Patents by Inventor Minoru Sakairi
Minoru Sakairi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6649910Abstract: For measuring dioxins and organic nitro compounds with high sensitivity while reducing complexity, efficiently ionize a sample using negative corona discharge; then, make use of a mass spectrometer to measure negatively charged ions produced.Type: GrantFiled: September 3, 2002Date of Patent: November 18, 2003Assignee: Hitachi, Ltd.Inventor: Minoru Sakairi
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Patent number: 6596991Abstract: The analysis of isotopomers is conveniently performed using a double focusing high mass resolution magnetic mass spectrometer comprising an electric field and a magnetic field by a constant accelerating voltage slightly less than the accelerating voltage corresponding to the masses of the ions comprising the majority of a sample to be analyzed, and scanning part of an ion accelerating voltage so that it varies within a range effectively corresponding to the masses of the ions of isotopomers of the ions comprising the majority of the sample to be analyzed.Type: GrantFiled: July 26, 2001Date of Patent: July 22, 2003Assignees: Hitachi, Ltd., Japan Science and Technology CorporationInventors: Naohiro Yoshida, Kouichi Kimura, Hideaki Koizumi, Yoshiaki Kato, Minoru Sakairi
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Patent number: 6586730Abstract: A compact, easy-to-use device is provided which takes in a sample over a shorter distance, the sample introducing time is shortened, and contamination is prevented when the sample is introduced. A burner for generating a plasma, a deflecting portion provided with parallel electrodes for deflecting ions, and an analyzer room for performing mass separation of the deflected ions, these being disposed in a plane in the horizontal direction, and a sample setting portion for setting a sample, a peristaltic pump for aspirating the sample and the burner for introducing and burning the aspirated sample are disposed in a plane in the vertical direction relative to the aforesaid plane. The sample is supplied to the burner from below, and the ions generated by the plasma are made to flow on a horizontal plane.Type: GrantFiled: February 16, 2000Date of Patent: July 1, 2003Assignee: Hitachi, Ltd.Inventors: Seiji Kamimura, Isamu Takekoshi, Yasushi Terui, Yasuaki Takada, Takayuki Nabeshima, Minoru Sakairi
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Patent number: 6580067Abstract: The present invention is to provide a monitoring device making it possible to measure the concentration of a target trace gas which has an ionization efficiency changed by the affect of impurities and which is absorbed on a pretreatment portion or piping, at a high accuracy and at real time, by adding an internal standard having a known concentration to the target trace gas. The concentration of the target trace gas is measured while an internal standard having substantially the same properties (such as ionization efficiency change and vapor pressure) as the target trace gas is added. The ion strengths of the target trace gas and the internal standard are compared to calibrate the concentration of the target trace gas. According to the present invention, the concentration of the target trace gas in gas containing impurities can be online measured at a real time and at high accuracy while being continuously calibrated.Type: GrantFiled: November 15, 2000Date of Patent: June 17, 2003Assignee: Hitachi, Ltd.Inventors: Masuyoshi Yamada, Yuichiro Hashimoto, Minoru Sakairi, Yasuaki Takada, Masami Sakamoto, Tomoyuki Tobita
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Patent number: 6571649Abstract: A sample introduction probe for introducing a gas sample to a mass spectrometer, having an inner pipe for conducting the sample to be analyzed, and an outer pipe installed outside of the inner pipe. An opening is installed at one end of the inner pipe for enabling entry of the sample into the inner pipe. A pump is installed on a side of the one end of the inner pipe, and a probe tip heater is provided for heating the one end of the inner pipe, a heater for heating the inner pipe.Type: GrantFiled: June 20, 2001Date of Patent: June 3, 2003Assignee: Hitachi, Ltd.Inventors: Minoru Sakairi, Masao Suga, Yuichiro Hashimoto, Masuyoshi Yamada
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Patent number: 6541769Abstract: An ion-deflecting device is located between a mass spectrometer and a detector, and undesired signal sources are prevented from reaching the detector during the ion-trapping period by switching the voltage applied to the detector between the ion-trapping period and the mass-analyzing period. A first voltage is applied to the detector during an ion-trapping period while a second voltage is applied to the detector during a mass-analyzing period. An ion-deflecting device deflects ions such that they do not reach the detector during an ion-trapping period while they do reach the detector during a mass-analyzing period. This way, the life of the detector is increased.Type: GrantFiled: September 12, 2000Date of Patent: April 1, 2003Assignee: Hitachi, Ltd.Inventors: Yasuaki Takada, Yasushi Terui, Kiyomi Yoshinari, Takayuki Nabeshima, Minoru Sakairi
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Publication number: 20030020013Abstract: For measuring dioxins and organic nitro compounds with high sensitivity while reducing complexity, efficiently ionize a sample using negative corona discharge; then, make use of a mass spectrometer to measure negatively charged ions produced.Type: ApplicationFiled: September 3, 2002Publication date: January 30, 2003Applicant: Hitachi, Ltd.Inventor: Minoru Sakairi
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Patent number: 6483108Abstract: For measuring dioxins and organic nitro compounds with high sensitivity while reducing complexity, efficiently ionize a sample using negative corona discharge; then, make use of a mass spectrometer to measure negatively charged ions produced.Type: GrantFiled: April 19, 1999Date of Patent: November 19, 2002Assignee: Hitachi, Ltd.Inventor: Minoru Sakairi
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Patent number: 6465779Abstract: A mass spectrometer comprising an ionization means for ionizing sample compounds to be analyzed mass spectroscopically in an atmospheric pressure, a sample solution supply means for supplying a solution containing the sample compounds to the ionization means, means for feeding the ions formed by the ionization means through an aperture disposed in an electrode into a vacuum region, and an ion trap type mass spectroscopic means for mass spectroscopically analyzing ions entered through the aperture into the vacuum region, in which an ion decelerating electric field forming means is disposed between the electrode disposed with the aperture and an electrode disposed with an ion entrance opening for entering the ions into the ion trap type mass spectroscopic means for forming an electric field for decelerating the ions, and the ions injected to the ion trap mass spectroscopic means is lowered.Type: GrantFiled: October 3, 2001Date of Patent: October 15, 2002Assignee: Hitachi, Ltd.Inventors: Yasuaki Takada, Minoru Sakairi, Takayuki Nabeshima, Yukiko Hirabayashi, Hideaki Koizumi
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Publication number: 20020125426Abstract: An ion source includes a body having a gas passage and an orifice. A capillary is inserted into the gas passage so that a tip portion of the capillary extends into the orifice. A gas supplier supplies a gas into the gas passage to form a gas flow through the gas passage along the capillary and through the orifice past a tip of the capillary so that the gas flow sprays a sample solution flowing through the capillary from the tip of the capillary. A flow controller regulates a pressure of the gas in the gas passage to adjust a characteristic value F/S to a predetermined value, where F is a flow rate of the gas flow at standard conditions (20° C., 1 atmosphere), and S is a difference between a cross section of the orifice and a cross section of the tip portion of the capillary in the orifice.Type: ApplicationFiled: May 7, 2002Publication date: September 12, 2002Inventors: Atsumu Hirabayashi, Minoru Sakairi, Yasuaki Takada, Hideaki Koizumi, Kaoru Umemura
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Patent number: 6437327Abstract: A mass spectrometer including a sprayer for spraying a sample solution, a needle electrode for ionizing the sample contained in the sample solution, an aperture for introducing the ions of the sample into a lower pressure region having a pressure lower than the pressure of a region in which the needle electrode is disposed, and a mass spectrometric apparatus for analyzing the ions introduced from the aperture. A direction of a spray caused by the sprayer is almost perpendicular to or at an angle with respect to a center axis of the aperture, and a tip of the needle is disposed facing to an electrode having the aperture.Type: GrantFiled: May 18, 2001Date of Patent: August 20, 2002Assignee: Hitachi, Ltd.Inventors: Yasuaki Takada, Minoru Sakairi, Atsumu Hirabayashi, Takayuki Nabeshima, Hideaki Koizumi
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Publication number: 20020110490Abstract: There was previously no monitoring method and monitoring apparatus which could measure dioxins at ppt levels and dioxin precursors at ppb levels with high sensitivity.Type: ApplicationFiled: April 11, 2002Publication date: August 15, 2002Applicant: Hitachi, Ltd.Inventors: Minoru Sakairi, Yoshiaki Kato, Mamoru Mizumoto, Yuichiro Hashimoto, Jiro Tokita, Masao Suga
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Patent number: 6423965Abstract: Plasma ion source mass spectrometers or liquid chromatograph/mass spectrometers are provided: wherein photon noises and matrix molecule ions produced by the ion source are decreased, the decrease of the quantity of signal is suppressed, and the apparatus maintenance is improved. The photon noises are decreased with a shielding plate and a 90 degrees deflector. The maintainability in cleaning is improved by a combination of a leading electrode, the shielding plate having a small hole, and a gate valve. The decrease in the quantity of signal is suppressed with the leading electrode, and a double cylindrical type static lens. Position adjustment of the leading electrode is performed with a flat plate having plural holes. Using an ion trap mass analyzer, matrix molecule ions are eliminated by applying a resonance voltage between its end cap electrodes.Type: GrantFiled: August 23, 1999Date of Patent: July 23, 2002Assignee: Hitachi, Ltd.Inventors: Yuichiro Hashimoto, Takayuki Nabeshima, Yasuaki Takada, Minoru Sakairi, Masamichi Tsukada
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Patent number: 6392226Abstract: Disclosed is a mass spectrometer having an ion trap type mass spectrometric unit, characterized in that in each of ion storage periods, ions created in an ion source (7) are allowed to enter in a space surrounded by a ring electrode (21) and end cap electrodes (22a and 22b) and are confined in the space, wherein ions are detected with high sensitivities in a wide range of values of m/z (molecular weight of ion/valence number of ion) of the ions by changing the amplitude of a high-frequency voltage applied to the ring electrode (21) in each of the ion storage periods.Type: GrantFiled: March 12, 1999Date of Patent: May 21, 2002Assignee: Hitachi, Ltd.Inventors: Yasuaki Takada, Takayuki Nabeshima, Minoru Sakairi, Yukiko Hirabayashi
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Patent number: 6384411Abstract: An ion source includes a gas supplier which supplies a gas through a gas inlet into a gas passage defined in a body to form a gas flow through the gas passage along a capillary inserted into the body and through an orifice defined in the body past a tip of the capillary so that the gas flow sprays a sample solution from the tip of the capillary. The gas supplier regulates a pressure of the gas in the gas passage to adjust a characteristic value F/S to a predetermined value, where F is a flow rate of the gas flow at standard conditions (20° C., 1 atmosphere), and S is a difference between a cross section of the orifice and a cross section of a tip portion of the capillary in the orifice.Type: GrantFiled: July 27, 2000Date of Patent: May 7, 2002Assignee: Hitachi, Ltd.Inventors: Atsumu Hirabayashi, Minoru Sakairi, Yasuaki Takada, Hideaki Koizumi, Kaoru Umemura
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Publication number: 20020048818Abstract: There was previously no monitoring method and monitoring apparatus which could measure dioxins at ppt levels and dioxin precursors at ppb levels with high sensitivity.Type: ApplicationFiled: November 13, 2001Publication date: April 25, 2002Applicant: Hitachi, Ltd.Inventors: Minoru Sakairi, Yoshiaki Kato, Mamoru Mizumoto, Yuichiro Hashimoto, Jiro Tokita, Masao Suga
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Publication number: 20020014585Abstract: A mass spectrometer comprising an ionization means for ionizing sample compounds to be analyzed mass spectro-scopically in an atmospheric pressure, a sample solution supply means for supplying a solution containing the sample compounds to the ionization means, means for feeding the ions formed by the ionization means through an aperture disposed in an electrode into a vacuum region and a ion trap type mass spectroscopic means for mass spectroscopically analyzing ions entered through the aperture into the vacuum region, in which an ion decelerating electric field forming means is disposed between the electrode disposed with the aperture and an electrode disposed with an ion entrance opening for entering the ions into the ion trap type mass spectroscopic means for forming an electric field for decelerating the ions, and the ions injected to the ion trap mass spectroscopic means is lowered.Type: ApplicationFiled: October 3, 2001Publication date: February 7, 2002Applicant: Hitachi, Ltd.Inventors: Yasuaki Takada, Minoru Sakairi, Takayuki Nabeshima, Yukiko Hirabayashi, Hideaki Koizumi
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Patent number: 6335525Abstract: A mass spectrometer includes a sample separation apparatus which separates a sample solution into gaseous molecules, a plurality of ion sources which ionize the gaseous molecules to produce ions, and a mass analysis region which mass-analyzes ions produced by one of the ion sources. One of the ion sources may include a needle electrode which generates corona discharge for use in ionizing the gaseous molecules. The ion sources may be provided under a first pressure condition, and the mass analysis region may be provided under a second pressure condition lower than the first pressure condition.Type: GrantFiled: March 15, 2000Date of Patent: January 1, 2002Assignee: Hitachi, Ltd.Inventors: Yasuaki Takada, Minoru Sakairi, Atsumu Hirabayashi, Hideaki Koizumi
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Publication number: 20010042413Abstract: A sample introduction probe for introducing a gas sample to a mass spectrometer, having an inner pipe for conducting the sample to be analyzed, and an outer pipe installed outside of the inner pipe. An opening is installed at one end of the inner pipe for enabling entry of the sample into the inner pipe. A pump is installed on a side of the one end of the inner pipe, and a probe tip heater is provided for heating the one end of the inner pipe, a heater for heating the inner pipe.Type: ApplicationFiled: June 20, 2001Publication date: November 22, 2001Inventors: Minoru Sakairi, Masao Suga, Yuichiro Hashimoto, Masuyoshi Yamada
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Patent number: 6316769Abstract: A mass spectrometer comprising an ionization means for ionizing sample compounds to be analyzed mass spectro-scopically in an atmospheric pressure, a sample solution supply means for supplying a solution containing the sample compounds to the ionization means, means for feeding the ions formed by the ionization means through an aperture disposed in an electrode into a vacuum region and a ion trap type mass spectroscopic means for mass spectroscopically analyzing ions entered through the aperture into the vacuum region, in which an ion decelerating electric field forming means is disposed between the electrode disposed with the aperture and an electrode disposed with an ion entrance opening for entering the ions into the ion trap type mass spectroscopic means for forming an electric field for decelerating the ions, and the ions injected to the ion trap mass spectroscopic means is lowered.Type: GrantFiled: December 19, 2000Date of Patent: November 13, 2001Assignee: Hitachi, Ltd.Inventors: Yasuaki Takada, Minoru Sakairi, Takayuki Nabeshima, Yukiko Hirabayashi, Hideaki Koizumi