Abstract: In an integrated-circuit tester which is provided with a contact failure analysis/storage part for counting and storing the number of failures occurring at each contact, an automatic stop part for deciding contact as defective based on the numbers of failures stored in the storage part and for stopping a handler, an automatic turn-OFF part by which, upon each operation of the automatic stop part, contacts having met the stop condition are automatically put in their unused state, and a defective contact display for displaying the number of contacts put in the unused state upon each automatic stop of the handler, an operator checks the number of contacts put in the unused state upon each automatic stop of the handler, then decides whether or not all the contacts used are to be replaced, and performs the necessary operations for resuming the test.