Patents by Inventor Minuk MA

Minuk MA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220262513
    Abstract: A method, performed by at least one processor, for training a machine learning model for detecting an abnormal region in a pathological slide image is disclosed. The method including receiving one or more first pathological slide images, determining, from the received one or more first pathological slide images, a normal region based on an abnormality condition indicative of a condition of an abnormal region, generating a first set of training data including the determined normal region, generating the abnormal region by performing image processing corresponding to the abnormality condition with respect to at least partial region in the received one or more first pathological slide images, and generating a second set of training data including the generated abnormal region.
    Type: Application
    Filed: December 14, 2021
    Publication date: August 18, 2022
    Applicant: LUNIT INC.
    Inventors: Donggeun YOO, Jaehong AUM, Minuk MA, Jeong Un RYU
  • Publication number: 20220261988
    Abstract: A method for detecting a region of interest (ROI) in a pathological slide image is provided. The method may include receiving one or more pathological slide images and detecting an ROI in the received one or more pathological slide images. In addition, an information processing system is provided. The information processing system includes a memory storing one or more instructions, and a processor configured to execute the stored one or more instructions to receive one or more pathological slide images and detect an ROI in the received one or more pathological slide images.
    Type: Application
    Filed: December 15, 2021
    Publication date: August 18, 2022
    Applicant: LUNIT INC.
    Inventors: Donggeun YOO, Jaehong AUM, Minuk MA, Jeong Un RYU
  • Publication number: 20220114836
    Abstract: Provided are an artificial intelligence (AI) system using a machine learning algorithm such as deep learning, and applications thereof. A method, performed by an electronic apparatus, of processing images includes obtaining a plurality of training image sets corresponding to a plurality of types of target objects, wherein training images in the training image sets are labeled with feature points forming a preset structure, generating a first artificial intelligence (AI) model for determining a standard structure based on the labeled feature points, by using the training images in the training image sets, identifying a face in a training image transformed based on the standard structure, and training a second AI model for verifying the first AI model, based on an image regressed from the transformed training image, and the training image before being transformed.
    Type: Application
    Filed: January 30, 2020
    Publication date: April 14, 2022
    Applicants: SAMSUNG ELECTRONICS CO., LTD., KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Kyungsu KIM, Chang Dong YOO, Junyeong KIM, Minuk MA