Abstract: Provided is a feature for generating a recommended shelf allocation indicating the state in which products are displayed, the recommended shelf allocation including a state in which specified products are displayed in more effective positions. The present invention is provided with: a generation means for generating a plurality of shelf allocation candidates indicating the state in which a plurality of products including the specified products are displayed on product shelves; a prediction means for predicting the sales of the specified products for the plurality of shelf allocation candidates, on the basis of the positional relationships among the products displayed on the product shelf, and of the relationships with sales of the products; and a selection means for selecting the shelf allocation candidates on the basis of the results of the predictions.

Abstract: Disclosed herein is a semiconductor integrated circuit including: line buffers; an alpha channel first selector; an alpha channel digital-to-analog converter; a beta channel digital-to-analog converter; a redundant digital-to-analog converter; an alpha channel second selector; a beta channel second selector; an alpha channel amplifier; and a beta channel amplifier.

Abstract: Disclosed herein is a semiconductor integrated circuit including: line buffers; an alpha channel first selector; an alpha channel digital-to-analog converter; a beta channel digital-to-analog converter; a redundant digital-to-analog converter; an alpha channel second selector; a beta channel second selector; an alpha channel amplifier; and a beta channel amplifier.

Abstract: A semiconductor integrated circuit is disclosed which includes: a first D/A converter; a second D/A converter; an amplifier configured to amplify an output of the first D/A converter; an operational amplifier configured to input an output of the second D/A converter; and a selector configured to effect switchover between a normal mode and a test mode, the normal mode being a mode in which the operational amplifier is caused to function as an amplifier for amplifying the output of the second D/A converter, the test mode being a mode in which the operational amplifier is caused to function as a comparator for comparing the output of the second D/A converter with the output of the first D/A converter.