abstract: A system, a testing apparatus, and a method for testing at least one device with a connection interface are provided. The system comprises a host, a testing apparatus, and a power supply. The testing apparatus further comprises a microprocessor and at least one current limit module. The host sending a test signal. The power supply provides a voltage to the testing apparatus. The at least one current limit module of the testing apparatus, which is electrically connected to the microprocessor, the at least one device, and the power supply, provides the voltage to the at least one device. When the current passing through the at least one device is greater than the predetermined value, the at least one current limit module of the testing apparatus stops providing the voltage to the at least one device and sends an over current signal to the host via the microprocessor.