Abstract: A method for generating code assistance information comprises: obtaining input status information corresponding to a program development process, wherein the input status information comprises input content information and input language environment information; obtaining a preset grammar rule corresponding to the input status information, wherein the preset grammar rule stores an association relationship between different statement information, and different input status information corresponds to different preset grammar rules; and generating code assistance information corresponding to the input content information according to the input content information and the preset grammar rule corresponding to the input status information.

Abstract: A downhole power generation system is disclosed, which includes a power generation module for providing power to a load, comprising a turbine driven by flow of a downhole fluid to rotate, a generator coupled with the turbine for converting rotational energy from the turbine to electrical energy, and an AC-DC rectifier coupled with the generator for converting an alternating current voltage from the generator to a direct current voltage, and a power conversion circuit coupling the AC-DC rectifier with the load. The power conversion circuit is configured for providing a first power to the load when the load is in a working mode and providing a second power to the load when the load is in a non-working mode. The second power is less than the first power. A downhole power generation method is also disclosed.

Abstract: A system includes an inert gas supply, a soak chamber, a test chamber, a transfer zone, and a heater. The soak chamber soaks an integrated circuit (IC) device in the inert gas prior to testing. The test chamber includes contact pins for testing the IC device in the inert gas by contacting the contact pins to leads of the IC device. The transfer zone is to transfer the IC device from the soak chamber to the test chamber. The heater heats the inert gas supplied to the soak chamber and the test chamber.

Abstract: A method for generating code assistance information comprises: obtaining input status information corresponding to a program development process, wherein the input status information comprises input content information and input language environment information; obtaining a preset grammar rule corresponding to the input status information, wherein the preset grammar rule stores an association relationship between different statement information, and different input status information corresponds to different preset grammar rules; and generating code assistance information corresponding to the input content information according to the input content information and the preset grammar rule corresponding to the input status information.

Abstract: A system includes an inert gas supply, a soak chamber, a test chamber, a transfer zone, and a heater. The soak chamber soaks an integrated circuit (IC) device in the inert gas prior to testing. The test chamber includes contact pins for testing the IC device in the inert gas by contacting the contact pins to leads of the IC device. The transfer zone is to transfer the IC device from the soak chamber to the test chamber. The heater heats the inert gas supplied to the soak chamber and the test chamber.

Abstract: The disclosure relates to a method and device for displaying logistics information, and computer readable storage medium. The method includes acquiring a logistics waybill identifier of at least one item from at least one e-commerce client that is installed on an operating system of a terminal and is configured to display a logistics page; acquiring logistics information corresponding to the logistics waybill identifier, wherein the logistics information indicates a logistics progress of the at least one item; aggregating the acquired logistics information of the at least one item; and displaying the aggregated logistics information in a preset display area provided by the operating system.

Abstract: A method is provided for optimizing a contrast injection function for CT imaging. The method includes injecting, with an injector pump, a test bolus of a contrast agent into a subject. The method also includes computing, on a processor, an impulse enhancement function. The method also includes determining, on a processor, a target enhancement function for a region of interest. The method also includes determining, with a processor, a plurality of parameters for a functional form for a contrast injection function in a time domain. The method also includes determining for the contrast injection function a constraint. The method also includes determining, with a processor, particular values for the plurality of parameters, which satisfy the constraint and minimize a difference between a value of an enhancement function and the target enhancement function computed in the time domain at discrete time periods without use of a Fourier transform.

Abstract: A test apparatus includes a multi-channel probe plate having an electrically insulating body with opposing first and second main surfaces, and a plurality of spaced apart electrically conductive coupling regions embedded in or attached to the body at the first main surface. Each of the electrically conductive coupling regions is configured to cover a different zone of a semiconductor package when the semiconductor package is positioned in close proximity to the first main surface of the plate. The test apparatus further includes circuitry electrically connected to each of the coupling regions of the probe plate via a different channel. The circuitry is operable to measure a parameter indicative of the degree of capacitive coupling between each electrically conductive coupling region of the probe plate and the zone of the semiconductor package covered by the corresponding electrically conductive coupling region.

Abstract: A system and a method for capacitive testing a component (including a packaged component) are disclosed. An embodiment of a test head comprises a holding unit configured to pick-up, hold and release the component, an electrode configured to receive a capacitive signal from the component and a preamplifier configured to amplify the capacitive signal.

Abstract: A test apparatus includes a multi-channel probe plate having an electrically insulating body with opposing first and second main surfaces, and a plurality of spaced apart electrically conductive coupling regions embedded in or attached to the body at the first main surface. Each of the electrically conductive coupling regions is configured to cover a different zone of a semiconductor package when the semiconductor package is positioned in close proximity to the first main surface of the plate. The test apparatus further includes circuitry electrically connected to each of the coupling regions of the probe plate via a different channel. The circuitry is operable to measure a parameter indicative of the degree of capacitive coupling between each electrically conductive coupling region of the probe plate and the zone of the semiconductor package covered by the corresponding electrically conductive coupling region.

Abstract: A method is provided for optimizing a contrast injection function for CT imaging. The method includes injecting, with an injector pump, a test bolus of a contrast agent into a subject. The method also includes computing, on a processor, an impulse enhancement function. The method also includes determining, on a processor, a target enhancement function for a region of interest. The method also includes determining, with a processor, a plurality of parameters for a functional form for a contrast injection function in a time domain. The method also includes determining for the contrast injection function a constraint. The method also includes determining, with a processor, particular values for the plurality of parameters, which satisfy the constraint and minimize a difference between a value of an enhancement function and the target enhancement function computed in the time domain at discrete time periods without use of a Fourier transform.

Abstract: A multi-channel probe plate includes an electrically insulating body with opposing first and second main surfaces, and a plurality of spaced apart electrically conductive coupling regions embedded in or attached to the body at the first main surface. Each of the coupling regions covers a different zone of a semiconductor package when the package is positioned in close proximity to the first main surface of the plate. Circuitry electrically connected to each of the coupling regions of the probe plate via a different channel is operable to: measure a parameter indicative of the degree of capacitive coupling between each coupling region of the probe plate and the zone of the semiconductor package covered by the corresponding coupling region; provide a capacitance signal based on the parameter measured for each of the coupling regions of the probe plate; and select different ones of the capacitance signals for analysis.

Abstract: A measuring device is provided, the measuring device including: a power supply to provide electric power to a chip via at least one of a chip connection and a chip-carrier connection; a chip arrangement receiving portion configured to receive a chip arrangement, the chip arrangement including a chip and a plurality of chip-to-chip-carrier connections; a detection portion including: a plate; a detection circuit coupled to the plate and configured to detect an electrical signal from the plate; wherein the plate is configured such that it covers at least part of the chip arrangement; and wherein at least one chip-carrier connection is in electrical connection with the plate.

Abstract: A multi-channel probe plate includes an electrically insulating body with opposing first and second main surfaces, and a plurality of spaced apart electrically conductive coupling regions embedded in or attached to the body at the first main surface. Each of the coupling regions covers a different zone of a semiconductor package when the package is positioned in close proximity to the first main surface of the plate. Circuitry electrically connected to each of the coupling regions of the probe plate via a different channel is operable to: measure a parameter indicative of the degree of capacitive coupling between each coupling region of the probe plate and the zone of the semiconductor package covered by the corresponding coupling region; provide a capacitance signal based on the parameter measured for each of the coupling regions of the probe plate; and select different ones of the capacitance signals for analysis.

Abstract: A measuring device is provided: the measuring device including: a power supply configured to provide electric power to a chip via at least one of a chip connection and a chip-carrier connection; a chip arrangement receiving portion configured to receive a chip arrangement, the chip arrangement including a chip and a chip-carrier connected to the chip via one or more chip-to-chip-carrier connections; a detection portion including a plate; a detection circuit coupled to the plate and configured to detect an electrical signal from the plate; wherein the plate is configured such that it covers at least part of at least one of the chip, the chip-carrier, and the chip-to-chip-carrier connection; and wherein the plate is further configured such that at least part of the at least one of the chip, the chip-carrier, and the chip-to-chip-carrier connection is uncovered by the plate.

Abstract: According to one embodiment, an apparatus stores a plurality of datapoints. A datapoint comprises a first value and a second value that depends upon the value of the first value. The apparatus associates the datapoint with a group from a plurality of groups. The group is associated with an identifying range and the datapoint is associated with the group based at least in part upon the first value of the datapoint and the identifying range of the group. The apparatus calculates a median of the second values of the datapoints associated with the group and a performance value by performing a regression based at least in part upon the identifying range and the calculated median of the group. The apparatus determines that the performance value exceeds a baseline value and in response, presents, on a display, an illustration depicting the identifying range and the associated median of the group.

Abstract: According to one embodiment, an apparatus stores a plurality of datapoints. A datapoint comprises a first value and a second value that depends upon the value of the first value. The apparatus associates the datapoint with a group from a plurality of groups. The group is associated with an identifying range and the datapoint is associated with the group based at least in part upon the first value of the datapoint and the identifying range of the group. The apparatus calculates a median of the second values of the datapoints associated with the group and a performance value by performing a regression based at least in part upon the identifying range and the calculated median of the group. The apparatus determines that the performance value exceeds a baseline value and in response, presents, on a display, an illustration depicting the identifying range and the associated median of the group.

Abstract: A system and a method for capacitive testing a component (including a packaged component) are disclosed. An embodiment of a test head comprises a holding unit configured to pick-up, hold and release the component, an electrode configured to receive a capacitive signal from the component and a preamplifier configured to amplify the capacitive signal.

Abstract: A measuring device is provided: the measuring device including: a power supply configured to provide electric power to a chip via at least one of a chip connection and a chip-carrier connection; a chip arrangement receiving portion configured to receive a chip arrangement, the chip arrangement including a chip and a chip-carrier connected to the chip via one or more chip-to-chip-carrier connections; a detection portion including a plate; a detection circuit coupled to the plate and configured to detect an electrical signal from the plate; wherein the plate is configured such that it covers at least part of at least one of the chip, the chip-carrier, and the chip-to-chip-carrier connection; and wherein the plate is further configured such that at least part of the at least one of the chip, the chip-carrier, and the chip-to-chip-carrier connection is uncovered by the plate.

Abstract: A measuring device is provided, the measuring device including: a power supply to provide electric power to a chip via at least one of a chip connection and a chip-carrier connection; a chip arrangement receiving portion configured to receive a chip arrangement, the chip arrangement including a chip and a plurality of chip-to-chip-carrier connections; a detection portion including: a plate; a detection circuit coupled to the plate and configured to detect an electrical signal from the plate; wherein the plate is configured such that it covers at least part of the chip arrangement; and wherein at least one chip-carrier connection is in electrical connection with the plate.