Patents by Inventor Ming-Li Shiu

Ming-Li Shiu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test method of test plan
    Patent number: 11436115
    Abstract: The present disclosure discloses a design and test method of a test plan. The test plan includes the plurality of input parameters, the plurality of output parameters, the plurality of system parameters, all of the numerical levels or the types of each input parameter, each output parameter and each system parameter. The test plan includes a plurality of test cases to cover combination conditions including a great number of the input parameters, the output parameters and the system parameters and their dynamic cross of the parameters. The design and test method performs the test cases of the test plan on the product automatically by considering overall possibly parameters and their levels associated with the product. The overall possibly parameters and their levels associated with the product can be tested before the product is dispatched to the customer so as to enhance the product quality.
    Type: Grant
    Filed: August 15, 2019
    Date of Patent: September 6, 2022
    Assignee: DELTA ELECTRONICS (THAILAND) PUBLIC COMPANY LIMITED
    Inventors: Chin Huat Lim, Ming-Li Shiu, Adisak Paepoot, Narut Udomchoke
  • DESIGN AND TEST METHOD OF TEST PLAN
    Publication number: 20200250057
    Abstract: The present disclosure discloses a design and test method of a test plan. The test plan includes the plurality of input parameters, the plurality of output parameters, the plurality of system parameters, all of the numerical levels or the types of each input parameter, each output parameter and each system parameter. The test plan includes a plurality of test cases to cover combination conditions including a great number of the input parameters, the output parameters and the system parameters and their dynamic cross of the parameters. The design and test method performs the test cases of the test plan on the product automatically by considering overall possibly parameters and their levels associated with the product. The overall possibly parameters and their levels associated with the product can be tested before the product is dispatched to the customer so as to enhance the product quality.
    Type: Application
    Filed: August 15, 2019
    Publication date: August 6, 2020
    Inventors: Chin Huat Lim, Ming-Li Shiu, Adisak Paepoot, Narut Udomchoke