Abstract: A semiconductor integrated circuit includes an incorporated memory unit, a first register unit for storing data to be written in the memory unit as a test circuit for the memory unit, a second register unit for storing a value read out from the memory unit, a comparator unit for comparing values of the first and second register units, and an address generator for generating an address signal of the memory unit on the basis of an external input clock pulse. The memory unit includes a plurality of memories, and the address generator has a memory selector for selecting, among the plurality of memories, a specific one on the basis of the clock pulse. The semiconductor integrated circuit also includes a write control unit and read control unit. The write control unit writes data stored in the first register unit, at an address corresponding to an address signal generated by the address generator.