Abstract: An apparatus is provided for controlling a temperature of a device by circulating fluid through a heat sink in thermal contact with the device. The apparatus includes a first fluid source (505) including a first fluid having a first temperature, a second fluid source (510) including a second fluid having a second temperature, and a thermal chuck (500) operably connected to the first fluid source and the second fluid source, wherein the thermal chuck is configured to receive the first fluid and the second fluid to be circulated through the heat sink (555). A method is also provided for controlling a temperature of a device in contact with a heat sink. The method includes determining a target temperature (S602), initiating a flow of a fluid from a fluid source (S604, S702), determining temperature data (S606, S704) of the device and the heat sink, and variably adjusting a flow rate (S710, S712) of the fluid to generally maintain the device at the target temperature.

Abstract: An apparatus is provided for controlling a temperature of a device by circulating fluid through a heat sink in thermal contact with the device. The apparatus includes a first fluid source (505) including a first fluid having a first temperature, a second fluid source (510) including a second fluid having a second temperature, and a thermal chuck (500) operably connected to the first fluid source and the second fluid source, wherein the thermal chuck is configured to receive the first fluid and the second fluid to be circulated through the heat sink (555). A method is also provided for controlling a temperature of a device in contact with a heat sink. The method includes determining a target temperature (S602), initiating a flow of a fluid from a fluid source (S604, S702), determining temperature data (S606, S704) of the device and the heat sink, and variably adjusting a flow rate (S710, S712) of the fluid to generally maintain the device at the target temperature.

Abstract: One or more concentric rings of component seats are rotatable about the rings' center. The seats are uniformly angularly spaced and the rings are incrementally rotated, the increment of rotation being the angular space between adjacent seats. The rings are inclined at an angle and a stream of components is poured onto the rings as they are rotating. Stationary fences adjacent to outboard sides of the seats, confine unseated components to tumble randomly, due to gravity, over empty seats passing through arcs of the rings' rotation paths. The random tumbling results in seated components. In the paths of the rotating rings are electrical contactors for coupling the components to a tester. Preferably there are five contactor stations to permit five different kinds of tests to be performed simultaneously. Tested components pass beneath an ejection manifold which defines a plurality of ejection holes which register with a set of seats each time the ring is rotated an increment.

Abstract: An integrated circuit (IC) device test handler which is adaptable to receive various customer tray configurations and automatically test the ICs within. The test handler comprises a customer tray magazine input area, a load section, a soak chamber, a test section, an unsoak chamber and an unload area. Two magazines containing customer trays with IC devices are input to the handler. An elevator mechanism raises the customer trays within one magazine at a time to a position which can be accessed by the loader of the test handler. A catcher device moves the trays to a buffer platform where the trays can be accessed by a transfer arm. The transfer arms moves the customer trays to one of two load stages. A pick and place apparatus removes the IC devices from each customer tray on the load stages and transfers them to a precisor for alignment and then to a test tray.

Abstract: A loader and unloader is disclosed which is utilized in conjunction with an automatic test machine for handling electric devices such as integrated circuits ("ICs"), semiconductor chips, and the like. The loader handles trays containing a number of ICs to be tested and transfers them to a location on the handler where the ICs can be accurately and quickly removed from the trays for testing. Following the testing, the unloader of the present invention handles the trays which receive the ICs in accordance with various sort categories depending upon the test results. The present invention also encompasses a dual receptacle transfer arm which shuttles IC trays between and among the various components of the loader and unloader. These components are configured so as to minimize travel distance and handling time, thereby increasing the productivity of an automatic test handler into which the present loader and unloader may be incorporated.

Abstract: A separation and transfer apparatus for use in an electronic test system for testing electronic devices such as IC's, and the like. The apparatus has a housing for holding in a horizontal position, a magazine containing such electronic devices, an air blower for blowing compressed air at the electronic devices at an angle through a slit of the magazine so that the electronic devices are separated from one another and urged in a desired direction, a piston pin for insertion into a space developed between the last electronic device in the magazine and one end of the magazine, an advancing apparatus for changing the horizontal position of the air blower and the piston pin and for expelling the electronic devices from the magazine, and a controller for controlling the timing of the air blowing, the movement of the advancing apparatus, and the operation of the piston pin.