Patents by Inventor MI-RYE LEE

MI-RYE LEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe including an alignment key protruded from a side of an alignment beam and a probe card including the same
    Patent number: 11061052
    Abstract: A probe includes a probe body for providing an object with a test signal; a tip arranged on an end of the probe body to make contact with the object; and an alignment key protruded from a side of the probe body.
    Type: Grant
    Filed: March 28, 2019
    Date of Patent: July 13, 2021
    Assignees: SAMSUNG ELECTRONICS CO., LTD., MICROFRIEND CO., LTD.
    Inventors: Sung-Hoon Lee, Byoung-Joo Kim, Mi-Rye Lee, Hwang-Jin Yeo, Tae-Jong Lee
  • PROBE AND A PROBE CARD INCLUDING THE SAME
    Publication number: 20200081035
    Abstract: A probe includes a probe body for providing an object with a test signal; a tip arranged on an end of the probe body to make contact with the object; and an alignment key protruded from a side of the probe body.
    Type: Application
    Filed: March 28, 2019
    Publication date: March 12, 2020
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: SUNG-HOON LEE, BYOUNG-JOO KIM, MI-RYE LEE, HWANG-JIN YEO, TAE-JONG LEE