Patents by Inventor Minoru Niigaki

Minoru Niigaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5959400
    Abstract: The present invention relates to an electron tube having a configuration which can maintain its operating stability for a long period of time. The electron tube comprises, at least, a field emitter which is made of diamond or a material mainly composed of diamond and has a surface terminated with hydrogen, and a sealed envelope for accommodating the diamond field emitter. Due to the hydrogen termination, the electron affinity of the diamond field emitter is set to a negative state. Also, hydrogen is enclosed within the sealed envelope. Due to this configuration, the hydrogen-terminated state of the diamond field emitter surface is stabilized, and the electron affinity of the diamond emitter is restrained from changing for a long period of time.
    Type: Grant
    Filed: October 14, 1997
    Date of Patent: September 28, 1999
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Minoru Niigaki, Toru Hirohata, Hirofumi Kan, Masami Yamada
  • Patent number: 5923045
    Abstract: Formed on a semiconductor substrate (10) is a first semiconductor layer (20; light absorbing layer) of p-type which has a first dopant concentration and generates an electron in response to light incident. Formed on the first semiconductor layer (20) is a second semiconductor layer (30; electron transfer layer) of p-type having a second dopant concentration lower than the first dopant concentration. A contact layer (50) forms a pn junction with the p-type second semiconductor layer (30). A surface electrode (80) is formed on and in ohmic contact with the contact layer (50). A third semiconductor layer (40; activation layer) is formed within an opening of the contact layer (50) on the surface of the second semiconductor layer (30). Embedded in the second semiconductor layer (30) is a semiconductor section (60; channel grid) having a third dopant concentration.
    Type: Grant
    Filed: May 28, 1997
    Date of Patent: July 13, 1999
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Tokuaki Nihashi, Minoru Niigaki
  • Patent number: 5747826
    Abstract: The present invention provides a photoemission device excellent in quantum efficiency of photoelectric conversion, a high-sensitive electron tube employing it, and a high-sensitive photodetecting apparatus. A photoemission device of the present invention is arranged to have a photon absorbing layer for absorbing incident photons to excite photoelectrons, an insulator layer layered on one surface of the photon absorbing layer, a lead electrode layered on the insulator layer, and a contact formed on the other surface of the photon absorbing layer to apply a predetermined polarity voltage between the lead electrode and the other surface of the photon absorbing layer, whereby the photoelectrons excited by the incident photons entering the photon absorbing layer and moving toward the one side are made to be emitted by an electric field formed between the lead electrode and the one surface by the predetermined polarity voltage.
    Type: Grant
    Filed: June 27, 1996
    Date of Patent: May 5, 1998
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Minoru Niigaki, Toru Hirohata, Tuneo Ihara, Masami Yamada
  • Patent number: 5710435
    Abstract: A photoelectric emission surface which is excellent in stability and reproducibility of photoelectric conversion characteristics and has a structure capable of obtaining a high photosensitivity is provided. A predetermined voltage is applied between an upper surface electrode and a lower surface electrode by a battery. Upon application of this voltage, a p-n junction formed between a contact layer and an electron emission layer is reversely biased. A depletion layer extends from the p-n junction into the photoelectric emission surface, and an electric field is formed in the electron emission layer and a light absorbing layer in a direction for accelerating photoelectrons. When incident light is absorbed in the light absorbing layer to excite photoelectrons, the photoelectrons are accelerated by the electric field toward the emission surface.
    Type: Grant
    Filed: December 20, 1995
    Date of Patent: January 20, 1998
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Minoru Niigaki, Toru Hirohata, Tomoko Suzuki, Masami Yamada
  • Patent number: 5680007
    Abstract: A photoelectric emission surface which is excellent in stability and reproducibility of photoelectric conversion characteristics and has a structure capable of obtaining a high photosensitivity is provided. A predetermined voltage is applied between an upper surface electrode and a lower surface electrode by a battery. Upon application of this voltage, a p-n junction formed between a contact layer and an electron emission layer is reversely biased. A depletion layer extends from the p-n junction into the photoelectric emission surface, and an electric field is formed in the electron emission layer and a light absorbing layer in a direction for accelerating photoelectrons. When incident light is absorbed in the light absorbing layer to excite photoelectrons, the photoelectrons are accelerated by the electric field toward the emission surface.
    Type: Grant
    Filed: July 27, 1995
    Date of Patent: October 21, 1997
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Minoru Niigaki, Toru Hirohata, Tomoko Suzuki, Masami Yamada
  • Patent number: 5591986
    Abstract: The present invention provides a photoemission device excellent in quantum efficiency of photoelectric conversion, a high-sensitive electron tube employing it, and a high-sensitive photodetecting apparatus. A photoemission device of the present invention is arranged to have a photon absorbing layer for absorbing incident photons to excite photoelectrons, an insulator layer layered on one surface of the photon absorbing layer, a lead electrode layered on the insulator layer, and a contact formed on the other surface of the photon absorbing layer to apply a predetermined polarity voltage between the lead electrode and the other surface of the photon absorbing layer, whereby the photoelectrons excited by the incident photons entering the photon absorbing layer and moving toward the one side are made to be emitted by an electric field formed between the lead electrode and the one surface by the predetermined polarity voltage.
    Type: Grant
    Filed: September 2, 1994
    Date of Patent: January 7, 1997
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Minoru Niigaki, Toru Hirohata, Tuneo Ihara, Masami Yamada
  • Patent number: 5471051
    Abstract: There is disclosed a photocathode comprising:a photoelectric conversion layer for internally exciting photoelectrons in response to incident photons; a semiconductor layer having a photoelectron emission surface for emitting the photoelectrons generated and accelerated in the photoelectric conversion layer from the photoelectron emission surface; an upper surface electrode formed on the photoelectron emission surface of the semiconductor layer; and a lower surface electrode formed on the semiconductor layer so that the lower surface electrode is opposite to the upper surface electrode through the semiconductor layer, the upper surface electrode being divided so as to provide a plurality of pixel electrodes which are electrically insulated from each other, the plurality of pixel electrodes being respectively connected to a plurarity of bias application wires.
    Type: Grant
    Filed: June 1, 1994
    Date of Patent: November 28, 1995
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Minoru Niigaki, Katsuyuki Kinoshita, Toru Hirohata, Tuneo Ihara, Masami Yamada, Norio Asakura, Yasuharu Negi, Tomoko Suzuki
  • Patent number: 5138191
    Abstract: A junction, such as a Schottky junction, is formed between a conductive electrode and a semiconductor. A bias voltage is applied between the conductive electrode and an outward-emission-side electrode formed on the semiconductor at the side opposite to the junction. Upon illumination, photoelectrons are internally emitted in the conductive electrode into the semiconductor, transported through the semiconductor, and emitted outward from the semiconductor surface, which has been so treated as to reduce the surface barrier height. The semiconductor is semi-insulating, or a p-n junction is formed therein.
    Type: Grant
    Filed: July 2, 1990
    Date of Patent: August 11, 1992
    Assignee: Hamamatsu Photonics K. K.
    Inventors: Yoshihiko Mizushima, Toru Hirohata, Tsuneo Ihara, Minoru Niigaki, Kenichi Sugimoto, Koichiro Oba, Toshihiro Suzuki, Tomoko Suzuki
  • Patent number: 4605600
    Abstract: Disclosed is a new type of transparent GaAs photo electric layer formed on an optical window made of a GaP single crystal substrate via an Al.sub.x Ga.sub.(1-x) As buffer layer, in which a gradual-lattice-constant layer of quadruple Al.sub.x Ga.sub.(1-x) PyAs.sub.(1-y) compound crystal is formed between the GaP single crystal substrate and the Al.sub.x Ga.sub.(1-x) As buffer layer. The y content in the gradual-lattice-constant layer of quadruple Al.sub.x Ga.sub.(1-x) PyAs.sub.(1-y) compound crystal changes from 1 to 0 as deposition of the gradual-lattice-constant layer of quadruple Al.sub.x Ga.sub.(1-x) PyAs.sub.(1-y) compound crystal goes on while the x content can arbitrarily be selected in the range of 0 to 1.
    Type: Grant
    Filed: April 30, 1985
    Date of Patent: August 12, 1986
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Minoru Niigaki, Tokuaki Nihashi, Masashi Ohta