Patents by Inventor Miroslawa LUKAWSKA

Miroslawa LUKAWSKA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Coordinate measuring machine measurement and analysis of multiple workpieces
    Patent number: 11822321
    Abstract: A method evaluates a sample of measurement data from measuring multiple workpieces by at least one coordinate measuring machine. A system of statistical distributions describes a frequency of measurement data values. The distributions are distinguishable based on skewness and kurtosis. The method includes defining a set of statistical distributions that are able to describe a frequency of measurement data values in the entire value interval from the system of statistical distributions for a value interval of the measurement data, which is a specified value interval or a value interval of the measurement data actually arising in the sample. The method includes ascertaining the skewness and the kurtosis from the sample of measurement data corresponding to a first statistical distribution. The method includes checking, using the ascertained moment values, whether the defined set contains a statistical distribution that has the ascertained skewness and kurtosis, and producing a corresponding test result.
    Type: Grant
    Filed: May 27, 2021
    Date of Patent: November 21, 2023
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Oliver Rüger, Miroslawa Lukawska, Daniel Görsch
  • Coordinate Measuring Machine Measurement and Analysis of Multiple Workpieces
    Publication number: 20210382465
    Abstract: A method evaluates a sample of measurement data from measuring multiple workpieces by at least one coordinate measuring machine. A system of statistical distributions describes a frequency of measurement data values. The distributions are distinguishable based on skewness and kurtosis. The method includes defining a set of statistical distributions that are able to describe a frequency of measurement data values in the entire value interval from the system of statistical distributions for a value interval of the measurement data, which is a specified value interval or a value interval of the measurement data actually arising in the sample. The method includes ascertaining the skewness and the kurtosis from the sample of measurement data corresponding to a first statistical distribution. The method includes checking, using the ascertained moment values, whether the defined set contains a statistical distribution that has the ascertained skewness and kurtosis, and producing a corresponding test result.
    Type: Application
    Filed: May 27, 2021
    Publication date: December 9, 2021
    Inventors: Oliver RÜGER, Miroslawa LUKAWSKA, Daniel GÖRSCH