Patents by Inventor Mithun Biswas

Mithun Biswas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for determining replacement compatibility of field devices in industrial process control systems
    Patent number: 9557725
    Abstract: A method includes identifying device description files corresponding to first and second field devices associated with an industrial process control system. The method also includes comparing multiple field device characteristics of the first and second field devices using the device description files. The method further includes identifying any differences between the device characteristics of the first field device and the device characteristics of the second field device. In addition, the method includes determining a compatibility of the first and second field devices based on any identified differences. The field device characteristics can relate to field device attributes, field device function blocks, and function block parameters of the first and second field devices.
    Type: Grant
    Filed: August 13, 2012
    Date of Patent: January 31, 2017
    Assignee: Honeywell International Inc.
    Inventors: Soundari Arunachalam, Balaji Gururao, Senthilkumar Dhanagopalan, John Samuel, Matthew R. Schrier, Mithun Biswas
  • APPARATUS AND METHOD FOR DETERMINING REPLACEMENT COMPATIBILITY OF FIELD DEVICES IN INDUSTRIAL PROCESS CONTROL SYSTEMS
    Publication number: 20140046618
    Abstract: A method includes identifying device description files corresponding to first and second field devices associated with an industrial process control system. The method also includes comparing multiple field device characteristics of the first and second field devices using the device description files. The method further includes identifying any differences between the device characteristics of the first field device and the device characteristics of the second field device. In addition, the method includes determining a compatibility of the first and second field devices based on any identified differences. The field device characteristics can relate to field device attributes, field device function blocks, and function block parameters of the first and second field devices.
    Type: Application
    Filed: August 13, 2012
    Publication date: February 13, 2014
    Applicant: Honeywell International Inc.
    Inventors: Soundari Arunachalam, Balaji Gururao, Senthilkumar Dhanagopalan, John Samuel, Matthew R. Schrier, Mithun Biswas