Patents by Inventor Miroslava TZAKOVA

Miroslava TZAKOVA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect weight formulas for analog defect simulation
    Patent number: 11443092
    Abstract: A method, apparatus, and/or computer program product can perform an analog defect simulation on an electronic device. The method, apparatus, and/or computer program product can generate a defect catalog which identifies a defect class relating to a defect and a modeling parameter that is associated with the defect class. The method, apparatus, and/or computer program product can receive a weight formula that identifies a weight for the defect class in relation to the modeling parameter. The method, apparatus, and/or computer program product can call a defect weight function to return the weight from the defect weight formula. The method, apparatus, and/or computer program product can perform the analog defect simulation on the electronic device. The method, apparatus, and/or computer program product can determine a simulation statistic relating to the analog defect simulation utilizing the weight.
    Type: Grant
    Filed: May 11, 2020
    Date of Patent: September 13, 2022
    Assignee: Synopsys, Inc.
    Inventors: Mayukh Bhattacharya, Miroslava Tzakova, Chih-Ping Antony Fan
  • DEFECT WEIGH FORMULAS FOR ANALOG DEFECT SIMULATION
    Publication number: 20210350058
    Abstract: A method, apparatus, and/or computer program product can performing an analog defect simulation on an electronic device. The method, apparatus, and/or computer program product can generate a defect catalog which identifies a defect class relating to a defect and a modeling parameter that is associated with the defect class. The method, apparatus, and/or computer program product can receive a weight formula that identifies a weight for the defect class in relation to the modeling parameter. The method, apparatus, and/or computer program product can call a defect weight function to return the weight from the defect weight formula. The method, apparatus, and/or computer program product can perform the analog defect simulation on the electronic device. The method, apparatus, and/or computer program product can determine a simulation statistic relating to the analog defect simulation utilizing the weight.
    Type: Application
    Filed: May 11, 2020
    Publication date: November 11, 2021
    Applicant: Synopsys, Inc.
    Inventors: Mayukh BHATTACHARYA, Miroslava TZAKOVA, Chih-Ping Antony FAN